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Emc Of Analog Integrated Circuits

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Emc Of Analog Integrated Circuits

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Author : Jean-Michel Redouté
language : en
Publisher: Springer Science & Business Media
Release Date : 2009-10-10

Emc Of Analog Integrated Circuits written by Jean-Michel Redouté and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-10-10 with Technology & Engineering categories.

Environmental electromagnetic pollution has drastically increased over the last decades. The omnipresence of communication systems, various electronic appliances and the use of ever increasing frequencies, all contribute to a noisy electromagnetic environment which acts detrimentally on sensitive electronic equipment. Integrated circuits must be able to operate satisfactorily while cohabiting harmoniously in the same appliance, and not generate intolerable levels of electromagnetic emission, while maintaining a sound immunity to potential electromagnetic disturbances: analog integrated circuits are in particular more easily disturbed than their digital counterparts, since they don't have the benefit of dealing with predefined levels ensuring an innate immunity to disturbances. The objective of the research domain presented in EMC of Analog Integrated Circuits is to improve the electromagnetic immunity of considered analog integrated circuits, so that they start to fail at relevantly higher conduction levels than before.

Emc Of Analog Integrated Circuits

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Author : Jean-Michel Redouté
language : en
Publisher: Springer
Release Date : 2010-04-29

Emc Of Analog Integrated Circuits written by Jean-Michel Redouté and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-04-29 with Technology & Engineering categories.

Electromagnetic Compatibility Of Integrated Circuits

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Author : Sonia Ben Dhia
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-06-04

Electromagnetic Compatibility Of Integrated Circuits written by Sonia Ben Dhia and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-06-04 with Technology & Engineering categories.

Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented.

Fault Diagnosis Of Analog Integrated Circuits

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Author : Prithviraj Kabisatpathy
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-01-13

Fault Diagnosis Of Analog Integrated Circuits written by Prithviraj Kabisatpathy and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-01-13 with Technology & Engineering categories.

System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast, methodologies for the testing of analog circuits remain relatively underdeveloped due to the complex nature of analog signals. Compared to digital testing, analog testing lags far behind in methodologies and tools and therefore demands substantial research and development effort. Fault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students as well as practicing engineers. The objective of this book is to study the testing and fault diagnosis of analog and analog part of mixed signal circuits. A background in analog integrated circuit, artificial neural network is desirable but not essential. The text covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits. Fault model of the devices in analog domain has been introduced in the text. The test stimulus generations are also discussed in details. Experimental verification of some state of the art techniques has also been presented in the book. It also contains problems that can be used as quiz or homework. This book enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology.

Analog Circuit Design

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Author : Herman Casier
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-03-19

Analog Circuit Design written by Herman Casier and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-03-19 with Technology & Engineering categories.

Analog Circuit Design is based on the yearly Advances in Analog Circuit Design workshop. The aim of the workshop is to bring together designers of advanced analogue and RF circuits for the purpose of studying and discussing new possibilities and future developments in this field. Selected topics for AACD 2007 are: (1) Sensors, Actuators and Power Drivers for the Automotive and Industrial Environment (Tue 27 March) - Chaired by Herman Casier, AMI Semiconductor Fellow, Belgium; (2) Integrated PA's from Wireline to RF (Wed 28 March) - Chaired by Prof. Michiel Steyaert, Catholic University, Leuven; (3) Very High Frequency Front Ends (Thu 29 March) - Chaired by Prof. Arthur van Roermund, Eindhoven University of Technology.

Analysis And Design Of Analog Integrated Circuits

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Author : Paul R. Gray
language : en
Publisher: John Wiley & Sons
Release Date : 2009-01-20

Analysis And Design Of Analog Integrated Circuits written by Paul R. Gray and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-01-20 with Technology & Engineering categories.

This is the only comprehensive book in the market for engineers that covers the design of CMOS and bipolar analog integrated circuits. The fifth edition retains its completeness and updates the coverage of bipolar and CMOS circuits. A thorough analysis of a new low-voltage bipolar operational amplifier has been added to Chapters 6, 7, 9, and 11. Chapter 12 has been updated to include a fully differential folded cascode operational amplifier example. With its streamlined and up-to-date coverage, more engineers will turn to this resource to explore key concepts in the field.

Principles And Techniques Of Electromagnetic Compatibility

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Author : Christos Christopoulos
language : en
Publisher: CRC Press
Release Date : 2022-07-14

Principles And Techniques Of Electromagnetic Compatibility written by Christos Christopoulos and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-07-14 with Technology & Engineering categories.

