Materials Problem Solving With The Transmission Electron Microscope
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Materials Problem Solving With The Transmission Electron Microscope Volume 62
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Author : L. W. Hobbs
language : en
Publisher:
Release Date : 1986-10-20
Materials Problem Solving With The Transmission Electron Microscope Volume 62 written by L. W. Hobbs and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1986-10-20 with Technology & Engineering categories.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Scanning Transmission Electron Microscopy
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Author : Stephen J. Pennycook
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-03-24
Scanning Transmission Electron Microscopy written by Stephen J. Pennycook and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-03-24 with Technology & Engineering categories.
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Transmission Electron Microscopy And Diffractometry Of Materials
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Author : Brent Fultz
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-10-14
Transmission Electron Microscopy And Diffractometry Of Materials written by Brent Fultz and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-14 with Science categories.
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Topics In Electron Diffraction And Microscopy Of Materials
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Author : Peter. B Hirsch
language : en
Publisher: CRC Press
Release Date : 1999-01-01
Topics In Electron Diffraction And Microscopy Of Materials written by Peter. B Hirsch and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999-01-01 with Science categories.
Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work. The book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, using beam diffraction patterns to look at defects in structures, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, RHEED observations for MBE growth, and atomic level imaging applications.
Advances In Materials Problem Solving With The Electron Microscope Volume 589
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Author : Jim Bentley
language : en
Publisher:
Release Date : 2001
Advances In Materials Problem Solving With The Electron Microscope Volume 589 written by Jim Bentley and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Science categories.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Problem Solving With Microbeam Analysis
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Author : K. Kiss
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Problem Solving With Microbeam Analysis written by K. Kiss and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Science categories.
This book provides the reader with a working knowledge sufficient to select microbeam techniques for the efficient, cost-effective solution of complex problems arising in today's high-tech industries. Primarily written for the industrial analyst whose field of expertise is other than microbeam analysis, it will also be of help to engineers, plant chemists and industrial research scientists who often seek the aid of the microbeam analyst in their problem solving. Research and plant managers as well as administrators may also find this book helpful since they may be called upon to select and/or approve high-priced microbeam instruments.The book is organized into two parts. Part I gives a brief description of the various techniques and critically compares their capabilities and limitations. Part II consists of selected applications which show how the various techniques or their combinations are applied to characterize materials and to guide research in a wide variety of fields. The examples and case histories will undoubtedly aid the reader in problem solving, quality assurance and research-related tasks. Newcomers to the field will find enough information in the book to enable them to begin practical work and to apply the techniques.
Handbook Of Semiconductor Manufacturing Technology
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Author : Yoshio Nishi
language : en
Publisher: CRC Press
Release Date : 2017-12-19
Handbook Of Semiconductor Manufacturing Technology written by Yoshio Nishi and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-19 with Technology & Engineering categories.
Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.
Scanning Transmission Electron Microscopy
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Author : Alina Bruma
language : en
Publisher: CRC Press
Release Date : 2020-12-20
Scanning Transmission Electron Microscopy written by Alina Bruma and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-12-20 with Computers categories.
Scanning Transmission Electron Microscopy is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.
Specimen Preparation For Transmission Electron Microscopy Of Materials
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Author : John C. Bravman
language : en
Publisher:
Release Date : 1988
Specimen Preparation For Transmission Electron Microscopy Of Materials written by John C. Bravman and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1988 with Science categories.
Materials Research Society Proceedings List (vol. 1-115)
Specimen Preparation For Transmission Electron Microscopy Of Materials
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Author :
language : en
Publisher:
Release Date : 1991
Specimen Preparation For Transmission Electron Microscopy Of Materials written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with Electron microscopy categories.