Microelectronics Failure Analysis
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Microelectronics Failure Analysis
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Author : EDFAS Desk Reference Committee
language : en
Publisher: ASM International
Release Date : 2011
Microelectronics Failure Analysis written by EDFAS Desk Reference Committee and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011 with Technology & Engineering categories.
Includes bibliographical references and index.
Microelectronics Fialure Analysis Desk Reference Seventh Edition
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Author : Tejinder Gandhi
language : en
Publisher: ASM International
Release Date : 2019-11-01
Microelectronics Fialure Analysis Desk Reference Seventh Edition written by Tejinder Gandhi and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-11-01 with Technology & Engineering categories.
The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This book is geared to practicing engineers and for studies in the major area of power plant engineering. For non-metallurgists, a chapter has been devoted to the basics of material science, metallurgy of steels, heat treatment, and structure-property correlation. A chapter on materials for boiler tubes covers composition and application of different grades of steels and high temperature alloys currently in use as boiler tubes and future materials to be used in supercritical, ultra-supercritical and advanced ultra-supercritical thermal power plants. A comprehensive discussion on different mechanisms of boiler tube failure is the heart of the book. Additional chapters detailing the role of advanced material characterization techniques in failure investigation and the role of water chemistry in tube failures are key contributions to the book.
Microelectronics Failure Analysis
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Author :
language : en
Publisher: ASM International
Release Date : 2004-01-01
Microelectronics Failure Analysis written by and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-01-01 with Technology & Engineering categories.
For newcomers cast into the waters to sink or swim as well as seasoned professionals who want authoritative guidance desk-side, this hefty volume updates the previous (1999) edition. It contains the work of expert contributors who rallied to the job in response to a committee's call for help (the committee was assigned to the update by the Electron
Microelectronic Failure Analysis
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Author : Richard J. Ross
language : en
Publisher: ASM International(OH)
Release Date : 1999
Microelectronic Failure Analysis written by Richard J. Ross and has been published by ASM International(OH) this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999 with Education categories.
Forty-seven papers on electronics failure analysis provide an overview for newcomers to the field and a reference tool for the experienced analyst. Topics include electron/ion bean-based techniques, deprocessing and sample preparation, and physical/chemical defect characterization. For the fourth ed
Microelectronics Failure Analysis Techniques
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Author : General Electric Company, Electronics Laboratory
language : en
Publisher:
Release Date : 1980
Microelectronics Failure Analysis Techniques written by General Electric Company, Electronics Laboratory and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1980 with Fracture mechanics categories.
The objective of this procedural guide was not to present an expose of device failure modes/mechanisms and applicable techniques for detection, identification and measurement but rather to provide a treatise on proven failure analysis techniques, equipment, procedures and expected analytical results. The guide thus represents a compilation and description of practical semiconductor failure analysis techniques rather than failure analysis flow sequences for verifying specific device failure mechanisms. (Author).
Microelectronic Failure Analysis
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Author :
language : en
Publisher: ASM International
Release Date : 2002-01-01
Microelectronic Failure Analysis written by and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-01-01 with Technology & Engineering categories.
Provides new or expanded coverage on the latest techniques for microelectronic failure analysis. The CD-ROM includes the complete content of the book in fully searchable Adobe Acrobat format. Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee
Microelectronic Failure Analysis Desk Reference
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Author :
language : en
Publisher: ASM International
Release Date : 2001-01-01
Microelectronic Failure Analysis Desk Reference written by and has been published by ASM International this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-01-01 with Technology & Engineering categories.
Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee.
Microelectronic Failure Analysis
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Author : The Materials Information Society
language : en
Publisher:
Release Date : 2001
Microelectronic Failure Analysis written by The Materials Information Society and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Electronic apparatus and appliances categories.
Microelectronic Failure Analysis
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Author : Thomas W. Lee
language : en
Publisher:
Release Date : 1991
Microelectronic Failure Analysis written by Thomas W. Lee and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with Electronic apparatus and appliances categories.
Thirty Fourth International Symposium For Testing And Failure Analysis
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Author : ASM International
language : en
Publisher: ASM International(OH)
Release Date : 2008-01-01
Thirty Fourth International Symposium For Testing And Failure Analysis written by ASM International and has been published by ASM International(OH) this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-01-01 with Electronic apparatus and appliances categories.