Microcircuit Device Reliability Digital Evaluation And Generic Failure Analysis Data
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Digital Evaluation And Failure Analysis Data
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Author : David B. Nicholls
language : en
Publisher:
Release Date : 1980
Digital Evaluation And Failure Analysis Data written by David B. Nicholls and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1980 with Digital integrated circuits categories.
Microcircuit Device Reliability Digital Evaluation And Generic Failure Analysis Data
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Author : David B. Nicholls
language : en
Publisher:
Release Date : 1979
Microcircuit Device Reliability Digital Evaluation And Generic Failure Analysis Data written by David B. Nicholls and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1979 with categories.
This report of digital evaluation and generic failure analysis data is one of a series of annual microcircuit device reliability data publications compiled by the Reliability Analysis Center. This compendium provides burn-in and environmental/screening data on SSI and MSI digital microcircuits. Each document in the series contains analyzed reliability information in addition to a detailed presentation of field and test results. This information aids in determining device fallout rates and the operational test and field characteristics of devices. Life test results can be reviewed. The relative risks of screening decisions may also be determined. Additionally, information is available to form the foundation for failure mode effects and criticality analyses(FMECA). Through the data presented, these publications are intended to actively complement such publications as MIL-STD-883 and MIL-HDBK-217B. The user is cautioned, however, that the listed data may not be used in lieu of contractually cited references.
Microcircuit Device Reliability
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Author :
language : en
Publisher:
Release Date : 1984
Microcircuit Device Reliability written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1984 with Integrated circuits categories.
Technical Abstract Bulletin
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Author :
language : en
Publisher:
Release Date :
Technical Abstract Bulletin written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on with Science categories.
Microcircuit Device Reliability
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Author : Kieron A. Dey
language : en
Publisher:
Release Date : 1981
Microcircuit Device Reliability written by Kieron A. Dey and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1981 with Computer storage devices categories.
This book contains data on memory and digital LSI device failure rates. The raw data is presented as well as a series of summaries designed to bring out the salient points. Where possible, graphical aids are used to depict the data. Comparison of predicted with observed failure rates is given, predictions being carried out to MIL-HDBK-217C. This book includes a new section on failure analysis results not included in previous editions. (Author).
R D Abstracts
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Author : Technology Reports Centre (Great Britain)
language : en
Publisher:
Release Date : 1979
R D Abstracts written by Technology Reports Centre (Great Britain) and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1979 with categories.
Digital Evaluation And Generic Failure Analysis Data
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Author : David B. Nicholls
language : en
Publisher:
Release Date : 1979
Digital Evaluation And Generic Failure Analysis Data written by David B. Nicholls and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1979 with Integrated circuits categories.
Nonelectronic Parts Reliability Data
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Author : Robert G. Arno
language : en
Publisher:
Release Date : 1981
Nonelectronic Parts Reliability Data written by Robert G. Arno and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1981 with Reliability (Engineering) categories.
This report, organized in four major sections, presents reliability information based on field operation, dormant state and test data for more than 250 major nonelectronic part types. The four sections are Generic Data, Detailed Data, Application Data, and failure Modes and Mechanisms. Each device type contains reliability information in relation to the specific operational environments. (Author).
Government Reports Announcements Index
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Author :
language : en
Publisher:
Release Date : 1979-06
Government Reports Announcements Index written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1979-06 with Science categories.
Evaluation Engineering
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Author :
language : en
Publisher:
Release Date : 1982
Evaluation Engineering written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1982 with Electronic apparatus and appliances categories.