Design Analysis And Test Of Logic Circuits Under Uncertainty
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Design Analysis And Test Of Logic Circuits Under Uncertainty
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Author : Smita Krishnaswamy
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-09-21
Design Analysis And Test Of Logic Circuits Under Uncertainty written by Smita Krishnaswamy and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-09-21 with Technology & Engineering categories.
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
Advanced Techniques In Logic Synthesis Optimizations And Applications
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Author : Kanupriya Gulati
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-11-25
Advanced Techniques In Logic Synthesis Optimizations And Applications written by Kanupriya Gulati and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-11-25 with Technology & Engineering categories.
This book covers recent advances in the field of logic synthesis and design, including Boolean Matching, Logic Decomposition, Boolean satisfiability, Advanced Synthesis Techniques and Applications of Logic Design. All of these topics are valuable to CAD engineers working in Logic Design, Logic Optimization, and Verification. Engineers seeking opportunities for optimizing VLSI integrated circuits will find this book as an invaluable reference, since there is no existing book that covers this material in a systematic fashion.
Analysis And Design Of Resilient Vlsi Circuits
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Author : Rajesh Garg
language : en
Publisher: Springer Science & Business Media
Release Date : 2009-10-22
Analysis And Design Of Resilient Vlsi Circuits written by Rajesh Garg and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-10-22 with Technology & Engineering categories.
This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era. With continuouslydecreasing device feature sizes, combinedwith lower supply voltages and higher operating frequencies, the noise immunity of VLSI circuits is decreasing alarmingly. Thus, VLSI circuits are becoming more vulnerable to noise effects such as crosstalk, power supply variations, and radiation-inducedsoft errors. Among these noise sources, soft errors(or error caused by radiation particle strikes) have become an increasingly troublesome issue for memory arrays as well as c- binational logic circuits. Also, in the DSM era, process variations are increasing at a signi?cant rate, making it more dif?cult to design reliable VLSI circuits. Hence, it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.
Computational Intelligence Research Frontiers
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Author : Jacek M. Zurada
language : en
Publisher: Springer
Release Date : 2008-05-30
Computational Intelligence Research Frontiers written by Jacek M. Zurada and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-05-30 with Computers categories.
The 2008 IEEE World Congress on Computational Intelligence (WCCI 2008), held during June 1–6, 2008 in Hong Kong, China, marked an important milestone in advancing the paradigms of the new fields of computational intelligence. As the fifth event in the series that has spanned the globe (Orlando-1994, Anchorage-1998, Honolulu-2002, Vancouver-2006), the congress offered renewed and refreshing focus on the progress in nature-inspired and linguistically motivated computation. Most of the congress’s program featured regular and special technical sessions that provided participants with new insights into the most recent developments in the field. As a tradition, in addition to the parallel technical sessions, WCCI holds a series of plenary and invited lectures which are not included in the congress proceedings. As its predecessors, at WCCI 2008, 20 expert speakers shared their expertise on broader, if not panoramic, topics spanning a diverse spectrum of computational intelligence in the areas of neurocomputing, fuzzy systems, evolutionary computation, and adjacent areas. Thanks to their time and expertise, we endeavored to offer this volume to attendees directly at the congress and the general public afterwards.
18th Ieee Vlsi Test Symposium
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Author :
language : en
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
Release Date : 2000
18th Ieee Vlsi Test Symposium written by and has been published by Institute of Electrical & Electronics Engineers(IEEE) this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000 with Computers categories.
Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift issues, test compaction and design validation, analog BIST, and functional test and verification issues. Also covered are STIL extension, IDDQ test, and on-line testing and fault tolerance. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
Scientific And Technical Aerospace Reports
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Author :
language : en
Publisher:
Release Date : 1995
Scientific And Technical Aerospace Reports written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Aeronautics categories.
Reliability Abstracts And Technical Reviews
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Author :
language : en
Publisher:
Release Date : 1966
Reliability Abstracts And Technical Reviews written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1966 with Reliability (Engineering) categories.
Testing For Small Delay Defects In Nanoscale Cmos Integrated Circuits
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Author : Sandeep K. Goel
language : en
Publisher: CRC Press
Release Date : 2017-12-19
Testing For Small Delay Defects In Nanoscale Cmos Integrated Circuits written by Sandeep K. Goel and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-19 with Technology & Engineering categories.
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause immediate timing failures on both critical and non-critical paths in the circuit. Overviews semiconductor industry test challenges and the need for SDD testing, including basic concepts and introductory material Describes algorithmic solutions incorporated in commercial tools from Mentor Graphics Reviews SDD testing based on "alternative methods" that explores new metrics, top-off ATPG, and circuit topology-based solutions Highlights the advantages and disadvantages of a diverse set of metrics, and identifies scope for improvement Written from the triple viewpoint of university researchers, EDA tool developers, and chip designers and tool users, this book is the first of its kind to address all aspects of SDD testing from such a diverse perspective. The book is designed as a one-stop reference for current industrial practices, research challenges in the domain of SDD testing, and recent developments in SDD solutions.
Automation
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Author :
language : en
Publisher:
Release Date : 1969
Automation written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1969 with Automation categories.
Designer S Guide To Testable Asic Devices
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Author : Wayne M. Needham
language : en
Publisher: Springer Science & Business Media
Release Date : 1991-01-10
Designer S Guide To Testable Asic Devices written by Wayne M. Needham and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991-01-10 with Computers categories.
While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact of ASIC testability on total system cost and performance, and reviews the commercial test systems that are currently available. Annotation copyrighted by Book News, Inc., Portland, OR