Electron Backscatter Diffraction In Materials Science
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Electron Backscatter Diffraction In Materials Science
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Author : Adam J. Schwartz
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-03-11
Electron Backscatter Diffraction In Materials Science written by Adam J. Schwartz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-03-11 with Technology & Engineering categories.
Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributions, lattice strain, phase identification, and much more. The purpose of this book is to provide the fundamental basis for electron backscatter diffraction in materials science, the current state of both hardware and software, and illustrative examples of the applications of electron backscatter diffraction to a wide-range of materials including undeformed and deformed metals and alloys, ceramics, and superconductors. The text has been substantially revised from the first edition, and the authors have kept the format as close as possible to the first edition text. The new developments covered in this book include a more comphrensive coverage of the fundamentals not covered in the first edition or other books in the field, the advances in hardware and software since the first edition was published, and current examples of application of electron backscatter diffraction to solve challenging problems in materials science and condensed-matter physics.
Electron Backscatter Diffraction In Materials Science
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Author : Adam J. Schwartz
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-06-29
Electron Backscatter Diffraction In Materials Science written by Adam J. Schwartz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-06-29 with Technology & Engineering categories.
Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).
Introduction To Texture Analysis
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Author : Olaf Engler
language : en
Publisher: CRC Press
Release Date : 2009-11-16
Introduction To Texture Analysis written by Olaf Engler and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-11-16 with Science categories.
The first edition of Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping broke new ground by collating seventy years worth of research in a convenient single-source format. Reflecting emerging methods and the evolution of the field, the second edition continues to provide comprehensive coverage of the concepts, pra
Electron Backscatter Diffraction Materials Science
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Author : Adam J. Schwartz
language : en
Publisher:
Release Date : 1968
Electron Backscatter Diffraction Materials Science written by Adam J. Schwartz and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1968 with Crystallography categories.
Scanning Microscopy For Nanotechnology
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Author : Weilie Zhou
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-03-09
Scanning Microscopy For Nanotechnology written by Weilie Zhou and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-03-09 with Technology & Engineering categories.
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
Scanning Electron Microscopy And X Ray Microanalysis
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Author : Joseph Goldstein
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-11
Scanning Electron Microscopy And X Ray Microanalysis written by Joseph Goldstein and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-11 with Science categories.
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Electron Crystallography
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Author : Xiaodong Zou
language : en
Publisher: Oxford University Press
Release Date : 2011-08-18
Electron Crystallography written by Xiaodong Zou and has been published by Oxford University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-08-18 with Science categories.
In the modern world of ever smaller devices and nanotechnology, electron crystallography emerges as the most important method capable of determining the structure of minute objects down to the size of individual atoms. Crystals of only a few millionths of a millimetre are studied. This is the first textbook explaining how this is done. Great attention is given to symmetry in crystals and how it manifests itself in electron microscopy and electron diffraction, and how this symmetry can be determined and taken advantage of in achieving improved electron microscopy images and solving crystal structures from electron diffraction patterns. Theory and practice are combined; experimental images, diffraction patterns, formulae and numerical data are discussed in parallel, giving the reader a complete understanding of what goes on inside the "black boxes" of computer programs. This up-to-date textbook contains the newest techniques in electron crystallography, including detailed descriptions and explanations of the recent remarkable successes in determining the very complex structures of zeolites and intermetallics. The controversial issue of whether there is phase information present in electron micrsocopy images or not is also resolved once and for all. The extensive appendices include computer labs which have been used at various courses at Stockholm University and international schools in electron crystallography, with applications to the textbook. Students can download image processing programs and follow these lab instructions to get a hands-on experience of electron crystallography.
Light Scattering And Nanoscale Surface Roughness
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Author : Alexei A. Maradudin
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-05-10
Light Scattering And Nanoscale Surface Roughness written by Alexei A. Maradudin and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-05-10 with Science categories.
All real surfaces, both those occurring naturally, and those fabricated artificially and with great care, are rough to some degree. It is therefore of interest, and often of importance, to know the extent to which this roughness affects physical p- cesses occurring at a surface. A particularly interesting class of physical processes occurring at a rough surface is the scattering of electromagnetic waves from it, or their transmission through it. In this case the degree of the surface roughness is referred to the wavelength of the waves incident on it. The study of the scattering of electromagnetic waves from rough surfaces has been actively carried out for more than a century now, since Rayleigh's inves- gations of the scattering of a monochromatic plane wave incident normally on a 1 sinusoidal interface between two different media. The first theoretical treatment of the scattering of an electromagnetic wave from a randomly rough surface was due to Mandel'shtam/ in the context of the scattering of light from a liquid s- face. In these pioneering studies the angular dependence of the intensity of the scattered field was calculated by perturbation theory as an expansion in powers of the surface profile function though the first nonzero term, a single scattering approximation.
Diffraction Analysis Of The Microstructure Of Materials
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Author : Eric J. Mittemeijer
language : en
Publisher: Springer Science & Business Media
Release Date : 2003-11-26
Diffraction Analysis Of The Microstructure Of Materials written by Eric J. Mittemeijer and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-11-26 with Science categories.
Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Reflection High Energy Electron Diffraction
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Author : Ayahiko Ichimiya
language : en
Publisher: Cambridge University Press
Release Date : 2004-12-13
Reflection High Energy Electron Diffraction written by Ayahiko Ichimiya and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-12-13 with Science categories.
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