Estimating Device Reliability
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Estimating Device Reliability
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Author : Franklin R. Nash
language : en
Publisher: Springer
Release Date : 1992-11-30
Estimating Device Reliability written by Franklin R. Nash and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992-11-30 with Technology & Engineering categories.
Estimating Device Reliability: Assessment of Credibility is concerned with the plausibility of reliability estimates obtained from statistical models. Statistical predictions are necessary because technology is always pushing into unexplored areas faster than devices can be made long-lived by design. Flawed reliability methodologies can produce disastrous results, an outstanding example of which is the catastrophic failure of the manned space shuttle CHALLENGER in January 1986. This issue is not whether, but which, statistical models should be used. The issue is not making reliability estimates, but is instead their credibility. The credibility questions explored in the context of practical applications include: What does the confidence level associated with the use of statistical model mean? Is the numerical result associated with a high confidence level beyond dispute? When is it appropriate to use the exponential (constant hazard rate) model? Does this model always provide the most conservative reliability estimate? Are the results of traditional `random' failure hazard rate calculations tenable? Are there persuasive alternatives? What model should be used to describe the useful life of a device when wearout is absent? When Weibull and lognormal failure plots containing a large number of failure times appear similar, how should the correct wearout model be selected? Is it important to distinguish between a conservative upper bound on a probability of failure and a realistic estimate of the same probability? Estimating Device Reliability: Assessment of Credibility is for those who are obliged to make reliability calculations with a paucity of somewhat corrupt data, by using inexact models, and by making physical assumptions which are impractical to verify. Illustrative examples deal with a variety of electronic devices, ICs and lasers.
A Statistical Look At Device Reliability
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Author : Pasquale De Marco
language : en
Publisher: Pasquale De Marco
Release Date : 2025-07-12
A Statistical Look At Device Reliability written by Pasquale De Marco and has been published by Pasquale De Marco this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-07-12 with Technology & Engineering categories.
**A Statistical Look at Device Reliability** offers a comprehensive exploration of the statistical underpinnings of device reliability, providing a roadmap for engineers, researchers, and students to navigate the complexities of statistical modeling and credibility assessment. Delving into the fundamental concepts of statistical tools and techniques, the book provides a solid foundation for understanding the intricacies of reliability analysis. It examines various types of reliability models, guiding readers through the processes of model selection, parameter estimation, and validation. Moving beyond theoretical frameworks, the book delves into the practical applications of reliability modeling and analysis. It illustrates how these methods can be applied to optimize design, improve manufacturing processes, and ensure the long-term performance of devices and systems. Case studies drawn from diverse industries, including electronics, automotive, aerospace, and medical devices, offer valuable insights into the challenges and successes of implementing reliability engineering principles. Recognizing the rapidly evolving landscape of technology, the book also explores emerging trends and technologies that are shaping the future of reliability engineering. It examines the potential of artificial intelligence, machine learning, and the Internet of Things (IoT) to revolutionize the way we assess and manage device reliability. Written in an accessible and engaging style, **A Statistical Look at Device Reliability** is an essential resource for anyone seeking a deeper understanding of device reliability. Its comprehensive coverage, practical examples, and forward-looking perspective make it an indispensable guide for navigating the complexities of statistical modeling and credibility assessment in this critical field. If you like this book, write a review!
Reliability Modeling The Riac Guide To Reliability Prediction Assessment And Estimation
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Author : William Denson
language : en
Publisher: RIAC
Release Date : 2006
Reliability Modeling The Riac Guide To Reliability Prediction Assessment And Estimation written by William Denson and has been published by RIAC this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006 with Technology & Engineering categories.
The intent of this book is to provide guidance on modeling techniques that can be used to quantify the reliability of a product or system. In this context, reliability modeling is the process of constructing a mathematical model that is used to estimate the reliability characteristics of a product. There are many ways in which this can be accomplished, depending on the product or system and the type of information that is available, or practical to obtain. This book reviews possible approaches, summarizes their advantages and disadvantages, and provides guidance on selecting a methodology based on the specific goals and constraints of the analyst. While this book will not discuss the use of specific published methodologies, in cases where examples are provided, tools and methodologies with which the author has personal experience in their development are used, such as life modeling, NPRD, MIL-HDBK-217 and the RIAC 217Plus--Introduction.
Reliability Of Semiconductor Lasers And Optoelectronic Devices
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Author : Robert Herrick
language : en
Publisher: Woodhead Publishing
Release Date : 2021-03-06
Reliability Of Semiconductor Lasers And Optoelectronic Devices written by Robert Herrick and has been published by Woodhead Publishing this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-03-06 with Technology & Engineering categories.
Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects. Key materials and devices are reviewed including silicon photonics, vertical-cavity surface-emitting lasers (VCSELs), InGaN LEDs and lasers, and AlGaN LEDs, covering the majority of optoelectronic devices that we use in our everyday lives, powering the Internet, telecommunication, solid-state lighting, illuminators, and many other applications. This book features contributions from experts in industry and academia working in these areas and includes numerous practical examples and case studies.This book is suitable for new entrants to the field of optoelectronics working in R&D. - Includes case studies and numerous examples showing best practices and common mistakes affecting optoelectronics reliability written by experts working in the industry - Features the first wide-ranging and comprehensive overview of fiber optics reliability engineering, covering all elements of the practice from building a reliability laboratory, qualifying new products, to improving reliability on mature products - Provides a look at the reliability issues and failure mechanisms for silicon photonics, VCSELs, InGaN LEDs and lasers, AIGaN LEDs, and more
Reliability And Failure Of Electronic Materials And Devices
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Author : Milton Ohring
language : en
Publisher: Academic Press
Release Date : 2014-10-14
Reliability And Failure Of Electronic Materials And Devices written by Milton Ohring and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-10-14 with Technology & Engineering categories.
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
Reliability Assessments
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Author : Franklin Richard Nash, Ph.D.
language : en
Publisher: CRC Press
Release Date : 2017-07-12
Reliability Assessments written by Franklin Richard Nash, Ph.D. and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-07-12 with Business & Economics categories.
This book provides engineers and scientists with a single source introduction to the concepts, models, and case studies for making credible reliability assessments. It satisfies the need for thorough discussions of several fundamental subjects. Section I contains a comprehensive overview of assessing and assuring reliability that is followed by discussions of: • Concept of randomness and its relationship to chaos • Uses and limitations of the binomial and Poisson distributions • Relationship of the chi-square method and Poisson curves • Derivations and applications of the exponential, Weibull, and lognormal models • Examination of the human mortality bathtub curve as a template for components Section II introduces the case study modeling of failure data and is followed by analyses of: • 5 sets of ideal Weibull, lognormal, and normal failure data • 83 sets of actual (real) failure data The intent of the modeling was to find the best descriptions of the failures using statistical life models, principally the Weibull, lognormal, and normal models, for characterizing the failure probability distributions of the times-, cycles-, and miles-to-failure during laboratory or field testing. The statistical model providing the preferred characterization was determined empirically by choosing the two-parameter model that gave the best straight-line fit in the failure probability plots using a combination of visual inspection and three statistical goodness-of-fit (GoF) tests. This book offers practical insight in dealing with single item reliability and illustrates the use of reliability methods to solve industry problems.
Materials And Reliability Handbook For Semiconductor Optical And Electron Devices
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Author : Osamu Ueda
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-09-22
Materials And Reliability Handbook For Semiconductor Optical And Electron Devices written by Osamu Ueda and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-09-22 with Science categories.
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.
At T Reliability Manual
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Author : David J. Klinger
language : en
Publisher: Springer Science & Business Media
Release Date : 1990
At T Reliability Manual written by David J. Klinger and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1990 with Computers categories.
Partial Contents: Reliability Concepts; Device Reliability; Hazard Rates; Monitoring Reliability; Specific Device Information, and more. Appendixes. 60 illustrations.
Mems Reliability
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Author : Allyson L. Hartzell
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-11-02
Mems Reliability written by Allyson L. Hartzell and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-11-02 with Technology & Engineering categories.
The successful launch of viable MEMs product hinges on MEMS reliability, the reliability and qualification for MEMs based products is not widely understood. Companies that have a deep understanding of MEMs reliability view the information as a competitive advantage and are reluctant to share it. MEMs Reliability, focuses on the reliability and manufacturability of MEMS at a fundamental level by addressing process development and characterization, material property characterization, failure mechanisms and physics of failure (POF), design strategies for improving yield, design for reliability (DFR), packaging and testing.
Medical Device Reliability And Associated Areas
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Author : B.S. Dhillon
language : en
Publisher: CRC Press
Release Date : 2000-03-29
Medical Device Reliability And Associated Areas written by B.S. Dhillon and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000-03-29 with Business & Economics categories.
Although Reliability Engineering can trace its roots back to World War II, its application to medical devices is relatively recent, and its treatment in the published literature has been quite limited. With the medical device industry among the fastest growing segments of the US economy, it is vital that the engineering, biomedical, manufacturing, and design communities have up-to-date information on current developments, tools, and techniques. Medical Device Reliability and Associated Areas fills this need with broad yet detailed coverage of the field. It addresses a variety of topics related - directly and indirectly - to reliability, including human error in health care systems and software quality assurance. With emphasis on concepts rather than mathematical rigor, a multitude of examples, exercises, tables, and references, this is one resource that everyone connected to the medical device industry must have.