Conductive Atomic Force Microscopy
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Compendium Of Surface And Interface Analysis
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Author : The Surface Science Society of Japan
language : en
Publisher: Springer
Release Date : 2018-02-19
Compendium Of Surface And Interface Analysis written by The Surface Science Society of Japan and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-02-19 with Technology & Engineering categories.
This book concisely illustrates the techniques of major surface analysis and their applications to a few key examples. Surfaces play crucial roles in various interfacial processes, and their electronic/geometric structures rule the physical/chemical properties. In the last several decades, various techniques for surface analysis have been developed in conjunction with advances in optics, electronics, and quantum beams. This book provides a useful resource for a wide range of scientists and engineers from students to professionals in understanding the main points of each technique, such as principles, capabilities and requirements, at a glance. It is a contemporary encyclopedia for selecting the appropriate method depending on the reader's purpose.
Electrical Atomic Force Microscopy For Nanoelectronics
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Author : Umberto Celano
language : en
Publisher: Springer
Release Date : 2019-08-01
Electrical Atomic Force Microscopy For Nanoelectronics written by Umberto Celano and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-08-01 with Science categories.
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.
Conductive Atomic Force Microscopy
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Author : Mario Lanza
language : en
Publisher: John Wiley & Sons
Release Date : 2017-08-07
Conductive Atomic Force Microscopy written by Mario Lanza and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-08-07 with Science categories.
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
Organic Electronics Ii
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Author : Hagen Klauk
language : en
Publisher: John Wiley & Sons
Release Date : 2012-04-09
Organic Electronics Ii written by Hagen Klauk and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-04-09 with Technology & Engineering categories.
Like its predecessor this book is devoted to the materials, manufacturing and applications aspects of organic thin-film transistors. Once again authored by the most renowned experts from this fascinating and fast-moving area of research, it offers a joint perspective both broad and in-depth on the latest developments in the areas of materials chemistry, transport physics, materials characterization, manufacturing technology, and circuit integration of organic transistors. With its many figures and detailed index, this book once again also serves as a ready reference.
Atomic Force Microscopy In Liquid
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Author : Arturo M. Baró
language : en
Publisher: John Wiley & Sons
Release Date : 2012-05-14
Atomic Force Microscopy In Liquid written by Arturo M. Baró and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-05-14 with Science categories.
About 40 % of current atomic force microscopy (AFM) research is performed in liquids, making liquid-based AFM a rapidly growing and important tool for the study of biological materials. This book focuses on the underlying principles and experimental aspects of AFM under liquid, with an easy-to-follow organization intended for new AFM scientists. The book also serves as an up-to-date review of new AFM techniques developed especially for biological samples. Aimed at physicists, materials scientists, biologists, analytical chemists, and medicinal chemists. An ideal reference book for libraries. From the contents: Part I: General Atomic Force Microscopy * AFM: Basic Concepts * Carbon Nanotube Tips in Atomic Force Microscopy with * Applications to Imaging in Liquid * Force Spectroscopy * Atomic Force Microscopy in Liquid * Fundamentals of AFM Cantilever Dynamics in Liquid * Environments * Single-Molecule Force Spectroscopy * High-Speed AFM for Observing Dynamic Processes in Liquid * Integration of AFM with Optical Microscopy Techniques Part II: Biological Applications * DNA and Protein-DNA Complexes * Single-Molecule Force Microscopy of Cellular Sensors * AFM-Based Single-Cell Force Spectroscopy * Nano-Surgical Manipulation of Living Cells with the AFM
Atomic Force Microscopy
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Author : Peter Eaton
language : en
Publisher: OUP Oxford
Release Date : 2010-03-25
Atomic Force Microscopy written by Peter Eaton and has been published by OUP Oxford this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-03-25 with Science categories.
Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction, and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry demonstrate the different capabilities of the technique.
Atomic Force Microscopy
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Author : Wesley C. Sanders
language : en
Publisher: CRC Press
Release Date : 2019-10-08
Atomic Force Microscopy written by Wesley C. Sanders and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-10-08 with Technology & Engineering categories.
This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester-long introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear in each chapter in an effort to provide additional information and points of interest. This book includes suggested laboratory investigations that provide opportunities to explore the versatility of the atomic force microscope. These laboratory exercises include opportunities for experimenters to explore force curves, surface roughness, friction loops, conductivity imaging, and phase imaging.
Scanning Probe Microscopy For Energy Research
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Author : Dawn A. Bonnell
language : en
Publisher: World Scientific
Release Date : 2013
Scanning Probe Microscopy For Energy Research written by Dawn A. Bonnell and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with Technology & Engineering categories.
Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.
The Physics Of Semiconductors
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Author : Marius Grundmann
language : en
Publisher: Springer
Release Date : 2022-03-21
The Physics Of Semiconductors written by Marius Grundmann and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-03-21 with Technology & Engineering categories.
The 4th edition of this highly successful textbook features copious material for a complete upper-level undergraduate or graduate course, guiding readers to the point where they can choose a specialized topic and begin supervised research. The textbook provides an integrated approach beginning from the essential principles of solid-state and semiconductor physics to their use in various classic and modern semiconductor devices for applications in electronics and photonics. The text highlights many practical aspects of semiconductors: alloys, strain, heterostructures, nanostructures, amorphous semiconductors, and noise, which are essential aspects of modern semiconductor research but often omitted in other textbooks. This textbook also covers advanced topics, such as Bragg mirrors, resonators, polarized and magnetic semiconductors, nanowires, quantum dots, multi-junction solar cells, thin film transistors, and transparent conductive oxides. The 4th edition includes many updates and chapters on 2D materials and aspects of topology. The text derives explicit formulas for many results to facilitate a better understanding of the topics. Having evolved from a highly regarded two-semester course on the topic, The Physics of Semiconductors requires little or no prior knowledge of solid-state physics. More than 2100 references guide the reader to historic and current literature including original papers, review articles and topical books, providing a go-to point of reference for experienced researchers as well.
Recent Developments In Atomic Force Microscopy And Raman Spectroscopy For Materials Characterization
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Author : Chandra Shakher Pathak
language : en
Publisher: BoD – Books on Demand
Release Date : 2022-01-07
Recent Developments In Atomic Force Microscopy And Raman Spectroscopy For Materials Characterization written by Chandra Shakher Pathak and has been published by BoD – Books on Demand this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-01-07 with Science categories.
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.