Characterization In Silicon Processing
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Characterization In Silicon Processing
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Author : Yale Strausser
language : en
Publisher: Elsevier
Release Date : 2013-10-22
Characterization In Silicon Processing written by Yale Strausser and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-22 with Technology & Engineering categories.
This volume is devoted to the consideration of the use use of surface, thin film and interface characterization tools in support of silicon-based semiconductor processing. The approach taken is to consider each of the types of films used in silicon devices individually in its own chapter and to discuss typical problems seen throughout that films' history, including characterization tools which are most effectively used to clarifying and solving those problems.
Characterization In Silicon Processing
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Author : Yale Strausser
language : en
Publisher:
Release Date : 2013
Characterization In Silicon Processing written by Yale Strausser and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with Electric conductors categories.
This volume is devoted to the consideration of the use use of surface, thin film and interface characterization tools in support of silicon-based semiconductor processing. The approach taken is to consider each of the types of films used in silicon devices individually in its own chapter and to discuss typical problems seen throughout that films' history, including characterization tools which are most effectively used to clarifying and solving those problems.
Materials And Process Characterization
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Author : Norman G. Einspruch
language : en
Publisher: Academic Press
Release Date : 2014-12-01
Materials And Process Characterization written by Norman G. Einspruch and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-12-01 with Technology & Engineering categories.
VLSI Electronics: Microstructure Science, Volume 6: Materials and Process Characterization addresses the problem of how to apply a broad range of sophisticated materials characterization tools to materials and processes used for development and production of very large scale integration (VLSI) electronics. This book discusses the various characterization techniques, such as Auger spectroscopy, secondary ion mass spectroscopy, X-ray topography, transmission electron microscopy, and spreading resistance. The systematic approach to the technologies of VLSI electronic materials and device manufacture are also considered. This volume is beneficial to materials scientists, chemists, and engineers who are commissioned with the responsibility of developing and implementing the production of materials and devices to support the VLSI era.
Techniques And Challenges For 300 Mm Silicon
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Author : H. Richter
language : en
Publisher: Elsevier Science Limited
Release Date : 1999
Techniques And Challenges For 300 Mm Silicon written by H. Richter and has been published by Elsevier Science Limited this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with Technology & Engineering categories.
The activities of the semiconductor industry to introduce a new, large wafer diameter were triggered by expected potential overall savings - cost and resource - and an anticipated increasing demand for Silicon wafers. In the beginning, around 1994, agreement on the diameter of the next wafer generation had to be achieved and finally 300 mm was globally accepted to be the next wafer diameter, a decision obtained at international summits in 1994/1995, based on the work of a SEMI task force. Several workshops on 300 mm wafers have been held by SEMI, JSNM and other organizations during the past few years. However, the present E-MRS conference on Techniques and Challenges for 300 mm Silicon: Processing, Characterization, Modeling and Equipment was the first international scientific conference about this subject. The papers - invited as well as submitted - cover a wide range of subjects, financial issues, fab concepts, crystal growth, wafer process development, material and defect issues, wafer characterization and provide an excellent review of the present status of 300 mm technology.
Silicon Processing
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Author : SYMPOSIUM ON SILICON PROCESSING. (1982 : SAN JOSE) AUTOR
language : en
Publisher: ASTM International
Release Date : 1983
Silicon Processing written by SYMPOSIUM ON SILICON PROCESSING. (1982 : SAN JOSE) AUTOR and has been published by ASTM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 1983 with categories.
Semiconductor Characterization
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Author : W. Murray Bullis
language : en
Publisher: American Institute of Physics
Release Date : 1996
Semiconductor Characterization written by W. Murray Bullis and has been published by American Institute of Physics this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with Science categories.
Market: Those in government, industry, and academia interested in state-of-the-art knowledge on semiconductor characterization for research, development, and manufacturing. Based on papers given at an International Nist Workshop in January 1995, Semiconductor Characterization covers the unique characterization requirements of both silicon IC development and manufacturing, and compound semiconductor materials, devices, and manufacturing. Additional sections discuss technology trends and future requirements for compound semiconductor applications. Also highlighted are recent developments in characterization, including in- situ, in-FAB, and off-line analysis methods. The book provides a concise, effective portrayal of industry needs and problems in the important specialty of metrology for semiconductor technology.
Process And Materials Characterization And Diagnostics In Ic Manufacturing
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Author : Kenneth W. Tobin
language : en
Publisher: SPIE-International Society for Optical Engineering
Release Date : 2003
Process And Materials Characterization And Diagnostics In Ic Manufacturing written by Kenneth W. Tobin and has been published by SPIE-International Society for Optical Engineering this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003 with Business & Economics categories.
Characterization Of Pharmaceutical Nano And Microsystems
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Author : Leena Peltonen
language : en
Publisher: John Wiley & Sons
Release Date : 2020-12-21
Characterization Of Pharmaceutical Nano And Microsystems written by Leena Peltonen and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-12-21 with Science categories.
Learn about the analytical tools used to characterize particulate drug delivery systems with this comprehensive overview Edited by a leading expert in the field, Characterization of Pharmaceutical Nano- and Microsystems provides a complete description of the analytical techniques used to characterize particulate drug systems on the micro- and nanoscale. The book offers readers a full understanding of the basic physicochemical characteristics, material properties and differences between micro- and nanosystems. It explains how and why greater experience and more reliable measurement techniques are required as particle size shrinks, and the measured phenomena grow weaker. Characterization of Pharmaceutical Nano- and Microsystems deals with a wide variety of topics relevant to chemical and solid-state analysis of drug delivery systems, including drug release, permeation, cell interaction, and safety. It is a complete resource for those interested in the development and manufacture of new medicines, the drug development process, and the translation of those drugs into life-enriching and lifesaving medicines. Characterization of Pharmaceutical Nano- and Microsystems covers all of the following topics: An introduction to the analytical tools applied to determine particle size, morphology, and shape Common chemical approaches to drug system characterization A description of solid-state characterization of drug systems Drug release and permeation studies Toxicity and safety issues The interaction of drug particles with cells Perfect for pharmaceutical chemists and engineers, as well as all other industry professionals and researchers who deal with drug delivery systems on a regular basis, Characterization of Pharmaceutical Nano- and Microsystems also belongs on bookshelves of interested students and faculty who interact with this topic.
Publications Of The National Institute Of Standards And Technology Catalog
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Author : National Institute of Standards and Technology (U.S.)
language : en
Publisher:
Release Date : 1975
Publications Of The National Institute Of Standards And Technology Catalog written by National Institute of Standards and Technology (U.S.) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1975 with categories.
Nbs Special Publication
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Author :
language : en
Publisher:
Release Date : 1978
Nbs Special Publication written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with Weights and measures categories.