Scanning Probe Microscopy For Energy Research
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Scanning Probe Microscopy For Energy Research
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Author : Dawn A. Bonnell
language : en
Publisher: World Scientific
Release Date : 2013
Scanning Probe Microscopy For Energy Research written by Dawn A. Bonnell and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with Technology & Engineering categories.
Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.
Atomic Force Microscopy For Energy Research
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Author : Cai Shen
language : en
Publisher: CRC Press
Release Date : 2022-04-26
Atomic Force Microscopy For Energy Research written by Cai Shen and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-04-26 with Science categories.
Details the use of advanced AFMs and addresses all types of functional AFMs First book to focus on application of AFM for energy research Enables readers to operate an AFM successfully and to understand the data obtained Covers new achievements in AFM instruments, including higher speed and resolution, automatic and deep learning AFM, and how AFM is being combined with other new methods like IR and Raman microscopy
Impact Of Electron And Scanning Probe Microscopy On Materials Research
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Author : David G. Rickerby
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Impact Of Electron And Scanning Probe Microscopy On Materials Research written by David G. Rickerby and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.
Scanning Probe Microscopy
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Author : Adam Foster
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-10-14
Scanning Probe Microscopy written by Adam Foster and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-10-14 with Technology & Engineering categories.
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.
Scanning Probe Microscopy
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language : en
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Scanning Probe Microscopy written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on with categories.
Scanning Probe Microscopy Characterization Nanofabrication And Device Application Of Functional Materials
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Author : Paula M. Vilarinho
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-06-15
Scanning Probe Microscopy Characterization Nanofabrication And Device Application Of Functional Materials written by Paula M. Vilarinho and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-06-15 with Science categories.
As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
Scanning Probe Microscopy In Nanoscience And Nanotechnology 2
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-12-17
Scanning Probe Microscopy In Nanoscience And Nanotechnology 2 written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-12-17 with Technology & Engineering categories.
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Scanning Probe Microscopy And Spectroscopy
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Author : Roland Wiesendanger
language : en
Publisher: Cambridge University Press
Release Date : 1994-09-29
Scanning Probe Microscopy And Spectroscopy written by Roland Wiesendanger and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994-09-29 with Science categories.
The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.
Scanning Probe Microscopy In Nanoscience And Nanotechnology 3
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-10-24
Scanning Probe Microscopy In Nanoscience And Nanotechnology 3 written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-24 with Science categories.
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Scanning Probe Microscopy
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Author : Nikodem Tomczak
language : en
Publisher: World Scientific
Release Date : 2011
Scanning Probe Microscopy written by Nikodem Tomczak and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011 with Science categories.
Scanning Probe Microscopy (SPM) is the enabling tool for nano(bio)technology, which has opened new vistas in many interdisciplinary research areas. Concomitant with the developments in SPM instrumentation and techniques are new and previously unthought-of opportunities in materials nanofabrication and characterisation. In particular, the developments in addressing and manipulating matter at the level of single atoms or molecules, and studies of biological materials (e.g. live cells, or cell membranes) result in new and exciting discoveries. The rising importance of SPM demands a concise treatment in the form of a book which is accessible to interdisciplinary practitioners. This book highlights recent advances in the field of SPM with sufficient depth and breadth to provide an intellectually stimulating overview of the current state of the art. The book is based on a set of carefully selected original works from renowned contributors on topics that range from atom technology, scanning tunneling spectroscopy of self-assembled nanostructures, SPM probe fabrication, scanning force microscopy applications in biology and materials science down to the single molecule level, novel scanning probe techniques, and nanolithography. The variety of topics underlines the strong interdisciplinary character of SPM related research and the combined expertise of the contributors gives us a unique opportunity to discuss possible future trends in SPM related research. This makes the book not merely a collection of already published material but an enlightening insight into cutting edge research and global SPM research trends.