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Architecture Design For Soft Errors


Architecture Design For Soft Errors
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Architecture Design For Soft Errors


Architecture Design For Soft Errors
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Author : Shubu Mukherjee
language : en
Publisher: Morgan Kaufmann Pub
Release Date : 2008

Architecture Design For Soft Errors written by Shubu Mukherjee and has been published by Morgan Kaufmann Pub this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008 with Computers categories.


This book provides a comprehensive description of the architetural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem deffinition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. TABLE OF CONTENTS Chapter 1: Introduction Chapter 2: Device- and Circuit-Level Modeling, Measurement, and Mitigation Chapter 3: Architectural Vulnerability Analysis Chapter 4: Advanced Architectural Vulnerability Analysis Chapter 5: Error Coding Techniques Chapter 6: Fault Detection via Redundant Execution Chapter 7: Hardware Error Recovery Chapter 8: Software Detection and Recovery * Provides the methodologies necessary to quantify the effect of radiation-induced soft errors as well as state-of-the-art techniques to protect against them



Architecture Design For Soft Errors


Architecture Design For Soft Errors
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Author : Shubu Mukherjee
language : en
Publisher: Morgan Kaufmann
Release Date : 2011-08-29

Architecture Design For Soft Errors written by Shubu Mukherjee and has been published by Morgan Kaufmann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-08-29 with Computers categories.


Architecture Design for Soft Errors provides a comprehensive description of the architectural techniques to tackle the soft error problem. It covers the new methodologies for quantitative analysis of soft errors as well as novel, cost-effective architectural techniques to mitigate them. To provide readers with a better grasp of the broader problem definition and solution space, this book also delves into the physics of soft errors and reviews current circuit and software mitigation techniques. There are a number of different ways this book can be read or used in a course: as a complete course on architecture design for soft errors covering the entire book; a short course on architecture design for soft errors; and as a reference book on classical fault-tolerant machines. This book is recommended for practitioners in semi-conductor industry, researchers and developers in computer architecture, advanced graduate seminar courses on soft errors, and (iv) as a reference book for undergraduate courses in computer architecture. - Helps readers build-in fault tolerance to the billions of microchips produced each year, all of which are subject to soft errors - Shows readers how to quantify their soft error reliability - Provides state-of-the-art techniques to protect against soft errors



Soft Errors


Soft Errors
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Author : Jean-Luc Autran
language : en
Publisher: CRC Press
Release Date : 2017-12-19

Soft Errors written by Jean-Luc Autran and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-19 with Technology & Engineering categories.


Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation. Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment—one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text: Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits Explores trends for future technological nodes and emerging devices Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.



Resilient Architecture Design For Voltage Variation


Resilient Architecture Design For Voltage Variation
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Author : Vijay Janapa Reddi
language : en
Publisher: Springer Nature
Release Date : 2022-05-31

Resilient Architecture Design For Voltage Variation written by Vijay Janapa Reddi and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-05-31 with Technology & Engineering categories.


Shrinking feature size and diminishing supply voltage are making circuits sensitive to supply voltage fluctuations within the microprocessor, caused by normal workload activity changes. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues that degrade processor robustness. Mechanisms that learn to tolerate, avoid, and eliminate voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger, thus enabling tighter voltage margins that improve performance or lower power consumption. We describe the problem of voltage variation and the factors that influence this variation during processor design and operation. We also describe a variety of runtime hardware and software mitigation techniques that either tolerate, avoid, and/or eliminate voltage violations. We hope processor architects will find the information useful since tolerance, avoidance, and elimination are generalizable constructs that can serve as a basis for addressing other reliability challenges as well. Table of Contents: Introduction / Modeling Voltage Variation / Understanding the Characteristics of Voltage Variation / Traditional Solutions and Emerging Solution Forecast / Allowing and Tolerating Voltage Emergencies / Predicting and Avoiding Voltage Emergencies / Eliminiating Recurring Voltage Emergencies / Future Directions on Resiliency



Software Architect S Handbook


Software Architect S Handbook
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Author : Joseph Ingeno
language : en
Publisher: Packt Publishing Ltd
Release Date : 2018-08-30

Software Architect S Handbook written by Joseph Ingeno and has been published by Packt Publishing Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-08-30 with Computers categories.


