Digital Logic Testing And Simulation
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Digital Logic Testing And Simulation
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Author : Alexander Miczo
language : en
Publisher: John Wiley & Sons
Release Date : 2003-10-24
Digital Logic Testing And Simulation written by Alexander Miczo and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-10-24 with Technology & Engineering categories.
Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
Digital Logic Testing And Simulation
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Author : Alexander Miczo
language : en
Publisher: Wiley
Release Date : 1985-12
Digital Logic Testing And Simulation written by Alexander Miczo and has been published by Wiley this book supported file pdf, txt, epub, kindle and other format this book has been release on 1985-12 with categories.
The new standard in the field, presenting the latest design and testing methods for logic circuits, and the development of a BASIC-based simulation. Offers designers and test engineers unique coverage of circuit design for testability, stressing the incorporation of hardware into designs that facilitate testing and diagnosis by allowing greater access to internal circuits. Examines various ways of representing a design, as well as external testing methods that apply this information.
Solutions Manual To Accompany Digital Logic Testing And Simulation
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Author : Alexander Miczo
language : en
Publisher:
Release Date : 1986
Solutions Manual To Accompany Digital Logic Testing And Simulation written by Alexander Miczo and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with Digital electronics categories.
Testing Of Digital Systems
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Author : N. K. Jha
language : en
Publisher: Cambridge University Press
Release Date : 2003-05-08
Testing Of Digital Systems written by N. K. Jha and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-05-08 with Computers categories.
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Practical Digital Logic Design And Testing
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Author : Parag K. Lala
language : en
Publisher:
Release Date : 1996
Practical Digital Logic Design And Testing written by Parag K. Lala and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with Computers categories.
This text presents the essentials of modern logic design. The author conveys key concepts in a clear, informal manner, demonstrating theory through numerous examples to establish a theoretical basis for practical applications. All major topics, including PLD-based digital design, are covered, and detailed coverage of digital logic circuit testing methods critical to successful chip manufacturing, are included. The industry standard PLD programming language ABEL is fully integrated where appropriate. The work also includes coverage of test generation techniques and design methods for testability, a complete discussion of PLD (Programmable Logic Device) based digital design, and coverage of state assignment and minimization explained using computer aided techniques.
Design Analysis And Test Of Logic Circuits Under Uncertainty
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Author : Smita Krishnaswamy
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-09-21
Design Analysis And Test Of Logic Circuits Under Uncertainty written by Smita Krishnaswamy and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-09-21 with Technology & Engineering categories.
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
Simulation In The Design Of Digital Electronic Systems
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Author : John B. Gosling
language : en
Publisher: Cambridge University Press
Release Date : 1993-10-29
Simulation In The Design Of Digital Electronic Systems written by John B. Gosling and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1993-10-29 with Computers categories.
This description of the structure of simulators suitable for use in the design of digital electronic systems includes the compiled code and event driven algorithms for digital electronic system simulators, together with timing verification as well as structural limitations and problems.
Digital Circuit Testing
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Author : Francis C. Wang
language : en
Publisher: Academic Press
Release Date : 1991-07-28
Digital Circuit Testing written by Francis C. Wang and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991-07-28 with Technology & Engineering categories.
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Digital System Test And Testable Design
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Author : Zainalabedin Navabi
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-12-10
Digital System Test And Testable Design written by Zainalabedin Navabi and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-12-10 with Technology & Engineering categories.
This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.
An Introduction To Logic Circuit Testing
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Author : Parag K. Lala
language : en
Publisher: Morgan & Claypool Publishers
Release Date : 2008-11-08
An Introduction To Logic Circuit Testing written by Parag K. Lala and has been published by Morgan & Claypool Publishers this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-11-08 with Technology & Engineering categories.
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References