Cluster Secondary Ion Mass Spectrometry
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Cluster Secondary Ion Mass Spectrometry
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Author : Christine M. Mahoney
language : en
Publisher: John Wiley & Sons
Release Date : 2013-04-17
Cluster Secondary Ion Mass Spectrometry written by Christine M. Mahoney and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Science categories.
Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include: Cluster SIMS theory and modeling Cluster ion source types and performance expectations Cluster ion beams for surface analysis experiments Molecular depth profiling and 3-D analysis with cluster ion beams Specialty applications ranging from biological samples analysis to semiconductors/metals analysis Future challenges and prospects for cluster SIMS This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.
Cluster Ion Formation And Fragmentation During Secondary Ion Mass Spectrometry
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Author : G. J. Leggett
language : en
Publisher:
Release Date : 1990
Cluster Ion Formation And Fragmentation During Secondary Ion Mass Spectrometry written by G. J. Leggett and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990 with categories.
Cluster Projectiles For Tof Secondary Ion Mass Spectrometry
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Author : Ronny Dwain Harris
language : en
Publisher:
Release Date : 1998
Cluster Projectiles For Tof Secondary Ion Mass Spectrometry written by Ronny Dwain Harris and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with categories.
Secondary Ion Mass Spectrometry
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Author : J. C. Vickerman
language : en
Publisher: Oxford University Press, USA
Release Date : 1989
Secondary Ion Mass Spectrometry written by J. C. Vickerman and has been published by Oxford University Press, USA this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Business & Economics categories.
This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.
Characterization Of Surface And Layered Films With Cluster Secondary Ion Mass Spectrometry
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Author : Zhen Li
language : en
Publisher:
Release Date : 2008
Characterization Of Surface And Layered Films With Cluster Secondary Ion Mass Spectrometry written by Zhen Li and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008 with categories.
Cluster secondary ion mass spectrometry (SIMS) analyses of layer-by-layer thin films were performed to investigate the depth/volume of SI emission and accuracy of the SI signal. The thin-layered samples were assembled by alternate adsorption of polyethylenimine (PEI), polystyrene sulfonate (PSS), polydiallyldimethylammonium chloride (PDDA) and clay nanoparticles. The films have controlled 3-D structure to test the depth of secondary ion (SI) emission and evaluate planar homogeneity. The SI emission depth is ~ 6-9 nm with 136 keV Au400 4+ (340 eV/atom) and 26 keV C60 + (433 eV/atom) projectile impacts. The diameter of the SI emission area is ~ 15 nm by assuming a semispherical emission volume. The SI yields oscillate with the alternation of the compositions of the topmost layers, which was observed with small cluster projectiles (CsICs+ and Au3 +) as well as with the large cluster projectiles (C60 + and Au400 4+). The SI signals of C- and CH- are enhanced in the presence of metal atoms in the expanding plume. Recoiled C60 projectile fragments (m/z=12, 13, 36) are observed in the SI mass spectra. Caution must be taken when monitoring the yields of such carbon cluster ions from organic surfaces because their yields don't reflect the true surface concentration. The Au400 4+ projectile impacts produce abundant co-emission. The correlation coefficient between the co-emitted SIs can be used to evaluate the planar homogeneity. The results show that the PSS layer is more uniform than the clay layers. The effect of alkali metal ion implantation on the nature and abundance of SI emission was investigated on Cs+ or Na+ implanted glycine samples. The alkali metal implantation induces surface damage and decreases the glycine molecular ion yields. Glycine molecular ions and fragment ions (CN-, CNO- ) are emitted from different depths and locations of the emission volume. The same implanted glycine sample analyzed with different cluster projectiles (Au400 4+ and C60 +) shows different trends in the yields of molecular and fragment ions, which suggest a different mechanism of SI emission with different projectile impacts. The Na+ beam induces more surface damage compared with the Cs+ at equal impact energy.
Secondary Ion Mass Spectrometry
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Author : Paul van der Heide
language : en
Publisher: John Wiley & Sons
Release Date : 2014-08-19
Secondary Ion Mass Spectrometry written by Paul van der Heide and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-08-19 with Science categories.
Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations • Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission • Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) • Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions • Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
Nano Domain Analysis Via Massive Cluster Secondary Ion Mass Spectrometry In The Event By Event Mode
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Author : Veronica Tiffany Pinnick
language : en
Publisher:
Release Date : 2011
Nano Domain Analysis Via Massive Cluster Secondary Ion Mass Spectrometry In The Event By Event Mode written by Veronica Tiffany Pinnick and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011 with categories.
