Materials Reliability In Microelectronics Iv Volume 338
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Materials Reliability In Microelectronics Iv
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Author : Materials Research Society. Spring Meeting
language : en
Publisher:
Release Date : 1994
Materials Reliability In Microelectronics Iv written by Materials Research Society. Spring Meeting and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Electrodiffusion categories.
Materials Reliability In Microelectronics Iv Volume 338
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Author : Peter Børgesen
language : en
Publisher: Materials Research Society
Release Date : 1994-10-19
Materials Reliability In Microelectronics Iv Volume 338 written by Peter Børgesen and has been published by Materials Research Society this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994-10-19 with Technology & Engineering categories.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Materials Reliability In Microelectronics Vii Volume 473
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Author : J. Joseph Clement
language : en
Publisher:
Release Date : 1997-10-20
Materials Reliability In Microelectronics Vii Volume 473 written by J. Joseph Clement and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1997-10-20 with Technology & Engineering categories.
The inexorable drive for increased integrated circuit functionality and performance places growing demands on the metal and dielectric thin films used in fabricating these circuits, as well as spurring demand for new materials applications and processes. This book directly addresses issues of widespread concern in the microelectronics industry - smaller feature sizes, new materials and new applications that challenge the reliability of new technologies. While the book continues the focus on issues related to interconnect reliability, such as electromigration and stress, particular emphasis is placed on the effects of microstructure. An underlying theme is understanding the importance of interactions among different materials and associated interfaces comprising a single structure with dimensions near or below the micrometer scale. Topics include: adhesion and fracture; gate oxide growth and oxide interfaces; surface preparation and gate oxide reliability; oxide degradation and defects; micro-structure, texture and reliability; novel measurement techniques; interconnect performance and reliability modeling; electromigration and interconnect reliability and stress and stress relaxation.
Materials Reliability In Microelectronics Vi Volume 428
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Author : William F. Filter
language : en
Publisher:
Release Date : 1996-11-18
Materials Reliability In Microelectronics Vi Volume 428 written by William F. Filter and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996-11-18 with Technology & Engineering categories.
MRS books on materials reliability in microelectronics have become the snapshot of progress in this field. Reduced feature size, increased speed, and larger area are all factors contributing to the continual performance and functionality improvements in integrated circuit technology. These same factors place demands on the reliability of the individual components that make up the IC. Achieving increased reliability requires an improved understanding of both thin-film and patterned-feature materials properties and their degradation mechanisms, how materials and processes used to fabricate ICs interact, and how they may be tailored to enable reliability improvements. This book focuses on the physics and materials science of microelectronics reliability problems rather than the traditional statistical, accelerated electrical testing aspects. Studies are grouped into three large sections covering electromigration, gate oxide reliability and mechanical stress behavior. Topics include: historical summary; reliability issues for Cu metallization; characterization of electromigration phenomena; modelling; microstructural evolution and influences; oxide and device reliability; thin oxynitride dielectrics; noncontact diagnostics; stress effects in thin films and interconnects and microbeam X-ray techniques for stress measurements.
Solid State Ionics Iv Volume 369
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Author : Gholam-Abbas Nazri
language : en
Publisher:
Release Date : 1995-07-05
Solid State Ionics Iv Volume 369 written by Gholam-Abbas Nazri and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995-07-05 with Science categories.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Microwave Processing Of Materials Iv
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Author : Magdy F. Iskander
language : en
Publisher:
Release Date : 1994
Microwave Processing Of Materials Iv written by Magdy F. Iskander and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Technology & Engineering categories.
Scintillator And Phosphor Materials Volume 348
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Author : Marvin J. Weber
language : en
Publisher:
Release Date : 1994-11-25
Scintillator And Phosphor Materials Volume 348 written by Marvin J. Weber and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994-11-25 with Science categories.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Materials Issues In Art And Archaeology Iv
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Author : Pamela B. Vandiver
language : en
Publisher:
Release Date : 1995
Materials Issues In Art And Archaeology Iv written by Pamela B. Vandiver and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Antiques & Collectibles categories.
Ferroelectric Thin Films Iv Volume 361
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Author : Bruce Tuttle
language : en
Publisher:
Release Date : 1995-08-08
Ferroelectric Thin Films Iv Volume 361 written by Bruce Tuttle and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995-08-08 with Technology & Engineering categories.
Papers from the fall 1994 symposium present research and developments from academia, government, organizations, and industry in ferroelectric thin films, organized in sections on characterization, layered structure ferroelectrics, photonic phenomena, process integration, dram thin film technology, solution deposition, and piezoelectric and IR thin film technology. Highlights include the first public technical disclosures of Y1 nonvolatile memory material. Annotation copyright by Book News, Inc., Portland, OR
Materials For Smart Systems Volume 360
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Author : Easo P. George
language : en
Publisher:
Release Date : 1995-03-28
Materials For Smart Systems Volume 360 written by Easo P. George and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995-03-28 with Technology & Engineering categories.
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.