Gettering And Defect Engineering In Semiconductor Technology Ix
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Gettering And Defect Engineering In Semiconductor Technology Ix
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Author : Vito Raineri
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 2001-11-30
Gettering And Defect Engineering In Semiconductor Technology Ix written by Vito Raineri and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-11-30 with Technology & Engineering categories.
GADEST 2001 Proceedings of the 9th Int. Conference on Gettering anf Defect Engineering in Semiconductor Technology , S. Tecla, Italy
Gettering Anf Defect Engineering In Semiconductor Technology Ix
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Author :
language : en
Publisher:
Release Date : 2001
Gettering Anf Defect Engineering In Semiconductor Technology Ix written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with categories.
Gettering and Defect Engineering in Semiconductor Technology are discussed here,with particular emphasis being placed on device applications. Fundamental aspects,as well as technological problems which are associated with defects in electronic materials and devices, are addressed. The topics in this volume were selected on the basis that single-crystal Si, and Si-based, semiconductors will dominate microelectronics until far into the 21st century. The main reason for the overwhelming success of silicon technology is economic: the production cost per area increases by a factor of 5, or even 10, on going from 200 mm Si wafers to compound semiconductors or other substrate materials. Furthermore, the unceasing efforts in research on Si-based materials have been able to overcome some of the most stringent limitations on a Si-based technology. In fact, demonstrations of the feasibility of integrating IV-IV heterostructures and light-emitting devices into silicon technology, together with the promise of 450mm wafers combined with 70 nm technology, seem set to maintain the performance advantages that cause more than 95% of all manufactured semiconductor devices to be fabricated in silicon. However, the demands for wider applications of solid-state electronics are increasing demands to be made for devices having higher performances or very special properties. This makes research, on advanced materials and devices which are based upon other semiconductors, a highly relevant strand of semiconductor research for the near future. These proceedings span a wide variety of topics: going from silicon crystal growth and substrates, to technological processes and analytical techniques, to dopant-defect interactions, gettering, Si opto-electronics, radiation-hardness and nanoelectronics. A small section is also dedicated to compound semiconductors and materials other than silicon.
Gettering And Defect Engineering In Semiconductor Technology Iv
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Author : M. Kittler
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 1991-01-01
Gettering And Defect Engineering In Semiconductor Technology Iv written by M. Kittler and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991-01-01 with Technology & Engineering categories.
Proceedings of the 4th International Conference on Gettering and Defect Engineering In Semiconductor Technology (GADEST '91), Frankfurt, Germany, October 1991
Gettering And Defect Engineering In Semiconductor Technology
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Author :
language : en
Publisher:
Release Date : 2002
Gettering And Defect Engineering In Semiconductor Technology written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002 with Electric engineering categories.
Gettering And Defect Engineering In Semiconductor Technology Xv
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Author : J.D. Murphy
language : en
Publisher: Trans Tech Publications Ltd
Release Date : 2013-10-07
Gettering And Defect Engineering In Semiconductor Technology Xv written by J.D. Murphy and has been published by Trans Tech Publications Ltd this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-07 with Technology & Engineering categories.
GADEST 2013 Selected, peer reviewed papers from the 15th Gettering and Defect Engineering in Semiconductor Technology (GADEST 2013), September 22-27, 2013, Oxford, UK
Proceedings Of The 9th International Autumn Meeting Gettering And Defect Engineering In Semiconductor Technology
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Author : Vito Raineri
language : en
Publisher: Sci-Tech Pub. Limited
Release Date : 2002
Proceedings Of The 9th International Autumn Meeting Gettering And Defect Engineering In Semiconductor Technology written by Vito Raineri and has been published by Sci-Tech Pub. Limited this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002 with Electric engineering categories.