A comprehensive guide to exploring software architecture concepts and implementing best practices Key Features Enhance your skills to grow your career as a software architect Design efficient software architectures using patterns and best practices Learn how software architecture relates to an organization as well as software development methodology Book Description The Software Architect’s Handbook is a comprehensive guide to help developers, architects, and senior programmers advance their career in the software architecture domain. This book takes you through all the important concepts, right from design principles to different considerations at various stages of your career in software architecture. The book begins by covering the fundamentals, benefits, and purpose of software architecture. You will discover how software architecture relates to an organization, followed by identifying its significant quality attributes. Once you have covered the basics, you will explore design patterns, best practices, and paradigms for efficient software development. The book discusses which factors you need to consider for performance and security enhancements. You will learn to write documentation for your architectures and make appropriate decisions when considering DevOps. In addition to this, you will explore how to design legacy applications before understanding how to create software architectures that evolve as the market, business requirements, frameworks, tools, and best practices change over time. By the end of this book, you will not only have studied software architecture concepts but also built the soft skills necessary to grow in this field. What you will learn Design software architectures using patterns and best practices Explore the different considerations for designing software architecture Discover what it takes to continuously improve as a software architect Create loosely coupled systems that can support change Understand DevOps and how it affects software architecture Integrate, refactor, and re-architect legacy applications Who this book is for The Software Architect’s Handbook is for you if you are a software architect, chief technical officer (CTO), or senior developer looking to gain a firm grasp of software architecture.



Soft Error Reliability Using Virtual Platforms


Soft Error Reliability Using Virtual Platforms
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Author : Felipe Rocha da Rosa
language : en
Publisher: Springer Nature
Release Date : 2020-11-02

Soft Error Reliability Using Virtual Platforms written by Felipe Rocha da Rosa and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-11-02 with Technology & Engineering categories.


This book describes the benefits and drawbacks inherent in the use of virtual platforms (VPs) to perform fast and early soft error assessment of multicore systems. The authors show that VPs provide engineers with appropriate means to investigate new and more efficient fault injection and mitigation techniques. Coverage also includes the use of machine learning techniques (e.g., linear regression) to speed-up the soft error evaluation process by pinpointing parameters (e.g., architectural) with the most substantial impact on the software stack dependability. This book provides valuable information and insight through more than 3 million individual scenarios and 2 million simulation-hours. Further, this book explores machine learning techniques usage to navigate large fault injection datasets.



Soft Errors In Modern Electronic Systems


Soft Errors In Modern Electronic Systems
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Author : Michael Nicolaidis
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-09-24

Soft Errors In Modern Electronic Systems written by Michael Nicolaidis and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-09-24 with Technology & Engineering categories.


This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.



Advances In Computer Systems Architecture


Advances In Computer Systems Architecture
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Author : Thambipillai Srikanthan
language : en
Publisher: Springer
Release Date : 2005-10-19

Advances In Computer Systems Architecture written by Thambipillai Srikanthan and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-10-19 with Computers categories.


On behalf of the ProgramCommittee, we are pleased to present the proceedings of the 2005 Asia-Paci?c Computer Systems Architecture Conference (ACSAC 2005) held in the beautiful and dynamic country of Singapore. This conference was the tenth in its series, one of the leading forums for sharing the emerging research ?ndings in this ?eld. In consultation with the ACSAC Steering Committee, we selected a - member Program Committee. This Program Committee represented a broad spectrum of research expertise to ensure a good balance of research areas, - stitutions and experience while maintaining the high quality of this conference series. This year’s committee was of the same size as last year but had 19 new faces. We received a total of 173 submissions which is 14% more than last year. Each paper was assigned to at least three and in some cases four ProgramC- mittee members for review. Wherever necessary, the committee members called upon the expertise of their colleagues to ensure the highest possible quality in the reviewing process. As a result, we received 415 reviews from the Program Committee members and their 105 co-reviewers whose names are acknowledged inthe proceedings.Theconferencecommitteeadopteda systematicblind review process to provide a fair assessment of all submissions. In the end, we accepted 65 papers on a broad range of topics giving an acceptance rate of 37.5%. We are grateful to all the Program Committee members and the co-reviewers for their e?orts in completing the reviews within a tight schedule.



Vlsi Design And Test For Systems Dependability


Vlsi Design And Test For Systems Dependability
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Author : Shojiro Asai
language : en
Publisher: Springer
Release Date : 2018-07-20

Vlsi Design And Test For Systems Dependability written by Shojiro Asai and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-07-20 with Technology & Engineering categories.


This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.