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Electron Microprobe Analysis


Electron Microprobe Analysis
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Practical Scanning Electron Microscopy


Practical Scanning Electron Microscopy
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Author : Joseph Goldstein
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Practical Scanning Electron Microscopy written by Joseph Goldstein and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.


In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.



Electron Microprobe Analysis


Electron Microprobe Analysis
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Author : S. J. B. Reed
language : en
Publisher: Cambridge University Press
Release Date : 1997-07-10

Electron Microprobe Analysis written by S. J. B. Reed and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-07-10 with Science categories.


This 1993 book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively updated version of the seminal first edition, published in 1975. The design and operation of the instrument, including the electron column and both wavelength- and energy-dispersive X-ray spectrometers, are covered in the first part of the book. Experimental procedures for qualitative and quantitative analysis, using both types of spectrometer, are then discussed. Matrix ('ZAF') corrections, as required for quantitative analysis, are treated in some detail from both theoretical and practical viewpoints. Special considerations applying to the analysis of 'light' elements (atomic number below 10) are covered in a separate chapter. The emphasis throughout is on a sound understanding of principles and the treatment is applicable equally to the electron microprobe in its 'classical' form and to scanning electron microscopes fitted with X-ray spectrometers.



Electron Microprobe Analysis And Scanning Electron Microscopy In Geology


Electron Microprobe Analysis And Scanning Electron Microscopy In Geology
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Author : S. J. B. Reed
language : en
Publisher: Cambridge University Press
Release Date : 2005-08-25

Electron Microprobe Analysis And Scanning Electron Microscopy In Geology written by S. J. B. Reed and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-08-25 with Science categories.


Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.



Electron Probe Quantitation


Electron Probe Quantitation
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Author : K.F.J. Heinrich
language : en
Publisher: Springer Science & Business Media
Release Date : 1991-06-30

Electron Probe Quantitation written by K.F.J. Heinrich and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991-06-30 with Science categories.


In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.



Quantitative Electron Microprobe Analysis


Quantitative Electron Microprobe Analysis
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Author : Roger Theisen
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-11

Quantitative Electron Microprobe Analysis written by Roger Theisen and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-11 with Technology & Engineering categories.




Quantitative Electron Probe Microanalysis


Quantitative Electron Probe Microanalysis
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Author : Victor D. Scott
language : en
Publisher: Prentice Hall
Release Date : 1995

Quantitative Electron Probe Microanalysis written by Victor D. Scott and has been published by Prentice Hall this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Analytical chemistry categories.


Examines practical and theoretical aspects of the techniques of electron-probe microanalysis, providing material both for practical microanalysts interested in problems and procedures and for researchers who require greater understanding of the principles and developments in correction models.



Electron Probe Microanalysis


Electron Probe Microanalysis
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Author : Karl Zierold
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-08

Electron Probe Microanalysis written by Karl Zierold and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-08 with Science categories.


The aim of electron probe microanalysis of biological systems is to identify, localize, and quantify elements, mass, and water in cells and tissues. The method is based on the idea that all electrons and photons emerging from an electron beam irradiated specimen contain information on its structure and composition. In particular, energy spectroscopy of X-rays and electrons after interaction of the electron beam with the specimen is used for this purpose. However, the application of this method in biology and medicine has to overcome three specific problems: 1. The principle constituent of most cell samples is water. Since liquid water is not compatible with vacuum conditions in the electron microscope, specimens have to be prepared without disturbing the other components, in parti cular diffusible ions (elements). 2. Electron probe microanaly sis provides physical data on either dry specimens or fully hydrated, frozen specimens. This data usually has to be con verted into quantitative data meaningful to the cell biologist or physiologist. 3. Cells and tissues are not static but dynamic systems. Thus, for example, microanalysis of physiolo gical processes requires sampling techniques which are adapted to address specific biological or medical questions. During recent years, remarkable progress has been made to overcome these problems. Cryopreparation, image analysis, and electron energy loss spectroscopy are key areas which have solved some problems and offer promise for future improvements.



Scanning Electron Microscopy And X Ray Microanalysis


Scanning Electron Microscopy And X Ray Microanalysis
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Author : Joseph Goldstein
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-11

Scanning Electron Microscopy And X Ray Microanalysis written by Joseph Goldstein and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-11 with Science categories.


This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.



Transmission Electron Microscopy Of Minerals And Rocks


Transmission Electron Microscopy Of Minerals And Rocks
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Author : Alex C. McLaren
language : en
Publisher: Cambridge University Press
Release Date : 1991-04-26

Transmission Electron Microscopy Of Minerals And Rocks written by Alex C. McLaren and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991-04-26 with Science categories.


An introduction to the principles of transmission electron microscopy, written specifically for geologists and mineralogists.