Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits 2nd Ed
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Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits
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Author : Manoj Sachdev
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-06-04
Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits written by Manoj Sachdev and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-06-04 with Technology & Engineering categories.
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits 2nd Ed
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Author : Sachdev
language : en
Publisher:
Release Date : 2009-10-01
Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits 2nd Ed written by Sachdev and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-10-01 with categories.
Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits
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Author : Manoj Sachdev
language : en
Publisher: Springer
Release Date : 2008-11-01
Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits written by Manoj Sachdev and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-11-01 with Technology & Engineering categories.
The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
Emerging Nanotechnologies
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Author : Mohammad Tehranipoor
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-12-08
Emerging Nanotechnologies written by Mohammad Tehranipoor and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-12-08 with Technology & Engineering categories.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
Cmos Electronics
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Author : Jaume Segura
language : en
Publisher: John Wiley & Sons
Release Date : 2004-03-26
Cmos Electronics written by Jaume Segura and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-03-26 with Technology & Engineering categories.
CMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the financial as well as the engineering bottom line. This book educates readers, including non-engineers involved in CMOS manufacture, to identify and remedy these causes. This book instills the electronic knowledge that affects not just design but other important areas of manufacturing such as test, reliability, failure analysis, yield-quality issues, and problems. Designed specifically for the many non-electronic engineers employed in the semiconductor industry who need to reliably manufacture chips at a high rate in large quantities, this is a practical guide to how CMOS electronics work, how failures occur, and how to diagnose and avoid them. Key features: Builds a grasp of the basic electronics of CMOS integrated circuits and then leads the reader further to understand the mechanisms of failure. Unique descriptions of circuit failure mechanisms, some found previously only in research papers and others new to this publication. Targeted to the CMOS industry (or students headed there) and not a generic introduction to the broader field of electronics. Examples, exercises, and problems are provided to support the self-instruction of the reader.
Counterfeit Integrated Circuits
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Author : Mark (Mohammad) Tehranipoor
language : en
Publisher: Springer
Release Date : 2015-02-12
Counterfeit Integrated Circuits written by Mark (Mohammad) Tehranipoor and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-02-12 with Technology & Engineering categories.
This timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade. The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs). Not only does this book provide an assessment of the current counterfeiting problems facing both the public and private sectors, it also offers practical, real-world solutions for combatting this substantial threat. · Helps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem; · Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation; · Provides step-by-step solutions for detecting different types of counterfeit ICs; · Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government.
Low Power Cmos Circuits
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Author : Christian Piguet
language : en
Publisher: CRC Press
Release Date : 2018-10-03
Low Power Cmos Circuits written by Christian Piguet and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-10-03 with Technology & Engineering categories.
The power consumption of microprocessors is one of the most important challenges of high-performance chips and portable devices. In chapters drawn from Piguet's recently published Low-Power Electronics Design, Low-Power CMOS Circuits: Technology, Logic Design, and CAD Tools addresses the design of low-power circuitry in deep submicron technologies. It provides a focused reference for specialists involved in designing low-power circuitry, from transistors to logic gates. The book is organized into three broad sections for convenient access. The first examines the history of low-power electronics along with a look at emerging and possible future technologies. It also considers other technologies, such as nanotechnologies and optical chips, that may be useful in designing integrated circuits. The second part explains the techniques used to reduce power consumption at low levels. These include clock gating, leakage reduction, interconnecting and communication on chips, and adiabatic circuits. The final section discusses various CAD tools for designing low-power circuits. This section includes three chapters that demonstrate the tools and low-power design issues at three major companies that produce logic synthesizers. Providing detailed examinations contributed by leading experts, Low-Power CMOS Circuits: Technology, Logic Design, and CAD Tools supplies authoritative information on how to design and model for high performance with low power consumption in modern integrated circuits. It is a must-read for anyone designing modern computers or embedded systems.
System On Chip Test Architectures
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Author : Laung-Terng Wang
language : en
Publisher: Morgan Kaufmann
Release Date : 2010-07-28
System On Chip Test Architectures written by Laung-Terng Wang and has been published by Morgan Kaufmann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-07-28 with Technology & Engineering categories.
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
Cmos Logic Circuit Design
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Author : John P. Uyemura
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-05-08
Cmos Logic Circuit Design written by John P. Uyemura and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-05-08 with Technology & Engineering categories.
This is an up-to-date treatment of the analysis and design of CMOS integrated digital logic circuits. The self-contained book covers all of the important digital circuit design styles found in modern CMOS chips, emphasizing solving design problems using the various logic styles available in CMOS.
Vlsi Design
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Author : Debaprasad Das
language : en
Publisher:
Release Date : 2016-01-15
Vlsi Design written by Debaprasad Das and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-01-15 with Electronic circuit design categories.
Beginning with an introduction to VLSI systems and basic concepts of MOS transistors, this second edition of the book then proceeds to describe the various concepts of VLSI, such as the structure and operation of MOS transistors and inverters, standard cell library design and itscharacterization, analog and digital CMOS logic design, semiconductor memories, and BiCMOS technology and circuits. It then provides an exhaustive step-wise discussion of the various stages involved in designing a VLSI chip (which includes logic synthesis, timing analysis, floor planning, placementand routing, verification, and testing). In addition, the book includes chapters on FPGA architecture, VLSI process technology, subsystem design, and low power logic circuits.