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Special Issue Analog Mixed Signal And Rf Testing

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Special Issue On Analog Mixed Signal And Rf Testing

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Author : Manuel J. Barragan
language : en
Publisher:
Release Date : 2017

Special Issue On Analog Mixed Signal And Rf Testing written by Manuel J. Barragan and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017 with categories.

Special Issue Analog Mixed Signal And Rf Testing

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Author :
language : en
Publisher:
Release Date : 2007

Special Issue Analog Mixed Signal And Rf Testing written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007 with categories.

Special Issue On Analog Mixed Signal Rf And Mems Testing

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Author : Haralampos-G. Stratigopoulos
language : en
Publisher:
Release Date : 2011

Special Issue On Analog Mixed Signal Rf And Mems Testing written by Haralampos-G. Stratigopoulos and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011 with categories.

Analog And Mixed Signal Testing

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Author : Bozena Kaminska
language : en
Publisher:
Release Date : 1996

Analog And Mixed Signal Testing written by Bozena Kaminska and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with categories.

Test And Diagnosis Of Analogue Mixed Signal And Rf Integrated Circuits

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Author : Yichuang Sun
language : en
Publisher: IET
Release Date : 2008-05-30

Test And Diagnosis Of Analogue Mixed Signal And Rf Integrated Circuits written by Yichuang Sun and has been published by IET this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-05-30 with Technology & Engineering categories.

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.

Test And Design For Testability In Mixed Signal Integrated Circuits

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Author : Jose Luis Huertas Díaz
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-02-23

Test And Design For Testability In Mixed Signal Integrated Circuits written by Jose Luis Huertas Díaz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-02-23 with Technology & Engineering categories.

Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.

Special Issue On International Mixed Signal Testing Workshop

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Author : International Mixed Signal Testing Workshop
language : en
Publisher:
Release Date : 2002

Special Issue On International Mixed Signal Testing Workshop written by International Mixed Signal Testing Workshop and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002 with Electronic circuits categories.