Cluster Secondary Ion Mass Spectrometry

DOWNLOAD

Download Cluster Secondary Ion Mass Spectrometry PDF/ePub or read online books in Mobi eBooks. Click Download or Read Online button to get Cluster Secondary Ion Mass Spectrometry book now. This website allows unlimited access to, at the time of writing, more than 1.5 million titles, including hundreds of thousands of titles in various foreign languages. If the content not found or just blank you must refresh this page

Cluster Secondary Ion Mass Spectrometry

DOWNLOAD
Author : Christine M. Mahoney
language : en
Publisher: John Wiley & Sons
Release Date : 2013-04-17

Cluster Secondary Ion Mass Spectrometry written by Christine M. Mahoney and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Science categories.

Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include: Cluster SIMS theory and modeling Cluster ion source types and performance expectations Cluster ion beams for surface analysis experiments Molecular depth profiling and 3-D analysis with cluster ion beams Specialty applications ranging from biological samples analysis to semiconductors/metals analysis Future challenges and prospects for cluster SIMS This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.

Secondary Ion Mass Spectrometry

DOWNLOAD
Author : Paweł Piotr Michałowski
language : en
Publisher: Royal Society of Chemistry
Release Date : 2025-06-06

Secondary Ion Mass Spectrometry written by Paweł Piotr Michałowski and has been published by Royal Society of Chemistry this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-06-06 with Science categories.

Secondary ion mass spectrometry (SIMS) is a technique used to analyse the composition of solid surfaces and thin films by sputtering the surface of the specimen with a primary ion beam and collecting and analysing ejected secondary ions. The technique has been applied to quality assurance in semiconductor manufacture, in forensics for enhancement of fingerprints and to determine the composition of cometary dust. This book briefly introduces the fundamentals of the SIMS technique and discusses in detail recent advancements and applications in various branches of science. From an extensive literature review, it provides a good overview of how to reproduce the most prominent experiments and what instruments are required or suited to the analysis. It will inspire new designs and hence research for the future. Appealing to graduates or postgraduates who want an overview of the field and how to use this technique, researchers new to this field will find innovative solutions and how to achieve them detailed herein.

Secondary Ion Mass Spectrometry Sims Ii

DOWNLOAD
Author : A. Benninghoven
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-11

Secondary Ion Mass Spectrometry Sims Ii written by A. Benninghoven and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-11 with Science categories.

Cluster Ion Formation And Fragmentation During Secondary Ion Mass Spectrometry

DOWNLOAD
Author : G. J. Leggett
language : en
Publisher:
Release Date : 1990

Cluster Ion Formation And Fragmentation During Secondary Ion Mass Spectrometry written by G. J. Leggett and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990 with categories.

Secondary Ion Mass Spectrometry Sims V

DOWNLOAD
Author : Alfred Benninghoven
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Secondary Ion Mass Spectrometry Sims V written by Alfred Benninghoven and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.

This volume contains the proceedings of the Fifth International Confer ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985. The conference was the fifth in a series of conferences held bienni ally. Previous conferences were held in Miinster (1977), Stanford (1979), Budapest (1981), and Osaka (1983). SIMS V was organized by Dr. R.J. Colton of the Nayal Research Lab oratory and Dr. D.S. Simons of the National Bureau of Standards un der the auspices of the International Organizing Committee chaired by Prof. A. Benninghoven of the Universitat Miinster. Dr. Richard F.K. Herzog served as the honorary chairman of SIMS V. While Dr. Herzog is best known to the mass spectrometry community for his theoretical development of a mass spectrometer design, known as the Mattauch-Herzog geometry, he also made several early and impor tant contributions to SIMS. In 1949, Herzog and Viehbock published a description of the first instrument designed to study secondary ions pro duced by bombardment from a beam of ions generated in a source that was separated from the sample by a narrow tube. Later at the GCA Cor poration, he brought together a team of researchers including H.J. Liebl, F.G. Riidenauer, W.P. Poschenrieder and F.G. Satkiewicz, who designed and built, and carried out applied research with the first commercial ion microprobe.

