Analysis Of Microelectronic Materials And Devices

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Analysis Of Microelectronic Materials And Devices

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Author : Manfred Grasserbauer
language : en
Publisher: John Wiley & Sons
Release Date : 1991

Analysis Of Microelectronic Materials And Devices written by Manfred Grasserbauer and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with Science categories.

Presents a comprehensive survey of analytical techniques currently used in support of all stages of microelectronic materials and device processing. The diversity of topics covered has been achieved by bringing together an international field of authors contributing specialized chapters.

Defects In Microelectronic Materials And Devices

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Author : Daniel M. Fleetwood
language : en
Publisher: CRC Press
Release Date : 2008-11-19

Defects In Microelectronic Materials And Devices written by Daniel M. Fleetwood and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-11-19 with Science categories.

Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.A comprehensive survey of defe

Microelectronic Materials

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Author : C.R.M. Grovenor
language : en
Publisher: CRC Press
Release Date : 1989-01-01

Microelectronic Materials written by C.R.M. Grovenor and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989-01-01 with Science categories.

This practical book shows how an understanding of structure, thermodynamics, and electrical properties can explain some of the choices of materials used in microelectronics, and can assist in the design of new materials for specific applications. It emphasizes the importance of the phase chemistry of semiconductor and metal systems for ensuring the long-term stability of new devices. The book discusses single-crystal and polycrystalline silicon, aluminium- and gold-based metallisation schemes, packaging semiconductor devices, failure analysis, and the suitability of various materials for optoelectronic devices and solar cells. It has been designed for senior undergraduates, graduates, and researchers in physics, electronic engineering, and materials science.

Reliability And Failure Of Electronic Materials And Devices

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Author : Milton Ohring
language : en
Publisher: Academic Press
Release Date : 2014-10-14

Reliability And Failure Of Electronic Materials And Devices written by Milton Ohring and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-10-14 with Technology & Engineering categories.

Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites

Analysis Of Microelectronic Materials And Devices

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Author : Eds.)
language : it
Publisher:
Release Date :

Analysis Of Microelectronic Materials And Devices written by Eds.) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on with categories.

Microelectronic Materials

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Author : C.R.M. Grovenor
language : en
Publisher: Routledge
Release Date : 2017-10-05

Microelectronic Materials written by C.R.M. Grovenor and has been published by Routledge this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-10-05 with Science categories.

This practical book shows how an understanding of structure, thermodynamics, and electrical properties can explain some of the choices of materials used in microelectronics, and can assist in the design of new materials for specific applications. It emphasizes the importance of the phase chemistry of semiconductor and metal systems for ensuring the long-term stability of new devices. The book discusses single-crystal and polycrystalline silicon, aluminium- and gold-based metallisation schemes, packaging semiconductor devices, failure analysis, and the suitability of various materials for optoelectronic devices and solar cells. It has been designed for senior undergraduates, graduates, and researchers in physics, electronic engineering, and materials science.

Microelectronic Devices

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Author : Keith Drummond Leaver
language : en
Publisher: Allied Publishers
Release Date : 1989

Microelectronic Devices written by Keith Drummond Leaver and has been published by Allied Publishers this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Semiconductors categories.

Microelectronic Failure Analysis Desk Reference

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Author :
language : en
Publisher: ASM International
Release Date : 2001-01-01

Microelectronic Failure Analysis Desk Reference written by and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-01-01 with Technology & Engineering categories.

Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.

Microelectronic Failure Analysis

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Author :
language : en
Publisher: ASM International
Release Date : 2002-01-01

Microelectronic Failure Analysis written by and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-01-01 with Technology & Engineering categories.

Provides new or expanded coverage on the latest techniques for microelectronic failure analysis. The CD-ROM includes the complete content of the book in fully searchable Adobe Acrobat format. Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee

Gan Based Materials And Devices

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Author : Michael Shur
language : en
Publisher: World Scientific
Release Date : 2004

Gan Based Materials And Devices written by Michael Shur and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004 with Technology & Engineering categories.

The unique materials properties of GaN-based semiconductors havestimulated a great deal of interest in research and developmentregarding nitride materials growth and optoelectronic andnitride-based electronic devices. High electron mobility andsaturation velocity, high sheet carrier concentration atheterojunction interfaces, high breakdown field, and low thermalimpedance of GaN-based films grown over SiC or bulk AlN substratesmake nitride-based electronic devices very promising.