Electron Backscatter Diffraction Materials Science

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Electron Backscatter Diffraction In Materials Science

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Author : Adam J. Schwartz
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-06-29

Electron Backscatter Diffraction In Materials Science written by Adam J. Schwartz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-06-29 with Technology & Engineering categories.

Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).

Electron Backscatter Diffraction Materials Science

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Author : Adam J. Schwartz
language : en
Publisher:
Release Date : 1968

Electron Backscatter Diffraction Materials Science written by Adam J. Schwartz and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1968 with Crystallography categories.

Introduction To Texture Analysis

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Author : Olaf Engler
language : en
Publisher: CRC Press
Release Date : 2009-11-16

Introduction To Texture Analysis written by Olaf Engler and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-11-16 with Science categories.

The first edition of Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping broke new ground by collating seventy years worth of research in a convenient single-source format. Reflecting emerging methods and the evolution of the field, the second edition continues to provide comprehensive coverage of the concepts, pra

Scanning Electron Microscopy And X Ray Microanalysis

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Author : Joseph Goldstein
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-11

Scanning Electron Microscopy And X Ray Microanalysis written by Joseph Goldstein and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-11 with Science categories.

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

Field Emission Scanning Electron Microscopy

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Author : Nicolas Brodusch
language : en
Publisher: Springer
Release Date : 2017-09-25

Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-09-25 with Technology & Engineering categories.

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Diffraction Analysis Of The Microstructure Of Materials

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Author : Eric J. Mittemeijer
language : en
Publisher: Springer Science & Business Media
Release Date : 2003-11-26

Diffraction Analysis Of The Microstructure Of Materials written by Eric J. Mittemeijer and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-11-26 with Science categories.

Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.

Light Scattering And Nanoscale Surface Roughness

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Author : Alexei A. Maradudin
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-05-10

Light Scattering And Nanoscale Surface Roughness written by Alexei A. Maradudin and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-05-10 with Science categories.

All real surfaces, both those occurring naturally, and those fabricated artificially and with great care, are rough to some degree. It is therefore of interest, and often of importance, to know the extent to which this roughness affects physical p- cesses occurring at a surface. A particularly interesting class of physical processes occurring at a rough surface is the scattering of electromagnetic waves from it, or their transmission through it. In this case the degree of the surface roughness is referred to the wavelength of the waves incident on it. The study of the scattering of electromagnetic waves from rough surfaces has been actively carried out for more than a century now, since Rayleigh's inves- gations of the scattering of a monochromatic plane wave incident normally on a 1 sinusoidal interface between two different media. The first theoretical treatment of the scattering of an electromagnetic wave from a randomly rough surface was due to Mandel'shtam/ in the context of the scattering of light from a liquid s- face. In these pioneering studies the angular dependence of the intensity of the scattered field was calculated by perturbation theory as an expansion in powers of the surface profile function though the first nonzero term, a single scattering approximation.

Reflection High Energy Electron Diffraction

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Author : Ayahiko Ichimiya
language : en
Publisher: Cambridge University Press
Release Date : 2004-12-13

Reflection High Energy Electron Diffraction written by Ayahiko Ichimiya and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-12-13 with Science categories.

Publisher Description

Texture Analysis In Materials Science

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Author : H.-J. Bunge
language : en
Publisher: Elsevier
Release Date : 2013-09-03

Texture Analysis In Materials Science written by H.-J. Bunge and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-09-03 with Technology & Engineering categories.

Texture Analysis in Materials Science Mathematical Methods focuses on the methodologies, processes, techniques, and mathematical aids in the orientation distribution of crystallites. The manuscript first offers information on the orientation of individual crystallites and orientation distributions. Topics include properties and representations of rotations, orientation distance, and ambiguity of rotation as a consequence of crystal and specimen symmetry. The book also takes a look at expansion of orientation distribution functions in series of generalized spherical harmonics, fiber textures, and methods not based on the series expansion. The publication reviews special distribution functions, texture transformation, and system of programs for the texture analysis of sheets of cubic materials. The text also ponders on the estimation of errors, texture analysis, and physical properties of polycrystalline materials. Topics include comparison of experimental and recalculated pole figures; indetermination error for incomplete pole figures; and determination of the texture coefficients from anisotropie polycrystal properties. The manuscript is a dependable reference for readers interested in the use of mathematical aids in the orientation distribution of crystallites.

Microstructure Sensitive Design For Performance Optimization

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Author : Brent L. Adams
language : en
Publisher: Butterworth-Heinemann
Release Date : 2012-09-25

Microstructure Sensitive Design For Performance Optimization written by Brent L. Adams and has been published by Butterworth-Heinemann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-09-25 with Science categories.

The accelerating rate at which new materials are appearing, and transforming the engineering world, only serves to emphasize the vast potential for novel material structure and related performance. Microstructure Sensitive Design for Performance Optimization (MSDPO) embodies a new methodology for systematic design of material microstructure to meet the requirements of design in optimal ways. Intended for materials engineers and researchers in industry, government and academia as well as upper level undergraduate and graduate students studying material science and engineering, MSDPO provides a novel mathematical framework that facilitates a rigorous consideration of the material microstructure as a continuous design variable in the field of engineering design. Presents new methods and techniques for analysis and optimum design of materials at the microstructure level Authors' methodology introduces spectral approaches not available in previous texts, such as the incorporation of crystallographic orientation as a variable in the design of engineered components with targeted elastic properties Numerous illustrations and examples throughout the text help readers grasp the concepts