Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits
DOWNLOAD
Download Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits PDF/ePub or read online books in Mobi eBooks. Click Download or Read Online button to get Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits book now. This website allows unlimited access to, at the time of writing, more than 1.5 million titles, including hundreds of thousands of titles in various foreign languages. If the content not found or just blank you must refresh this page
Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits
DOWNLOAD
Author : Manoj Sachdev
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-06-04
Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits written by Manoj Sachdev and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-06-04 with Technology & Engineering categories.
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits
DOWNLOAD
Author : Manoj Sachdev
language : en
Publisher: Springer
Release Date : 2008-11-01
Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits written by Manoj Sachdev and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-11-01 with Technology & Engineering categories.
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
Cmos Sram Circuit Design And Parametric Test In Nano Scaled Technologies
DOWNLOAD
Author : Andrei Pavlov
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-06-01
Cmos Sram Circuit Design And Parametric Test In Nano Scaled Technologies written by Andrei Pavlov and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-06-01 with Technology & Engineering categories.
The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.
Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits 2nd Ed
DOWNLOAD
Author : Sachdev
language : en
Publisher:
Release Date : 2009-10-01
Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits 2nd Ed written by Sachdev and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-10-01 with categories.
Lecture Notes In Analog Electronics
DOWNLOAD
Author : Vančo B. Litovski
language : en
Publisher: Springer Nature
Release Date : 2025-01-17
Lecture Notes In Analog Electronics written by Vančo B. Litovski and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-01-17 with Technology & Engineering categories.
Prof. Vančo Litovski was born in 1947 in Rakita, South Macedonia, Greece. He graduated from the Faculty of Electronic Engineering in Niš in 1970 and obtained his M.Sc. in 1974 and his Ph.D. in 1977. He was appointed as a teaching assistant at the Faculty of Electronic Engineering in 1970 and became a full professor at the same faculty in 1987. He was elected as a visiting professor (honoris causa) at the University of Southampton in 1999. From 1987 until 1990, he was a consultant to the CEO of Ei and was the head of the Chair of Electronics at the Faculty of Electronic Engineering in Niš for 12 years. From 2015 to 2017, he was a researcher at the University of Bath.. He received several awards including from the Faculty of Electronic Engineering (Charter in 1980, Charter in 1985, and a Special Recognition in 1995) and the University of Niš (Plaque 1985).
9th International Conference On Robotic Vision Signal Processing And Power Applications
DOWNLOAD
Author : Haidi Ibrahim
language : en
Publisher: Springer
Release Date : 2016-09-29
9th International Conference On Robotic Vision Signal Processing And Power Applications written by Haidi Ibrahim and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-09-29 with Technology & Engineering categories.
The proceeding is a collection of research papers presented, at the 9th International Conference on Robotics, Vision, Signal Processing & Power Applications (ROVISP 2016), by researchers, scientists, engineers, academicians as well as industrial professionals from all around the globe to present their research results and development activities for oral or poster presentations. The topics of interest are as follows but are not limited to: • Robotics, Control, Mechatronics and Automation • Vision, Image, and Signal Processing • Artificial Intelligence and Computer Applications • Electronic Design and Applications • Telecommunication Systems and Applications • Power System and Industrial Applications • Engineering Education
Emerging Nanotechnologies
DOWNLOAD
Author : Mohammad Tehranipoor
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-12-08
Emerging Nanotechnologies written by Mohammad Tehranipoor and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-12-08 with Technology & Engineering categories.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
Machine Learning Paradigms
DOWNLOAD
Author : George A. Tsihrintzis
language : en
Publisher: Springer
Release Date : 2019-07-06
Machine Learning Paradigms written by George A. Tsihrintzis and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-07-06 with Computers categories.
This book is the inaugural volume in the new Springer series on Learning and Analytics in Intelligent Systems. The series aims at providing, in hard-copy and soft-copy form, books on all aspects of learning, analytics, advanced intelligent systems and related technologies. These disciplines are strongly related and mutually complementary; accordingly, the new series encourages an integrated approach to themes and topics in these disciplines, which will result in significant cross-fertilization, research advances and new knowledge creation. To maximize the dissemination of research findings, the series will publish edited books, monographs, handbooks, textbooks and conference proceedings. This book is intended for professors, researchers, scientists, engineers and students. An extensive list of references at the end of each chapter allows readers to probe further into those application areas that interest them most.
Machine Learning Algorithms Using Scikit And Tensorflow Environments
DOWNLOAD
Author : Baby Maruthi, Puvvadi
language : en
Publisher: IGI Global
Release Date : 2023-12-18
Machine Learning Algorithms Using Scikit And Tensorflow Environments written by Baby Maruthi, Puvvadi and has been published by IGI Global this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-12-18 with Computers categories.
Machine learning is able to solve real-time problems. It has several algorithms such as classification, clustering, and more. To learn these essential algorithms, we require tools like Scikit and TensorFlow. Machine Learning Algorithms Using Scikit and TensorFlow Environments assists researchers in learning and implementing these critical algorithms. Covering key topics such as classification, artificial neural networks, prediction, random forest, and regression analysis, this premier reference source is ideal for industry professionals, computer scientists, researchers, academicians, scholars, practitioners, instructors, and students.
Integrated Circuit Test Engineering
DOWNLOAD
Author : Ian A. Grout
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-12-08
Integrated Circuit Test Engineering written by Ian A. Grout and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-12-08 with Technology & Engineering categories.
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively