Introduction To Electron And Ion Optics
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Introduction To Electron And Ion Optics
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Author : Poul Dahl
language : en
Publisher:
Release Date : 1973
Introduction To Electron And Ion Optics written by Poul Dahl and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1973 with SCIENCE categories.
Introduction To Electron And Ion Optics
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Author : Poul Dahl
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Introduction To Electron And Ion Optics written by Poul Dahl and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Science categories.
Introduction to Electron and Ion Optics provides the theoretical background needed to understand the subject matter and even be helpful in laboratory works. Seven major parts comprise the book where each focuses on a certain aspect or field. The book begins with an introduction to the general principles about electron and ion optics, specifically as basis for the design of the optical components used in particle analyzers and accelerators. The following parts tackle different aspects such as geometrical optics; scaling rules and dispersion coefficients; fields (paraxial, sector, fringing, quadrupole); lenses (electrostatic, immersion, unipotential, etc.); analyzers (electrostatic, spherical, etc.); and space charge and beam production. Towards the last part of the book, there is an exercises section where various problems are given for the reader to answer. This book caters to students specifically in the field of physics.
Electron And Ion Optics
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Author : Miklos Szilagyi
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Electron And Ion Optics written by Miklos Szilagyi and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
The field of electron and ion optics is based on the analogy between geometrical light optics and the motion of charged particles in electromagnetic fields. The spectacular development of the electron microscope clearly shows the possibilities of image formation by charged particles of wavelength much shorter than that of visible light. As new applications such as particle accelerators, cathode ray tubes, mass and energy spectrometers, microwave tubes, scanning-type analytical instruments, heavy beam technologies, etc. emerged, the scope of particle beam optics has been exten ded to the formation of fine probes. The goal is to concentrate as many particles as possible in as small a volume as possible. Fabrication of microcircuits is a good example of the growing importance of this field. The current trend is towards increased circuit complexity and pattern density. Because of the diffraction limitation of processes using optical photons and the technological difficulties connected with x-ray processes, charged particle beams are becoming popular. With them it is possible to write directly on a wafer under computer control, without using a mask. Focused ion beams offer especially great possibilities in the submicron region. Therefore, electron and ion beam technologies will most probably playa very important role in the next twenty years or so.
Aberration Theory In Electron And Ion Optics
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Author : Peter W. Hawkes
language : en
Publisher: Elsevier
Release Date : 2023-06-02
Aberration Theory In Electron And Ion Optics written by Peter W. Hawkes and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-06-02 with Technology & Engineering categories.
Advances in Imaging and Electron Physics, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in the Advances in Imaging and Electron Physics series
Principles Of Electron Optics
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Author : Peter W. Hawkes
language : en
Publisher: Academic Press
Release Date : 2012-12-02
Principles Of Electron Optics written by Peter W. Hawkes and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Science categories.
The three volumes in the PRINCIPLES OF ELECTRON OPTICS Series constitute the first comprehensive treatment of electron optics in over forty years. While Volumes 1 and 2 are devoted to geometrical optics, Volume 3 is concerned with wave optics and effects due to wave length. Subjects covered include:Derivation of the laws of electron propagation from SchrUdinger's equationImage formation and the notion of resolutionThe interaction between specimens and electronsImage processingElectron holography and interferenceCoherence, brightness, and the spectral functionTogether, these works comprise a unique and informative treatment of the subject. Volume 3, like its predecessors, will provide readers with both a textbook and an invaluable reference source.
Applied Charged Particle Optics
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Author : Helmut Liebl
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-01-12
Applied Charged Particle Optics written by Helmut Liebl and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-01-12 with Science categories.
Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.
Introduction To Focused Ion Beams
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Author : Lucille A. Giannuzzi
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-05-18
Introduction To Focused Ion Beams written by Lucille A. Giannuzzi and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-05-18 with Science categories.
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Aberration Theory In Electron And Ion Optics
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Author : Jiye Ximen
language : en
Publisher:
Release Date : 1986
Aberration Theory In Electron And Ion Optics written by Jiye Ximen and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with Science categories.
Scanning Electron Microscope Optics And Spectrometers
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Author : Anjam Khursheed
language : en
Publisher: World Scientific
Release Date : 2011
Scanning Electron Microscope Optics And Spectrometers written by Anjam Khursheed and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011 with Technology & Engineering categories.
This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself.The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign.
Electron Emission In Heavy Ion Atom Collisions
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Author : Nikolaus Stolterfoht
language : en
Publisher: Springer Science & Business Media
Release Date : 1997-10-28
Electron Emission In Heavy Ion Atom Collisions written by Nikolaus Stolterfoht and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-10-28 with Science categories.
This volume reviews the theoretical and experimental work about continuous electron emission in energetic ion-atom collisions over the last 30 years. General properties of the two-center electron emission are analyzed, and particular attention is given to screening effects. The book also offers an overview of multiple ionization processes.