Characterisation Of Radiation Damage By Transmission Electron Microscopy
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Characterisation Of Radiation Damage By Transmission Electron Microscopy
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Author : M.L Jenkins
language : en
Publisher: CRC Press
Release Date : 2000-11-21
Characterisation Of Radiation Damage By Transmission Electron Microscopy written by M.L Jenkins and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000-11-21 with Medical categories.
Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clus
Microstructural Characterization Of Radiation Effects In Nuclear Materials
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Author : Philip Edmondson
language : en
Publisher: Butterworth-Heinemann
Release Date : 2029-01-15
Microstructural Characterization Of Radiation Effects In Nuclear Materials written by Philip Edmondson and has been published by Butterworth-Heinemann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2029-01-15 with Technology & Engineering categories.
Microstructural Characterization of Radiation Effects in Nuclear Materials provides an overview into experimental techniques that can be used to examine those effects (both neutron and charged particle) and can be used by researchers, technicians or students as a tool to introduce them to the various techniques. The need to examine the effect of radiation on materials is becoming increasingly important as nuclear energy is emerging as a growing source of renewable energy. The book opens with a discussion of why it is important to study the effects of radiation on materials and looks at current and future reactor designs and the various constraints faced by materials as a result of those designs. The book also includes an overview of the radiation damage mechanisms. The next section explores the various methods for characterizing damage including transmission electron microscopy, scanning transmission electron microscopy, analytical electron microscopy, electron backscatter diffraction, atom probe tomography, X-ray scattering techniques and ion beam analysis techniques. Lastly, a brief introduction into modelling radiation effects in materials, and the synergy of experiments and modelling to provide an atomic-scale to macro-scale understanding of damage processes is included. Focuses on structural analysis techniques, describing their instrumentation, and introduces specific case studies showcasing the techniques Covers the fundamental aspects of TEM as well as the specific aspects of radiation damage Discusses the characterization of real materials systems that have been neutron irradiated Encompasses sample preparation and statistical analysis into the individual technique chapters Written by well-known experts in the field of materials characterization
Spectroscopy For Materials Characterization
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Author : Simonpietro Agnello
language : en
Publisher: John Wiley & Sons
Release Date : 2021-09-08
Spectroscopy For Materials Characterization written by Simonpietro Agnello and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-09-08 with Technology & Engineering categories.
SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.
Electron Tomography
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Author : Joachim Frank
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-17
Electron Tomography written by Joachim Frank and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Science categories.
This unique resource details the theory, working methods, and applications of electron tomographic techniques for imaging asymmetric, noncrystalline biological specimens.
Electron Microscopy Of Polymers
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Author : Goerg H. Michler
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-07-05
Electron Microscopy Of Polymers written by Goerg H. Michler and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-07-05 with Technology & Engineering categories.
The study of polymers by electron microscopy (EM) needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy, are given in this hands-on book. The application of these techniques to the study of morphology and properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.
The Chemical Applications Of Transmission Electron Microscopy
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Author : J. R. Fryer
language : en
Publisher:
Release Date : 1979
The Chemical Applications Of Transmission Electron Microscopy written by J. R. Fryer and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1979 with Science categories.
Electron Microscopy And Analysis 2001
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Author : M. Aindow
language : en
Publisher: CRC Press
Release Date : 2001-12-01
Electron Microscopy And Analysis 2001 written by M. Aindow and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-12-01 with Science categories.
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the state of the art in the field.
Transmission Electron Microscopy
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Author : Ludwig Reimer
language : en
Publisher: Springer
Release Date : 2008-12-15
Transmission Electron Microscopy written by Ludwig Reimer and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-12-15 with Science categories.
The aim of this monograph is to outline the physics of image formation, electron–specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.
Field Emission Scanning Electron Microscopy
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Author : Nicolas Brodusch
language : en
Publisher: Springer
Release Date : 2017-09-25
Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-09-25 with Technology & Engineering categories.
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Transmission Electron Microscopy
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Author : C. Barry Carter
language : en
Publisher: Springer
Release Date : 2016-08-24
Transmission Electron Microscopy written by C. Barry Carter and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-08-24 with Technology & Engineering categories.
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.