Defect And Impurity Engineered Semiconductors Ii Volume 510
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Defect And Impurity Engineered Semiconductors Ii Volume 510
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Author : S. Ashok
language : en
Publisher: Cambridge University Press
Release Date : 1998-09-14
Defect And Impurity Engineered Semiconductors Ii Volume 510 written by S. Ashok and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-09-14 with Technology & Engineering categories.
The evolution of semiconductor devices of progressively higher performance has generally followed improved material quality with ever fewer defect concentrations. However, a shift in focus over the years has brought the realization that complete elimination of defects in semiconductors during growth and processing is neither desirable nor necessary. It is expected that the future role of defects in semiconductors will be one of control - in density, properties, spatial location, and perhaps even temporal variation during the operating lifetime of the device. This book explores the effective use of defect control at various facets of technology and widely different semiconductor materials systems. Topics include: grown-in defects in bulk crystals; doping issues; grown-in defects in thin films; doping and defect issues in wide-gap semiconductors; process-induced defects and gettering; defect properties, reactions, activation and passivation; ion implantation and irradiation effects; defects in devices and interfaces; plasma processing; defect characterization; and interfaces, quantum wells and superlattices.
Defect And Impurity Engineered Semiconductors And Devices
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Author :
language : en
Publisher:
Release Date : 1998
Defect And Impurity Engineered Semiconductors And Devices written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with Semiconductors categories.
Materials Reliability In Microelectronics Viii
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Author : John C. Bravman
language : en
Publisher:
Release Date : 1998
Materials Reliability In Microelectronics Viii written by John C. Bravman and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998 with Electrodiffusion categories.
High Purity Silicon Vi
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Author : Cor L. Claeys
language : en
Publisher: The Electrochemical Society
Release Date : 2000
High Purity Silicon Vi written by Cor L. Claeys and has been published by The Electrochemical Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with Science categories.
"... papers that were presented at the Sixth Symposium on High Purity Silicon held in Phoenix, Arizona at the 198th Meeting of the Electrochemical Society, October 22-27, 2000."--Preface.
Semiconductor Silicon 2002
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Author : Howard R. Huff
language : en
Publisher: The Electrochemical Society
Release Date : 2002
Semiconductor Silicon 2002 written by Howard R. Huff and has been published by The Electrochemical Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002 with Science categories.
Proceedings Of The Fifth International Symposium Of Process Physics And Modeling In Semiconductor Technology
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Author : C. S. Murthy
language : en
Publisher: The Electrochemical Society
Release Date : 1999
Proceedings Of The Fifth International Symposium Of Process Physics And Modeling In Semiconductor Technology written by C. S. Murthy and has been published by The Electrochemical Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with Science categories.
Ulsi Process Integration
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Author : Cor L. Claeys
language : en
Publisher: The Electrochemical Society
Release Date : 1999
Ulsi Process Integration written by Cor L. Claeys and has been published by The Electrochemical Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with Computers categories.
High Purity Silicon Vi
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Author : Electrochemical Society. Meeting
language : en
Publisher: The Electrochemical Society
Release Date : 2000
High Purity Silicon Vi written by Electrochemical Society. Meeting and has been published by The Electrochemical Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with Science categories.
"... papers that were presented at the Sixth Symposium on High Purity Silicon held in Phoenix, Arizona at the 198th Meeting of the Electrochemical Society, October 22-27, 2000."--Preface.
Scientific Basis For Nuclear Waste Management Xxii Volume 556
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Author : David J. Wronkiewicz
language : en
Publisher:
Release Date : 1999-11-24
Scientific Basis For Nuclear Waste Management Xxii Volume 556 written by David J. Wronkiewicz and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999-11-24 with Technology & Engineering categories.
Safe and effective management of nuclear waste provides a broad range of challenges for materials science. Waste processing, waste form and engineered barrier properties, interactions between engineered and geological systems, radiation effects, chemistry and transport of waste species, and long-term predictions of repository performance are just some of the scientific problems facing modern society. This book, the 22nd in a very successful series from MRS, offers an international and inter-disciplinary perspective on the issues, and features developments in both fundamental and applied areas. Topics include: development and characterization of ceramic waste forms; ceramic waste form corrosion; glass waste form processing; glass formulation, properties and structure; glass waste form corrosion; spent nuclear fuel; performance assessment; repository backfill; flow and transport; natural analogues; container corrosion; metal waste form corrosion; radionuclide speciation and solubility; radionuclide sorption; microbial effects; radiation effects; cement waste forms and waste treatment.
Analytical And Diagnostic Techniques For Semiconductor Materials Devices And Processes
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Author : Bernd O. Kolbesen
language : en
Publisher: The Electrochemical Society
Release Date : 2003
Analytical And Diagnostic Techniques For Semiconductor Materials Devices And Processes written by Bernd O. Kolbesen and has been published by The Electrochemical Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003 with Technology & Engineering categories.
.".. ALTECH 2003 was Symposium J1 held at the 203rd Meeting of the Electrochemical Society in Paris, France from April 27 to May 2, 2003 ... Symposium M1, Diagnostic Techniques for Semiconductor Materials and Devices, was part of the 202nd Meeting of the Electrochemical Society held in Salt Lake City, Utah, from October 21 to 25, 2002 ..."--p. iii.