Long Term Non Operating Reliability Of Electronic Products

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Long Term Non Operating Reliability Of Electronic Products
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Author : Judy Pecht
language : en
Publisher: CRC Press
Release Date : 2019-07-23
Long Term Non Operating Reliability Of Electronic Products written by Judy Pecht and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-07-23 with Mathematics categories.
In today's electronic environment, operating reliability for continued daily use of electronic products is essential. This book discusses the reliability of products that lie dormant for long periods of time and are subject to stresses such as humidity, ionic contaminants, temperature, radiation, shock, and vibration. Non-operating reliability is especially critical for life-saving electronic products such as fire alarm systems, standby power sources, and burglar alarms. Air bags in automobiles, earthquake alarm systems, and radiation warning systems in nuclear power plants are also covered. This physics-of-failure approach is also important to maintaining defense hardware such as missiles and munitions systems which often lie dormant for years before being deployed on very short notice
Long Term Non Operating Reliability Of Electronic Products
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Author : Judy Pecht
language : en
Publisher: CRC Press
Release Date : 2019-07-23
Long Term Non Operating Reliability Of Electronic Products written by Judy Pecht and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-07-23 with Mathematics categories.
In today's electronic environment, operating reliability for continued daily use of electronic products is essential. This book discusses the reliability of products that lie dormant for long periods of time and are subject to stresses such as humidity, ionic contaminants, temperature, radiation, shock, and vibration. Non-operating reliability is especially critical for life-saving electronic products such as fire alarm systems, standby power sources, and burglar alarms. Air bags in automobiles, earthquake alarm systems, and radiation warning systems in nuclear power plants are also covered. This physics-of-failure approach is also important to maintaining defense hardware such as missiles and munitions systems which often lie dormant for years before being deployed on very short notice
Reliability And Failure Of Electronic Materials And Devices
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Author : Milton Ohring
language : en
Publisher: Academic Press
Release Date : 2014-10-14
Reliability And Failure Of Electronic Materials And Devices written by Milton Ohring and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-10-14 with Technology & Engineering categories.
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation damage. This new edition adds cutting-edge knowledge gained both in research labs and on the manufacturing floor, with new sections on plastics and other new packaging materials, new testing procedures, and new coverage of MEMS devices. Covers all major types of electronics materials degradation and their causes, including dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, and failure of contacts and solder joints New updated sections on "failure physics," on mass transport-induced failure in copper and low-k dielectrics, and on reliability of lead-free/reduced-lead solder connections New chapter on testing procedures, sample handling and sample selection, and experimental design Coverage of new packaging materials, including plastics and composites
High Temperature Electronics
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Author : F. Patrick McCluskey
language : en
Publisher: CRC Press
Release Date : 2018-05-04
High Temperature Electronics written by F. Patrick McCluskey and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-05-04 with Technology & Engineering categories.
The development of electronics that can operate at high temperatures has been identified as a critical technology for the next century. Increasingly, engineers will be called upon to design avionics, automotive, and geophysical electronic systems requiring components and packaging reliable to 200 °C and beyond. Until now, however, they have had no single resource on high temperature electronics to assist them. Such a resource is critically needed, since the design and manufacture of electronic components have now made it possible to design electronic systems that will operate reliably above the traditional temperature limit of 125 °C. However, successful system development efforts hinge on a firm understanding of the fundamentals of semiconductor physics and device processing, materials selection, package design, and thermal management, together with a knowledge of the intended application environments. High Temperature Electronics brings together this essential information and presents it for the first time in a unified way. Packaging and device engineers and technologists will find this book required reading for its coverage of the techniques and tradeoffs involved in materials selection, design, and thermal management and for its presentation of best design practices using actual fielded systems as examples. In addition, professors and students will find this book suitable for graduate-level courses because of its detailed level of explanation and its coverage of fundamental scientific concepts. Experts from the field of high temperature electronics have contributed to nine chapters covering topics ranging from semiconductor device selection to testing and final assembly.
Reliability Engineering Technology Of Digital Diagnosis And Treatment Equipment
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Author : Xiuqing Li
language : en
Publisher: Springer Nature
Release Date : 2024-03-13
Reliability Engineering Technology Of Digital Diagnosis And Treatment Equipment written by Xiuqing Li and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-03-13 with Technology & Engineering categories.
