Functional Design Error Diagnosis Correction And Layout Repair Of Digital Circuits

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Functional Design Errors In Digital Circuits
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Author : Kai-hui Chang
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-12-02
Functional Design Errors In Digital Circuits written by Kai-hui Chang and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-12-02 with Technology & Engineering categories.
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Functional Design Error Diagnosis Correction And Layout Repair Of Digital Circuits
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Author : Kai-Hui Chang
language : en
Publisher:
Release Date : 2007
Functional Design Error Diagnosis Correction And Layout Repair Of Digital Circuits written by Kai-Hui Chang and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007 with categories.
Functional Design Errors In Digital Circuits
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Author : Kai-hui Chang
language : en
Publisher: Springer
Release Date : 2009-08-29
Functional Design Errors In Digital Circuits written by Kai-hui Chang and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-08-29 with Technology & Engineering categories.
Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.
Dissertation Abstracts International
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Author :
language : en
Publisher:
Release Date : 2008
Dissertation Abstracts International written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008 with Dissertations, Academic categories.
System On Chip Test Architectures
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Author : Laung-Terng Wang
language : en
Publisher: Morgan Kaufmann
Release Date : 2010-07-28
System On Chip Test Architectures written by Laung-Terng Wang and has been published by Morgan Kaufmann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-07-28 with Technology & Engineering categories.
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
Lecture Notes In Analog Electronics
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Author : Vančo B. Litovski
language : en
Publisher: Springer Nature
Release Date : 2025-01-17
Lecture Notes In Analog Electronics written by Vančo B. Litovski and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-01-17 with Technology & Engineering categories.
Prof. Vančo Litovski was born in 1947 in Rakita, South Macedonia, Greece. He graduated from the Faculty of Electronic Engineering in Niš in 1970 and obtained his M.Sc. in 1974 and his Ph.D. in 1977. He was appointed as a teaching assistant at the Faculty of Electronic Engineering in 1970 and became a full professor at the same faculty in 1987. He was elected as a visiting professor (honoris causa) at the University of Southampton in 1999. From 1987 until 1990, he was a consultant to the CEO of Ei and was the head of the Chair of Electronics at the Faculty of Electronic Engineering in Niš for 12 years. From 2015 to 2017, he was a researcher at the University of Bath.. He received several awards including from the Faculty of Electronic Engineering (Charter in 1980, Charter in 1985, and a Special Recognition in 1995) and the University of Niš (Plaque 1985).
Digital Mos Integrated Circuits
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Author : Niantsu Wang
language : en
Publisher:
Release Date : 1989
Digital Mos Integrated Circuits written by Niantsu Wang and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1989 with Technology & Engineering categories.
Very Good,No Highlights or Markup,all pages are intact.
Scientific And Technical Aerospace Reports
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Author :
language : en
Publisher:
Release Date : 1995
Scientific And Technical Aerospace Reports written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Aeronautics categories.
International Aerospace Abstracts
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Author :
language : en
Publisher:
Release Date : 1999
International Aerospace Abstracts written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with Aeronautics categories.
Popular Science
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Author :
language : en
Publisher:
Release Date : 2004-12
Popular Science written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-12 with categories.
Popular Science gives our readers the information and tools to improve their technology and their world. The core belief that Popular Science and our readers share: The future is going to be better, and science and technology are the driving forces that will help make it better.