This book provides a sound grasp of the fundamental concepts, applications, and practice of EMC. Developments in recent years have resulted in further increases in electrical component density, wider penetration of wireless technologies, and a significant increase in complexity of electrical and electronic equipment. New materials, which can be customized to meet EMC needs, have been introduced. Considerable progress has been made in developing numerical tools for complete system EMC simulation. EMC is now a central consideration in all industrial sectors. Maintaining the holistic approach of the previous edition of Principles and Techniques of Electromagnetic Compatibility, the Third Edition updates coverage of EMC to reflects recent important developments. What is new in the Third Edition? A comprehensive treatment of new materials (meta- and nano-) and their impact on EMC Numerical modelling of complex systems and complexity reduction methods Impact of wireless technologies and the Internet of Things (IoT) on EMC Testing in reverberation chambers, and in the time-domain A comprehensive treatment of the scope and development of stochastic models for EMC EMC issues encountered in automotive, railway, aerospace, and marine applications Impact of EMC and Intentional EMI (IEMI) on infrastructure, and risk assessment In addition to updating material, new references, examples, and appendices were added to offer further support to readers interested in exploring further. As in previous editions, the emphasis is on building a sound theoretical framework, and demonstrating how it can be turned to practical use in challenging applications. The expectation is that this approach will serve EMC engineers through the inevitable future technological shifts and developments.

Parasitic Substrate Coupling In High Voltage Integrated Circuits

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Author : Pietro Buccella
language : en
Publisher: Springer
Release Date : 2018-03-14

Parasitic Substrate Coupling In High Voltage Integrated Circuits written by Pietro Buccella and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-03-14 with Technology & Engineering categories.

This book introduces a new approach to model and predict substrate parasitic failures in integrated circuits with standard circuit design tools. The injection of majority and minority carriers in the substrate is a recurring problem in smart power ICs containing high voltage, high current switching devices besides sensitive control, protection and signal processing circuits. The injection of parasitic charges leads to the activation of substrate bipolar transistors. This book explores how these events can be evaluated for a wide range of circuit topologies. To this purpose, new generalized devices implemented in Verilog-A are used to model the substrate with standard circuit simulators. This approach was able to predict for the first time the activation of a latch-up in real circuits through post-layout SPICE simulation analysis. Discusses substrate modeling and circuit-level simulation of parasitic bipolar device coupling effects in integrated circuits; Includes circuit back-annotation of the parasitic lateral n-p-n and vertical p-n-p bipolar transistors in the substrate; Uses Spice for simulation and characterization of parasitic bipolar transistors, latch-up of the parasitic p-n-p-n structure, and electrostatic discharge (ESD) protection devices; Offers design guidelines to reduce couplings by adding specific protections.

Esd Basics

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Author : Steven H. Voldman
language : en
Publisher: John Wiley & Sons
Release Date : 2012-10-22

Esd Basics written by Steven H. Voldman and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-22 with Technology & Engineering categories.

Electrostatic discharge (ESD) continues to impact semiconductor manufacturing, semiconductor components and systems, as technologies scale from micro- to nano electronics. This book introduces the fundamentals of ESD, electrical overstress (EOS), electromagnetic interference (EMI), electromagnetic compatibility (EMC), and latchup, as well as provides a coherent overview of the semiconductor manufacturing environment and the final system assembly. It provides an illuminating look into the integration of ESD protection networks followed by examples in specific technologies, circuits, and chips. The text is unique in covering semiconductor chip manufacturing issues, ESD semiconductor chip design, and system problems confronted today as well as the future of ESD phenomena and nano-technology. Look inside for extensive coverage on: The fundamentals of electrostatics, triboelectric charging, and how they relate to present day manufacturing environments of micro-electronics to nano-technology Semiconductor manufacturing handling and auditing processing to avoid ESD failures ESD, EOS, EMI, EMC, and latchup semiconductor component and system level testing to demonstrate product resilience from human body model (HBM), transmission line pulse (TLP), charged device model (CDM), human metal model (HMM), cable discharge events (CDE), to system level IEC 61000-4-2 tests ESD on-chip design and process manufacturing practices and solutions to improve ESD semiconductor chip solutions, also practical off-chip ESD protection and system level solutions to provide more robust systems System level concerns in servers, laptops, disk drives, cell phones, digital cameras, hand held devices, automobiles, and space applications Examples of ESD design for state-of-the-art technologies, including CMOS, BiCMOS, SOI, bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, smart power, magnetic recording technology, micro-machines (MEMs) to nano-structures ESD Basics: From Semiconductor Manufacturing to Product Use complements the author’s series of books on ESD protection. For those new to the field, it is an essential reference and a useful insight into the issues that confront modern technology as we enter the Nano-electronic Era.

Emi Resilient Amplifier Circuits

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Author : Marcel J. van der Horst
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-07-23

Emi Resilient Amplifier Circuits written by Marcel J. van der Horst and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-07-23 with Technology & Engineering categories.

This book enables circuit designers to reduce the errors introduced by the fundamental limitations (noise, bandwith, and signal power) and electromagnetic interference (EMI) in negative-feedback amplifiers. The authors describe a systematic design approach for application specific negative-feedback amplifiers, with specified signal-to-error ratio (SER). This approach enables designers to calculate noise, bandwidth, EMI, and the required bias parameters of the transistors used in application specific amplifiers in order to meet the SER requirements.

Emc Of Analog Integrated Circuits

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