Mass Spectrometry Handbook

DOWNLOAD
Author : Mike S. Lee
language : en
Publisher: John Wiley & Sons
Release Date : 2012-04-16

Mass Spectrometry Handbook written by Mike S. Lee and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-04-16 with Science categories.

Due to its enormous sensitivity and ease of use, mass spectrometry has grown into the analytical tool of choice in most industries and areas of research. This unique reference provides an extensive library of methods used in mass spectrometry, covering applications of mass spectrometry in fields as diverse as drug discovery, environmental science, forensic science, clinical analysis, polymers, oil composition, doping, cellular research, semiconductor, ceramics, metals and alloys, and homeland security. The book provides the reader with a protocol for the technique described (including sampling methods) and explains why to use a particular method and not others. Essential for MS specialists working in industrial, environmental, and clinical fields.

Secondary Ion Mass Spectrometry

DOWNLOAD
Author : A. Benninghoven
language : en
Publisher: Wiley
Release Date : 1997-05-21

Secondary Ion Mass Spectrometry written by A. Benninghoven and has been published by Wiley this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-05-21 with Science categories.

This volume contains the proceedings of the Tenth International Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a diverse field of research ranging from environmental problems to depth profiling and semiconductors. In doing so, it provides an excellent overview of current research and technology by acknowledged experts in their specialised fields.

Secondary Ion Mass Spectrometry Sims Iv

DOWNLOAD
Author : A. Benninghoven
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Secondary Ion Mass Spectrometry Sims Iv written by A. Benninghoven and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.

This volume contains full proceedings of the Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS-IV), held in the Minoo-Kanko Hotel, Osaka, Japan, from November 13th to 19th, 1983. Coordinated by a local or ganizing committee under the auspices of the international organizing com mittee, it followed earlier conferences held in MUnster (1977), Stanford (1979), and Budapest (1981). The conference was attended by about 250 participants from 18 countries, and 130 papers including 24 invited ones were presented. Reflecting the rap idly expanding activities in the SIMS field, informative papers were pre sented containing up-to-date information on SIMS and various related fields. The proceedings focussed upon six main issues: (1) Fundamentals of sput tering and secondary ion formation. (2) Recent progress in instrumentation, including submicron SIMS and image processing. (3) SIMS combined with other surface analysis techniques. (4) Outstanding SIMS-related analytical methods such as laser-microprobe SIMS, sputtered neutral mass spectrometry, mass spectrometry of sputtered neutrals by multi-photon resonance ionization, and accelerator-based SIMS. (5) Organic SIMS and FAB which has recently become a rapidly expanding technique in pharmacy, biotechnology, etc. (6) Appl ica tions of SIMS to various fields such as metallurgy, geology, and biology, including depth profiling of semiconductors, and analysis of inorganic mate rials. As a venue for the exchange of ideas and information concerning all the above issues, the conference proved a great success.

Mass Spectrometry Of Polymers New Techniques

DOWNLOAD
Author : Minna Hakkarainen
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-03-14

Mass Spectrometry Of Polymers New Techniques written by Minna Hakkarainen and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-03-14 with Technology & Engineering categories.

Emerging Mass Spectrometric Tools for Analysis of Polymers and Polymer Additives, by Nina Aminlashgari and Minna Hakkarainen. Analysis of Polymer Additives and Impurities by Liquid Chromatography/Mass Spectrometry and Capillary Electrophoresis/Mass Spectrometry, by Wolfgang Buchberger and Martin Stiftinger. Direct Insertion Probe Mass Spectrometry of Polymers, by Jale Hacaloglu Mass Spectrometric Characterization of Oligo- and Polysaccharides and Their Derivatives, by Petra Mischnick. Electrospray Ionization-Mass Spectrometry for Molecular Level Understanding of Polymer Degradation, by Minna Hakkarainen.

New Trends And Potentialities Of Tof Sims In Surface Studies

DOWNLOAD
Author : Jacek Grams
language : en
Publisher: Nova Publishers
Release Date : 2007

New Trends And Potentialities Of Tof Sims In Surface Studies written by Jacek Grams and has been published by Nova Publishers this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007 with Science categories.

This book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS). It includes research and applications of the new primary ion guns. It also describes new possibilities of mass spectrometers and instrumentation development.