This book focuses on the reliability engineering of medical devices, especially digital diagnosis and treatment equipment in China. It details the professional technologies and application methods of reliability design analysis, fault model analysis and reliability test of digital diagnosis and treatment equipment, to meet the needs of project undertakers of digital diagnosis and treatment equipment. From the three aspects: safety analysis and EMC design protection, material selection and control, and software engineering and quality, this book provides professional and technical ideas and methods of reliability for the quality problems prone to occur in the field of medical devices, as well as method guidance for readers. Meanwhile, it runs through the whole process of design, engineering, testing, production and management of all digital diagnosis and treatment equipment research and development enterprises and even product R & D enterprises in the field of medicaldevices. It is used as reading materials for personnel of testing institutions and evaluation institutions in medical devices.
Reliability Prediction For Microelectronics
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Author : Joseph B. Bernstein
language : en
Publisher: John Wiley & Sons
Release Date : 2024-02-13
Reliability Prediction For Microelectronics written by Joseph B. Bernstein and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-02-13 with Technology & Engineering categories.
RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
Lead Free Electronics
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Author : Sanka Ganesan
language : en
Publisher: John Wiley & Sons
Release Date : 2006-03-31
Lead Free Electronics written by Sanka Ganesan and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-03-31 with Technology & Engineering categories.
Lead-free Electronics provides guidance on the design and use of lead-free electronics as well as technical and legislative perspectives. All the complex challenges confronting the elec-tronics industry are skillfully addressed: * Complying with state legislation * Implementing the transition to lead-free electronics, including anticipating associated costs and potential supply chain issues * Understanding intellectual property issues in lead-free alloys and their applications, including licensing and infringement * Implementing cost effective manufacturing and testing * Reducing risks due to tin whiskers * Finding lead-free solutions in harsh environments such as in the automotive and telecommunications industries * Understanding the capabilities and limitations of conductive adhesives in lead-free interconnects * Devising solutions for lead-free, flip-chip interconnects in high-performance integrated circuit products Each chapter is written by leading experts in the field and carefully edited to ensure a consistent approach. Readers will find all the latest information, including the most recent data on cyclic thermomechanical deformation properties of lead-free SnAgCu alloys and a comparison of the properties of standard Sn-Pb versus lead-free alloys, using the energy partitioning approach. With legislative and market pressure to eliminate the use of lead in electronics manufacturing, this timely publication is essential reading for all engineers and professionals in the electronics industry.
Practical Reliability Engineering
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Author : Patrick D. T. O'Connor
language : en
Publisher: John Wiley & Sons
Release Date : 2025-05-06
Practical Reliability Engineering written by Patrick D. T. O'Connor and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-05-06 with Technology & Engineering categories.
A key reference for reliability professionals worldwide and widely adopted as a textbook by universities across many countries. This material also aligns with the Certified Reliability Engineer (CRE) curriculum set by the American Society for Quality (ASQ), making it a valuable resource for those preparing for the CRE certification. With a strong focus on practical engineering applications, the Sixth Edition of Practical Reliability Engineering continues to offer a balanced blend of reliability theory and real-world applications. This edition has been comprehensively updated to reflect the latest advancements in industry practices and state-of-the-art reliability engineering. Each chapter includes practical examples, and course instructors have access to a Solutions Manual and PowerPoint slides for training support available from the author at [email protected]. The sixth edition introduces several significant updates. Every chapter has been refreshed with new material, and two new chapters — Repairable Systems and Human Reliability — have been added. This edition also covers emerging topics in reliability engineering, such as prognostics and health management (PHM), Agile hardware development, the reliability challenges posed by the ongoing miniaturization of integrated circuits, and many more, ensuring that the content remains relevant to modern technological developments. Written by two highly qualified reliability professionals, each with decades of experience, this book covers nearly every aspect of reliability science and practice, making it a comprehensive reference guide. Practical Reliability Engineering has, over the years, helped to train multiple generations of reliability engineers and continues to be an essential resource for both emerging professionals and seasoned experts alike.
The Writers Directory
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Author :
language : en
Publisher:
Release Date : 2013
The Writers Directory written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with Authors, American categories.
Reliability Abstracts And Technical Reviews
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Author :
language : en
Publisher:
Release Date : 1969
Reliability Abstracts And Technical Reviews written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1969 with Reliability (Engineering) categories.