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Handbook Of Surface And Interface Analysis


Handbook Of Surface And Interface Analysis
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Handbook Of Surface And Interface Analysis


Handbook Of Surface And Interface Analysis
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Author : John C. Riviere
language : en
Publisher: CRC Press
Release Date : 1998-01-27

Handbook Of Surface And Interface Analysis written by John C. Riviere and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-01-27 with Science categories.


Integrating advances in instrumentation and methods, this work offers an approach to solving problems in surface and interface analysis, beginning with a particular problem and then explaining the most rational and efficient route to a solution. The book discusses electron optical and scanned probe microscopy, high spatial resolution imaging and synchrotron-based techniques. It emphasizes problem-solving for different classes of materials and material function.



Handbook Of Surface And Interface Analysis


Handbook Of Surface And Interface Analysis
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Author : John C. Riviere
language : en
Publisher: CRC Press
Release Date : 2017-06-14

Handbook Of Surface And Interface Analysis written by John C. Riviere and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-06-14 with categories.


The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors� firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear to have validated their assertions. Major instrumental assets are generally funded and maintained as central facilities to help potential users make informed decisions about their appropriate use in solving analytical problem(s). Building on the popular first edition, this long-awaited second edition was motivated by the increasingly common industry view that it is more cost-effective to contract out analytical services than to maintain in-house facilities. Guided by that trend, this book focuses on developing strategic thinking for those who decide which facilities to access and where to subcontract analytical work. It covers most of the major tactical issues that are relevant at the location in which data are being produced. New Information in this Second Edition Includes: Electron-optical imaging techniques and associated analytical methods Techniques based on synchrotron sources Convenient and versatile scanning probe group methods Scanning tunneling microscopy, biocompatible materials, and nano-structured materials Assessing benefits and limitations of different methodologies, this volume provides the essential physical basis and common modes of operation for groups of techniques. Exploring methods for characterization and analysis of particular types of materials and/or their relevant applications�the text synergizes traditional and novel ideas to help readers develop a versatile and rational approach to surface and interface analysis.



Handbook Of Surface And Interface Analysis


Handbook Of Surface And Interface Analysis
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Author : John C. Riviere
language : en
Publisher: CRC Press
Release Date : 2009-06-24

Handbook Of Surface And Interface Analysis written by John C. Riviere and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-06-24 with Science categories.


The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear



Surface And Interface Analysis


Surface And Interface Analysis
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Author : Rudolf Holze
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-10-08

Surface And Interface Analysis written by Rudolf Holze and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-10-08 with Technology & Engineering categories.


A broad, almost encyclopedic overview of spectroscopic and other analytical techniques useful for investigations of phase boundaries in electrochemistry is presented. The analysis of electrochemical interfaces and interphases on a microscopic, even molecular level, is of central importance for an improved understanding of the structure and dynamics of these phase boundaries. The gained knowledge will be needed for improvements of methods and applications reaching from electrocatalysis, electrochemical energy conversion, biocompatibility of metals, corrosion protection to galvanic surface treatment and finishing. The book provides an overview as complete as possible and enables the reader to choose methods most suitable for tackling his particular task. It is nevertheless compact and does not flood the reader with the details of review papers.



Handbook Of Surfaces And Interfaces Of Materials Surface And Interface Analysis And Properties


Handbook Of Surfaces And Interfaces Of Materials Surface And Interface Analysis And Properties
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Author : Hari Singh Nalwa
language : en
Publisher:
Release Date : 2001

Handbook Of Surfaces And Interfaces Of Materials Surface And Interface Analysis And Properties written by Hari Singh Nalwa and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Interfaces (Physical sciences) categories.




Surface And Interface Analysis


Surface And Interface Analysis
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Author : Seong H. Kim
language : en
Publisher: John Wiley & Sons
Release Date : 2025-03-05

Surface And Interface Analysis written by Seong H. Kim and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-03-05 with Technology & Engineering categories.


Comprehensive textbook covering characterization techniques to understand the chemistry and structure of materials on surfaces and at interfaces Surface and Interface Analysis is a comprehensive textbook resource that covers everything readers need to know about surface energy, molecular speciation, and optical and physical characterization techniques. Assuming only basic knowledge of general chemistry (electronic orbitals, organic functional groups), physics (electromagnetic waves, Maxwell equations), physical chemistry (Schrödinger equation, harmonic oscillator), and mathematics (wave equations, covariance matrix), this textbook helps readers understand the underlying principles of the discussed characterization techniques and enables them to transform theoretical knowledge into applied skills through a Maieutic pedagogical approach. Written by a highly qualified professor, Surface and Interface Analysis includes information on: Relationship between atomic and molecular orbitals and compositional analysis principles based on measurements of photoelectrons, Auger electrons, x-rays, and secondary ions emitted from the surface Governance of electromagnetic wave propagation in a dielectric medium and what can be learned from analyzing the electromagnetic wave reflected from the interface Surface metrology using light reflection (non-contact) and scanning probe (contact) and analysis of mechanical properties through indentation Artifacts and misinterpretations that may be encountered during analysis Surface and Interface Analysis is an ideal textbook resource on the subject for graduate students in the fields of solid state physics, optics, materials science, chemistry, and engineering who want to learn and apply advanced materials characterization methods, along with undergraduate students in advanced elective courses.



Mechanical Tribology


Mechanical Tribology
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Author : George E. Totten
language : en
Publisher: CRC Press
Release Date : 2004-04-22

Mechanical Tribology written by George E. Totten and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-04-22 with Technology & Engineering categories.


Studying the morphology, defects, and wear behavior of a variety of material surfaces, Mechanical Tribology examines popular and emerging surface characterization techniques for assessment of the physical, mechanical, and chemical properties of various modified surfaces, thin films, and coatings. Its chapters explore a wide range of tribolo



An Introduction To Surface Analysis By Xps And Aes


An Introduction To Surface Analysis By Xps And Aes
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Author : John F. Watts
language : en
Publisher: John Wiley & Sons
Release Date : 2019-08-27

An Introduction To Surface Analysis By Xps And Aes written by John F. Watts and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-08-27 with Technology & Engineering categories.


Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.



Encyclopedia Of Analytical Science


Encyclopedia Of Analytical Science
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Author :
language : en
Publisher: Elsevier
Release Date : 2019-04-02

Encyclopedia Of Analytical Science written by and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-04-02 with Science categories.


The third edition of the Encyclopedia of Analytical Science, Ten Volume Set is a definitive collection of articles covering the latest technologies in application areas such as medicine, environmental science, food science and geology. Meticulously organized, clearly written and fully interdisciplinary, the Encyclopedia of Analytical Science, Ten Volume Set provides foundational knowledge across the scope of modern analytical chemistry, linking fundamental topics with the latest methodologies. Articles will cover three broad areas: analytical techniques (e.g., mass spectrometry, liquid chromatography, atomic spectrometry); areas of application (e.g., forensic, environmental and clinical); and analytes (e.g., arsenic, nucleic acids and polycyclic aromatic hydrocarbons), providing a one-stop resource for analytical scientists. Offers readers a one-stop resource with access to information across the entire scope of modern analytical science Presents articles split into three broad areas: analytical techniques, areas of application and and analytes, creating an ideal resource for students, researchers and professionals Provides concise and accessible information that is ideal for non-specialists and readers from undergraduate levels and higher



Auger And X Ray Photoelectron Spectroscopy In Materials Science


Auger And X Ray Photoelectron Spectroscopy In Materials Science
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Author : Siegfried Hofmann
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-10-25

Auger And X Ray Photoelectron Spectroscopy In Materials Science written by Siegfried Hofmann and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-25 with Science categories.


To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.