Material Characterization Using Ion Beams
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Material Characterization Using Ion Beams
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Author : J. Thomas
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Material Characterization Using Ion Beams written by J. Thomas and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Science categories.
The extensive use of low-energy accelerators in non-nuclear physics has now reached the stage where these activities are recognized as a natural field of investigation. Many other areas in physics and chemistry have undergone similarly spectacular development: beam foil spectroscopy in atomic physics, studies in atomic collisions, materials implantation, defects creation, nuclear microanalysis, and so on. Now, this most recent activity by itself and in its evident connec tion with the others has brought a new impetus to both the funda mental and the applied aspects of materials science. A summer school on "Material Characterization Using Ion Beams" has resulted from these developments and the realization that the use of ion beams is not restricted to accelerators but covers a wide energy range in the developing technology. The idea of the ion beam as a common denominator of many act1v1t1es dealing with surface and near-surface characterization was enthu siastically received by many scientists and a school on this subject received the positive endorsement of NATO. The Advanced Study Institute on Materials Science has assumed for us the status of an "institution" leading to better contact among the many laboratories engaged in this field. The fourth Institute in this series was held in Aleria, Corsica, between August 22 and September 12, 1976.
Materials Analysis By Ion Channeling
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Author : Leonard C. Feldman
language : en
Publisher: Academic Press
Release Date : 2012-12-02
Materials Analysis By Ion Channeling written by Leonard C. Feldman and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Technology & Engineering categories.
Our intention has been to write a book that would be useful to people with a variety of levels of interest in this subject. Clearly it should be useful to both graduate students and workers in the field. We have attempted to bring together many of the concepts used in channeling beam analysis with an indication of the origin of the ideas within fundamental channeling theory. The level of the book is appropriate to senior under-graduates and graduate students who have had a modern physics course work in related areas of materials science and wish to learn more about the "channeling" probe, its strengths, weaknesses, and areas of further potential application. To them we hope we have explained this apparent paradox of using mega-electron volt ions to probe solid state phenomena that have characteristic energies of electron volts.
Material Characterization Using Ion Beams
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Author : J Thomas
language : en
Publisher:
Release Date : 1978-01-01
Material Characterization Using Ion Beams written by J Thomas and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978-01-01 with categories.
Introduction To Focused Ion Beams
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Author : Lucille A. Giannuzzi
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-05-18
Introduction To Focused Ion Beams written by Lucille A. Giannuzzi and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-05-18 with Science categories.
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Swift Ion Beam Analysis In Nanosciences
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Author : Denis Jalabert
language : en
Publisher: John Wiley & Sons
Release Date : 2017-08-07
Swift Ion Beam Analysis In Nanosciences written by Denis Jalabert and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-08-07 with Technology & Engineering categories.
Swift ion beam analysis (IBA) of materials and their surfaces has been widely applied to many fields over the last half century, constantly evolving to meet new requirements and to take advantage of developments in particle detection and data treatment. Today, emerging fields in nanosciences introduce extreme demands to analysis methods at the nanoscale. This book addresses how analysis with swift ion beams is rising to meet such needs. Aimed at early stage researchers and established researchers wishing to understand how IBA can contribute to their analytical requirements in nanosciences, the basics of the interactions of charged particles with matter, as well as the operation of the relevant equipment, are first presented. Many recent examples from nanoscience research are then explored in which the specific analytical capabilities of IBA are emphasized, together with the place of IBA alongside the wealth of other analytical methods.
Ion Beam Analysis
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Author : Michael Nastasi
language : en
Publisher: CRC Press
Release Date : 2014-08-27
Ion Beam Analysis written by Michael Nastasi and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-08-27 with Science categories.
Ion Beam Analysis: Fundamentals and Applications explains the basic characteristics of ion beams as applied to the analysis of materials, as well as ion beam analysis (IBA) of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization.The book explains how ions interact with solids
Ion Beam Handbook For Material Analysis
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Author : James W. Mayer
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Ion Beam Handbook For Material Analysis written by James W. Mayer and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Science categories.
