Analog Mixed Signal And Rf Testing

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Analog Mixed Signal And Rf Testing

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Author : Karim Arabi
language : en
Publisher:
Release Date : 2010

Analog Mixed Signal And Rf Testing written by Karim Arabi and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with categories.

Special Issue On Analog Mixed Signal And Rf Testing

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Author : Manuel J. Barragan
language : en
Publisher:
Release Date : 2017

Special Issue On Analog Mixed Signal And Rf Testing written by Manuel J. Barragan and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017 with categories.

Special Issue Analog Mixed Signal And Rf Testing

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Author :
language : en
Publisher:
Release Date : 2007

Special Issue Analog Mixed Signal And Rf Testing written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007 with categories.

Special Issue On Analog Mixed Signal Rf And Mems Testing

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Author : Haralampos-G. Stratigopoulos
language : en
Publisher:
Release Date : 2011

Special Issue On Analog Mixed Signal Rf And Mems Testing written by Haralampos-G. Stratigopoulos and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011 with categories.

Test And Design For Testability In Mixed Signal Integrated Circuits

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Author : Jose Luis Huertas Díaz
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-02-23

Test And Design For Testability In Mixed Signal Integrated Circuits written by Jose Luis Huertas Díaz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-02-23 with Technology & Engineering categories.

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.

The Fundamentals Of Mixed Signal Testing

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Author : Brian Lowe
language : en
Publisher:
Release Date : 2002

The Fundamentals Of Mixed Signal Testing written by Brian Lowe and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002 with Technology & Engineering categories.

Test And Diagnosis Of Analogue Mixed Signal And Rf Integrated Circuits

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Author : Yichuang Sun
language : en
Publisher: IET
Release Date : 2008-05-30

Test And Diagnosis Of Analogue Mixed Signal And Rf Integrated Circuits written by Yichuang Sun and has been published by IET this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-05-30 with Technology & Engineering categories.

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.

Analog And Mixed Signal Test

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Author : Suraj Sindia
language : en
Publisher: Springer
Release Date : 2015-11-20

Analog And Mixed Signal Test written by Suraj Sindia and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-11-20 with Technology & Engineering categories.

This book serves as a “go-to” guide to the most important research in the last 20 years in analog and mixed-signal test. Topics covered include: analog Built-in Self-test, analog design-for-test, IEEE standards based test for analog and mixed-signal circuits, RF test, Data Converter (DAC/ADC) testing, automatic test equipment, alternate test, machine learning and big data solutions for analog/mixed-signal systems-on-chip. The author has designed the presentation so that readers can get up to speed quickly in the various cutting-edge topics in mixed signal research, or use the information as a guide for diving more deeply into the most relevant literature, without losing time.

Performance Optimization Techniques In Analog Mixed Signal And Radio Frequency Circuit Design

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Author : Fakhfakh, Mourad
language : en
Publisher: IGI Global
Release Date : 2014-10-31

Performance Optimization Techniques In Analog Mixed Signal And Radio Frequency Circuit Design written by Fakhfakh, Mourad and has been published by IGI Global this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-10-31 with Technology & Engineering categories.

Improving the performance of existing technologies has always been a focal practice in the development of computational systems. However, as circuitry is becoming more complex, conventional techniques are becoming outdated and new research methodologies are being implemented by designers. Performance Optimization Techniques in Analog, Mix-Signal, and Radio-Frequency Circuit Design features recent advances in the engineering of integrated systems with prominence placed on methods for maximizing the functionality of these systems. This book emphasizes prospective trends in the field and is an essential reference source for researchers, practitioners, engineers, and technology designers interested in emerging research and techniques in the performance optimization of different circuit designs.

2016 Ieee 21st International Mixed Signal Testing Workshop Imstw

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Author :
language : en
Publisher:
Release Date : 2016

2016 Ieee 21st International Mixed Signal Testing Workshop Imstw written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016 with Electronic books categories.

Annotation The International Mixed Signal Testing Workshop (IMSTW) is one of the main forums that bring together analog, mixed signal, RF, and MEMS the test community to discuss ideas and views on the above challenges The scope of the workshop includes, but is not limited to, the following topics Test generation Fault modeling and simulation Test metrics estimation Self healing and self adaptation Built in self test Design for test Fault diagnosis Failure analysis Defect characterization ATE technology Economics of test and yield optimization On line test Fault tolerance Reliability and design for reliability.