Gettering and Defect Engineering in Semiconductor Technology are discussed here, with particular emphasis being placed on device applications. Fundamental aspects, as well as technological problems which are associated with defects in electronic materials and devices, are addressed. The topics in this volume were selected on the basis that single-crystal Si, and Si-based, semiconductors will dominate microelectronics until far into the 21st century. The main reason for the overwhelming success of silicon technology is economic: the production cost per area increases by a factor of 5, or even 10, on going from 200 mm Si wafers to compound semiconductors or other substrate materials.
Silicon Germanium Strained Layers And Heterostructures
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Author : M. Willander
language : en
Publisher: Elsevier
Release Date : 2003-10-02
Silicon Germanium Strained Layers And Heterostructures written by M. Willander and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-10-02 with Technology & Engineering categories.
The study of Silicone Germanium strained layers has broad implications for material scientists and engineers, in particular those working on the design and modelling of semi-conductor devices. Since the publication of the original volume in 1994, there has been a steady flow of new ideas, new understanding, new Silicon-Germanium (SiGe) structures and new devices with enhanced performance. Written for both students and senior researchers, the 2nd edition of Silicon-Germanium Strained Layers and Heterostructures provides an essential up-date of this important topic, describing in particular the recent developments in technology and modelling.* Fully-revised and updated 2nd edition incorporating important recent breakthroughs and a complete literature review* The extensive bibliography of over 400 papers provides a comprehensive and coherent overview of the subject* Appropriate for students and senior researchers
Handbook Of Semiconductor Manufacturing Technology
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Author : Yoshio Nishi
language : en
Publisher: CRC Press
Release Date : 2017-12-19
Handbook Of Semiconductor Manufacturing Technology written by Yoshio Nishi and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-19 with Technology & Engineering categories.
Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.
Gettering And Defect Engineering In Semiconductor Technology Xv
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Author : J. D. Murphy
language : en
Publisher:
Release Date : 2013
Gettering And Defect Engineering In Semiconductor Technology Xv written by J. D. Murphy and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with Getters categories.
The book includes both fundamental and technological aspects of defects in semiconductor materials and devices, including photovoltaics. The 74 papers are grouped as follows: I. Defect engineering in silicon solar cells; II. Structural and production issues in cast silicon materials for solar cells; III. Characterisation of silicon for solar cells; IV. Intrinsic point defects in silicon; V. Light impurities in silicon-based materials; VI. Metals in silicon: fundamental properties and gettering; VII. Extended and implantation-related defects in silicon; VIII. Surfaces, passivation and processing; IX. Germanium-based devices and materials; X. Semiconductors other than silicon and germanium; XI. Nanostructures and new materials systems. Review from Book News Inc.: The proceedings for GADEST 2013 contains 84 papers on such matters as defect engineering in silicon solar cells, structural and production issues in cast silicon materials for solar cells, characterizing silicon for solar cells, intrinsic point defects in silicon, light impurities in silicon-based materials, fundamental properties and gettering of metals in silicon, extended and implantation-related defects in silicon, germanium-based devices and materials, semiconductors other than silicon and germanium, and nanostructures and new materials systems.
Gettering And Defect Engineering In Semiconductor Technology Vii
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Author :
language : en
Publisher:
Release Date : 1997
Gettering And Defect Engineering In Semiconductor Technology Vii written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997 with categories.
Defect control relies more and more upon advanced fabrication approaches such as the use of slow pulling rates and hydrogen annealing. Gettering techniques remain of key importance in enhancing the device yield. This volume provides the most up-to-date information for scientists and engineers who are involved in the fields of semiconductor defect physics or materials science. Fundamental aspects, as well as technological problems, which are associated with defects in electronic materials and devices, are addressed. Due to the broad spectrum of topics covered, ranging from theoretical analyses to practical engineering solutions, the present book uniquely and complements others in the field. 1. Keynote Address. 2. Silicon Materials. 3. Gettering Techniques. 4. Oxygen in Silicon. 5. Erbium in Silicon. 6. Radiation Effects in Semiconductors. 7. Dislocations in Silicon. 8. Defect Engineering. 9. Advanced Semiconductor Materials and Devices. 10. Semiconductor Material and Device Diagnostics.