Ion Beam Handbook for Material Analysis emerged from the U.S.-Italy Seminar on Ion Beam Analysis of Near Surface Regions held at the Baia-Verde Hotel, Catania, June 17-20, 1974. The seminar was sponsored by the National Science Foundation and the Consiglio Nazionale delle Ricerche under the United States-Italy Cooperative Science Program. The book provides a useful collection of tables, graphs, and formulas for those involved in ion beam analysis. These tables, graphs, and formulas are divided into five chapters that cover the following topics: energy loss and energy straggling; backscattering spectrometry; channeling; applications of ion-induced nuclear reactions; and the use of ion-induced X-ray yields.
Electron Beam Analysis Of Materials
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Author : M. H. Loretto
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Electron Beam Analysis Of Materials written by M. H. Loretto and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Social Science categories.
The examination of materials using electron beam techniques has developed continuously for over twenty years and there are now many different methods of extracting detailed structural and chemical information using electron beams. These techniques which include electron probe microanalysis, trans mission electron microscopy, Auger spectroscopy and scanning electron microscopy have, until recently, developed more or less independently of each other. Thus dedicated instruments designed to optimize the performance for a specific application have been available and correspondingly most of the available textbooks tend to have covered the theory and practice of an individual technique. There appears to be no doubt that dedicated instru ments taken together with the specialized textbooks will continue to be the appropriate approach for some problems. Nevertheless the underlying electron-specimen interactions are common to many techniques and in view of the fact that a range of hybrid instruments is now available it seems appropriate to provide a broad-based text for users of these electron beam facilities. The aim of the present book is therefore to provide, in a reasonably concise form, the material which will allow the practitioner of one or more of the individual techniques to appreciate and to make use of the type of information which can be obtained using other electron beam techniques.
Materials Characterization For Systems Performance And Reliability
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Author : James W. McCauley
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-13
Materials Characterization For Systems Performance And Reliability written by James W. McCauley and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-13 with Technology & Engineering categories.
The Sagamore Army Materials Research Conferences have been held in the beautiful Adirondack Mountains of New York State since 1954. Organized and conducted by the Army Materials and Mechanics Research Center (Watertown, Massachusetts) in cooperation with Syracuse University, the Conferences have focused on key issues in Materials Science and Engineering that impact directly on current or future Army problem areas. A select group of speakers and attendees are assembled from academia, industry, and other parts of the Department of Defense and Government to provide an optimum forum for a full dialogue on the selected topic. This book is a collection of the full manuscripts of the formal presentations given at the Conference. The emergence and use of nontraditional materials and the excessive failures and reject rates of high technology, materials intensive engineering systems necessitates a new approach to quality control. Thus, the theme of this year's Thirty-First Conference, "Materials Characterization for Systems Performance and Reliability," was selected to focus on the need and mechanisms to transition from defect interrogation of materials after production to utilization of materials characterization during manufacturing. The guidance and help of the steering committee and the dedicated and conscientious efforts of Ms. Karen Ka100stian, Con ference Coordinator, and Mr. William K. Wilson, and Ms. Mary Ann Holmquist are gratefully acknowledged. The continued active interest and support of Dr. Edward S. Wright, Director, AMMRC; Dr. Robert W. Lewis, Associate Director, AMMRC; and COL L. C. Ross, Commander/ Deputy Director, AMMRC; are greatly appreciated.
Backscattering Spectrometry
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Author : Wei-Kan Chu
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Backscattering Spectrometry written by Wei-Kan Chu and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Science categories.
Backscattering Spectrometry reviews developments in backscattering spectrometry and covers topics ranging from instrumentation and experimental techniques to beam parameters and energy loss measurements. Backscattering spectrometry of thin films is also considered, and examples of backscattering analysis are given. This book is comprised of 10 chapters and begins with an introduction to backscattering spectrometry, what it can and what it cannot accomplish, and some ""rules of thumb"" for interpreting or reading spectra. The relative strengths and weaknesses of backscattering spectrometry in the framework of materials analysis are outlined. The following chapters focus on kinematics, scattering cross sections, energy loss, and energy straggling; backscattering analysis of thin films of various degrees of complications; the influence of beam parameters; and mass and depth resolutions and their relationships to the mass and energy of projectiles. Many examples of backscattering analysis are also presented to illustrate the capability and limitation of backscattering. Backscattering applications when combined with channeling effects are considered as well. The final chapter provides a list of references on the applications of backscattering spectrometry. This monograph will be a useful resource for physicists.