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Electron Microprobe Analysis And Scanning Electron Microscopy In Geology


Electron Microprobe Analysis And Scanning Electron Microscopy In Geology
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Electron Microprobe Analysis And Scanning Electron Microscopy In Geology


Electron Microprobe Analysis And Scanning Electron Microscopy In Geology
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Author : S. J. B. Reed
language : en
Publisher: Cambridge University Press
Release Date : 2005-08-25

Electron Microprobe Analysis And Scanning Electron Microscopy In Geology written by S. J. B. Reed and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-08-25 with Science categories.


Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.



Energy Dispersive Spectrometry Of Common Rock Forming Minerals


Energy Dispersive Spectrometry Of Common Rock Forming Minerals
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Author : Kenneth P. Severin
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-01-18

Energy Dispersive Spectrometry Of Common Rock Forming Minerals written by Kenneth P. Severin and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-01-18 with Science categories.


This book provides a very basic introduction to electron microscopy and energy dispersive spectrometry (EDS). It has the largest compiled collection of EDS spectra ever published and covers most common rock forming minerals. In addition, it provides a key to help the novice wade through the large number of spectra.



Criminal And Environmental Soil Forensics


Criminal And Environmental Soil Forensics
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Author : Karl Ritz
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-12-23

Criminal And Environmental Soil Forensics written by Karl Ritz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-12-23 with Law categories.


Soils have important roles to play in criminal and environmental forensic science. Since the initial concept of using soil in forensic investigations was mooted by Conan Doyle in his Sherlock Holmes stories prior to real-world applications, this branch of forensic science has become increasingly sophisticated and broad. New techniques in chemical, physical, biological, ecological and spatial analysis, coupled with informatics, are being applied to reducing areas of search by investigators, site identification, site comparison and measurement for the eventual use as evidence in court. Soils can provide intelligence, in assisting the determination of the provenance of samples from artifacts, victims or suspects, enabling their linkage to locations or other evidence. They also modulate change in surface or buried cadavers and hence affect the ability to estimate post-mortem or post-burial intervals, and locate clandestine graves. This interdisciplinary volume explores the conceptual and practical interplay of soil and geoforensics across the scientific, investigative and legal fields. Supported by reviews, case-studies from across the world, and reports of original research, it demonstrates the increasing convergence of a wide range of knowledge. It covers conceptual issues, evidence (from recovery to use in court), geoforensics, taphonomy, as well as leading-edge technologies. The application of the resultant soil forensics toolbox is leading to significant advances in improving crime detection, and environmental and national security.



Practical Scanning Electron Microscopy


Practical Scanning Electron Microscopy
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Author : Joseph Goldstein
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Practical Scanning Electron Microscopy written by Joseph Goldstein and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.


In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.



Backscattered Scanning Electron Microscopy And Image Analysis Of Sediments And Sedimentary Rocks


Backscattered Scanning Electron Microscopy And Image Analysis Of Sediments And Sedimentary Rocks
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Author : David Henry Krinsley
language : en
Publisher: Cambridge University Press
Release Date : 1998-07-13

Backscattered Scanning Electron Microscopy And Image Analysis Of Sediments And Sedimentary Rocks written by David Henry Krinsley and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-07-13 with Nature categories.


A concise summary that uses abundant images to illustrate the type of information backscattered scanning electron microscopy (BSE) yields. Lucidly written, this book will be ideal for researchers and graduate students.



Scanning Electron Microscopy And X Ray Microanalysis


Scanning Electron Microscopy And X Ray Microanalysis
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Author : Joseph Goldstein
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-11

Scanning Electron Microscopy And X Ray Microanalysis written by Joseph Goldstein and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-11 with Science categories.


This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.



Electron Probe Quantitation


Electron Probe Quantitation
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Author : K.F.J. Heinrich
language : en
Publisher: Springer Science & Business Media
Release Date : 1991-06-30

Electron Probe Quantitation written by K.F.J. Heinrich and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991-06-30 with Science categories.


In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.



Electron Microprobe Analysis


Electron Microprobe Analysis
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Author : S. J. B. Reed
language : en
Publisher: Cambridge University Press
Release Date : 1997-07-10

Electron Microprobe Analysis written by S. J. B. Reed and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-07-10 with Science categories.


This 1993 book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively updated version of the seminal first edition, published in 1975. The design and operation of the instrument, including the electron column and both wavelength- and energy-dispersive X-ray spectrometers, are covered in the first part of the book. Experimental procedures for qualitative and quantitative analysis, using both types of spectrometer, are then discussed. Matrix ('ZAF') corrections, as required for quantitative analysis, are treated in some detail from both theoretical and practical viewpoints. Special considerations applying to the analysis of 'light' elements (atomic number below 10) are covered in a separate chapter. The emphasis throughout is on a sound understanding of principles and the treatment is applicable equally to the electron microprobe in its 'classical' form and to scanning electron microscopes fitted with X-ray spectrometers.



A Handbook Of Silicate Rock Analysis


A Handbook Of Silicate Rock Analysis
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Author : P.J. Potts
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-11

A Handbook Of Silicate Rock Analysis written by P.J. Potts and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-11 with Social Science categories.


without an appreciation of what happens in between. The techniques available for the chemical analysis of silicate rocks have undergone a revolution over the last 30 years. However, to use an analytical technique most effectively, No longer is the analytical balance the only instrument used it is essential to understand its analytical characteristics, in for quantitative measurement, as it was in the days of classi particular the excitation mechanism and the response of the cal gravimetric procedures. A wide variety of instrumental signal detection system. In this book, these characteristics techniques is now commonly used for silicate rock analysis, have been described within a framework of practical ana lytical aplications, especially for the routine multi-element including some that incorporate excitation sources and detec tion systems that have been developed only in the last few analysis of silicate rocks. All analytical techniques available years. These instrumental developments now permit a wide for routine silicate rock analysis are discussed, including range of trace elements to be determined on a routine basis. some more specialized procedures. Sufficient detail is In parallel with these exciting advances, users have tended included to provide practitioners of geochemistry with a firm to become more remote from the data production process. base from which to assess current performance, and in some This is, in part, an inevitable result of the widespread intro cases, future developments.



A Beginners Guide To Scanning Electron Microscopy


A Beginners Guide To Scanning Electron Microscopy
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Author : Anwar Ul-Hamid
language : en
Publisher: Springer
Release Date : 2018-10-26

A Beginners Guide To Scanning Electron Microscopy written by Anwar Ul-Hamid and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-10-26 with Technology & Engineering categories.


This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging.A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds.