Introduction To Electron And Ion Optics
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Introduction To Electron And Ion Optics
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Author : Poul Dahl
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Introduction To Electron And Ion Optics written by Poul Dahl and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Science categories.
Introduction to Electron and Ion Optics provides the theoretical background needed to understand the subject matter and even be helpful in laboratory works. Seven major parts comprise the book where each focuses on a certain aspect or field. The book begins with an introduction to the general principles about electron and ion optics, specifically as basis for the design of the optical components used in particle analyzers and accelerators. The following parts tackle different aspects such as geometrical optics; scaling rules and dispersion coefficients; fields (paraxial, sector, fringing, quadrupole); lenses (electrostatic, immersion, unipotential, etc.); analyzers (electrostatic, spherical, etc.); and space charge and beam production. Towards the last part of the book, there is an exercises section where various problems are given for the reader to answer. This book caters to students specifically in the field of physics.
Electron And Ion Optics
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Author : Miklos Szilagyi
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Electron And Ion Optics written by Miklos Szilagyi and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
The field of electron and ion optics is based on the analogy between geometrical light optics and the motion of charged particles in electromagnetic fields. The spectacular development of the electron microscope clearly shows the possibilities of image formation by charged particles of wavelength much shorter than that of visible light. As new applications such as particle accelerators, cathode ray tubes, mass and energy spectrometers, microwave tubes, scanning-type analytical instruments, heavy beam technologies, etc. emerged, the scope of particle beam optics has been exten ded to the formation of fine probes. The goal is to concentrate as many particles as possible in as small a volume as possible. Fabrication of microcircuits is a good example of the growing importance of this field. The current trend is towards increased circuit complexity and pattern density. Because of the diffraction limitation of processes using optical photons and the technological difficulties connected with x-ray processes, charged particle beams are becoming popular. With them it is possible to write directly on a wafer under computer control, without using a mask. Focused ion beams offer especially great possibilities in the submicron region. Therefore, electron and ion beam technologies will most probably playa very important role in the next twenty years or so.
Introduction To Electron Optics
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Author : Vernon Ellis Cosslett
language : en
Publisher:
Release Date : 1950
Introduction To Electron Optics written by Vernon Ellis Cosslett and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1950 with Science categories.
Aberration Theory In Electron And Ion Optics
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Author : Jiye Ximen
language : en
Publisher:
Release Date : 1986
Aberration Theory In Electron And Ion Optics written by Jiye Ximen and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986 with Science categories.
Introduction To Focused Ion Beams
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Author : Lucille A. Giannuzzi
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-05-18
Introduction To Focused Ion Beams written by Lucille A. Giannuzzi and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-05-18 with Science categories.
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Introduction To Electron Optics
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Author : V. E. Cosslett
language : en
Publisher:
Release Date : 1946
Introduction To Electron Optics written by V. E. Cosslett and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1946 with categories.
Helium Ion Microscopy
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Author : David C. Joy
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-09-13
Helium Ion Microscopy written by David C. Joy and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-09-13 with Technology & Engineering categories.
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century. Topics covered include the principles, operation, and performance of the Gaseous Field Ion Source (GFIS), and a comparison of the optics of ion and electron beam microscopes including their operating conditions, resolution, and signal-to-noise performance. The physical principles of Ion-Induced Secondary Electron (iSE) generation by ions are discussed, and an extensive database of iSE yields for many elements and compounds as a function of incident ion species and its energy is included. Beam damage and charging are frequently outcomes of ion beam irradiation, and techniques to minimize such problems are presented. In addition to imaging, ions beams can be used for the controlled deposition, or removal, of selected materials with nanometer precision. The techniques and conditions required for nanofabrication are discussed and demonstrated. Finally, the problem of performing chemical microanalysis with ion beams is considered. Low energy ions cannot generate X-ray emissions, so alternative techniques such as Rutherford Backscatter Imaging (RBI) or Secondary Ion Mass Spectrometry (SIMS) are examined.
Some Designs Electron And Ion Optics
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Author : Jan Bart Le Poole
language : en
Publisher:
Release Date : 1954
Some Designs Electron And Ion Optics written by Jan Bart Le Poole and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1954 with Electron optics categories.
An Introduction To Electron Optics
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Author : Louis Jacob
language : en
Publisher:
Release Date : 1951
An Introduction To Electron Optics written by Louis Jacob and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1951 with Electron optics categories.
Principles Of Electron Optics
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Author : P. W. Hawkes
language : en
Publisher: Academic Press
Release Date : 1996
Principles Of Electron Optics written by P. W. Hawkes and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with Science categories.