Secondary ion mass spectrometry (SIMS) is a surface analysis technique which characterizes species sputtered by an energetic particle beam. Bombardment with cluster projectiles offers the following notable advantages over bombardment with atomic ions or small clusters: enhanced emission of molecular ions, low damage cross-section, and reduced molecular fragmentation. Additionally, in the case of Au4004 and C60 impacts, desorption originates from nanometric volumes. These features make clusters useful probes to obtain molecular information from both nano-objects and nano-domains. The "event-by-event bombardment/detection mode" probes nano-objects one-at-a-time, while collecting and storing the corresponding secondary ion (SI) information. Presented here are the first experiments where free-standing nano-objects were bombarded with keV projectiles of atomic to nanoparticle size. The objects are aluminum nano-whiskers, 2 nm in diameter and ~250 nm in length. Au4004+ has a diameter of ~2 nm, comparable to the nominal diameter of the nanowhiskers. There are notable differences in the SI response from sample volumes too small for full projectile energy deposition. The whisker spectra are dominated by small clusters--the most abundant species being AlO− and AlO2−. Bulk samples have larger yields for AlO2− than for AlO−, while this trend is reversed in whisker samples. Bulk samples give similar abundances of large SI clusters, while whisker samples give an order of magnitude lower yield of these SIs. Effective yields were calculated in order to determine quantitative differences between the nano-objects and bulk samples. The characterization of individual nano-objects from a mixture is demonstrated with negatively charged polymer spheres that are attracted to and retained by the nano-whiskers. The spheres are monodisperse polystyrene nanoparticles (30nm diameter). Our results show that the event-by-event mode can provide information on the nature, size, relative location, and abundance of nano-objects in the field of view. This study presents the first evidence of quantitative molecular information originating from nano-object mixtures. Biologically relevant systems (solid-supported lipid bilayers) were also characterized using Au5+, Au4004+ and C60+. Organization-dependent SI emission was observed for phosphocholine bilayers. Lipid domain formation was also investigated in bilayers formed from cholesterol and a mixed lipid system. Trends in the correlation coefficient suggest that cholesterol segregates from the surrounding lipid environment during raft formation.
New Developments For Cluster Ion Beams In Secondary Ion Mass Spectrometry Imaging Experiments
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Author : Joseph Kozole
language : en
Publisher:
Release Date : 2008
New Developments For Cluster Ion Beams In Secondary Ion Mass Spectrometry Imaging Experiments written by Joseph Kozole and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008 with categories.
New Capabilities For Molecular Surface And In Depth Analysis With Cluster Secondary Ion Mass Spectrometry
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Author : Huriyyah Alturaifi
language : en
Publisher:
Release Date : 2018
New Capabilities For Molecular Surface And In Depth Analysis With Cluster Secondary Ion Mass Spectrometry written by Huriyyah Alturaifi and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018 with categories.
Single Cell Imaging Of Exogenous Compounds Using Cluster Secondary Ion Mass Spectrometry
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Author : Anna Bloom
language : en
Publisher:
Release Date : 2017
Single Cell Imaging Of Exogenous Compounds Using Cluster Secondary Ion Mass Spectrometry written by Anna Bloom and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017 with categories.
The focus of this work has encompassed analytical method development and application, specifically through the use of secondary ion mass spectrometry (SIMS) for the investigation of exogenous compounds in single cells. In particular, the goal has been to exploit the unique capabilities of SIMS in order to garner increased understanding of the interactions between pharmaceutical compounds and cellular systems to aid in the development of lower dose, more efficient medicinal compounds. The use of SIMS in biomedical applications is still a relatively young field. As such, work was devoted to pushing the boundaries of this technique to optimize conditions for single cell imaging using SIMS. It follows that proper sample preparation is of critical importance. The chemical and structural integrity of the sample must be maintained, while simultaneously allowing for compatibility in the ultra-high vacuum environment required for SIMS experiments. Compounds studied include fluorescent stains (Hoechst 33342 and DiI), gold nanoparticles of various shapes and sizes, several pharmaceutical compounds, and functionalized gold nanoparticles. Research of this nature has extensive applications, particularly in pharmaceutical compound development and understanding. The successes of the work shown here, highlights the ability of SIMS to be applied to better understanding the dynamics between drug, substrate, and host in targeted drug therapy applications.