Modeling Gallium Nitride Based High Electron Mobility Transistors
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Modeling Gallium Nitride Based High Electron Mobility Transistors
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Author : Ujwal Radhakrishna
language : en
Publisher:
Release Date : 2016
Modeling Gallium Nitride Based High Electron Mobility Transistors written by Ujwal Radhakrishna and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016 with categories.
Gallium-Nitride-based high electron mobility transistor (HEMTs) technology is increasingly finding space in high voltage (HV) and high frequency (HF) circuit application domains. The superior breakdown electric field, high electron mobility, and high temperature performance of GaN HEMTs are the key factors for its use as HV switches in converters and active components of RF-power amplifiers. Designing circuits in both application regimes requires accurate compact device models that are grounded in physics and can describe the non-linear terminal characteristics. Currently available compact models for HEMTs are empirical and hence are lacking in physical description of the device, which becomes a handicap in understanding key device-circuit interactions and in accurate estimation of device behavior in circuits. This thesis seeks to develop a physics-based compact model for GaN HEMTs from first principles which can be used as a design tool for technology optimization to identify device-performance bottlenecks on one hand and as a tool for circuit design to investigate the impact of behavioral nuances of the device on circuit performance, on the other. Part of this thesis consists of demonstrations of the capabilities of the model to accurately predict device characteristics such as terminal DC- and pulsed-currents, charges, small-signal S-parameters, large-signal switching characteristics, load-pull, source-pull and power-sweep, inter-modulation-distortion and noise-figure of both HV- and RF-devices. The thesis also aims to tie device-physics concepts of carrier transport and charge distribution in GaN HEMTs to circuit-design through circuit-level evaluation. In the HV-application regime benchmarking is conducted against switching characteristics of a GaN DC-DC converter to understand the impact of device capacitances, field plates, temperature and charge-trapping on switching slew rates. In the RF-application regime validation is done against the large-signal characteristics of GaN-power amplifiers to study the output-power, efficiency and compression characteristics as function of class-of-operation. Noise-figure of low-noise amplifiers is tested to estimate the contributions of device-level noise sources, and validation against switching frequency and phase-noise characteristics of voltage-controlled oscillators is done to evaluate the noise performance of GaN HEMT technology. Evaluation of model-accuracy in determining the conversion-efficiency of RF-converters and linearity metrics of saturated non-linear amplifiers is carried out. The key contribution of this work is to provide a tool in the form of a physics-based compact model to device-technology-engineers and circuit-designers, who can use it to evaluate the potential strengths and weaknesses of the emerging GaN technology.
A Compact Transport And Charge Model For Gan Based High Electron Mobility Transistors For Rf Applications
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Author : Ujwal Radhakrishna
language : en
Publisher:
Release Date : 2013
A Compact Transport And Charge Model For Gan Based High Electron Mobility Transistors For Rf Applications written by Ujwal Radhakrishna and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with categories.
Gallium Nitride (GaN)-based high electron mobility transistors (HEMTs) are rapidly emerging as front-runners in high-power mm-wave circuit applications. For circuit design with current devices and to allow sensible future performance projections from device engineering in such a rapidly evolving technology, compact device models are essential. In this thesis, a physics-based compact model is developed for short channel GaN HEMTs. The model is based on the concept of virtual source (VS) transport originally developed for scaled silicon field effect transistors. Self-consistent current and charge expressions in the model require very few parameters. The parameters have straightforward physical meanings and can be extracted through independent measurements. The model is implemented in Verilog-A and is compatible with state of the art circuit simulators. The new model is calibrated and validated with experimental DC I-V and S-parameter measurements of fabricated devices. Using the model, a projection of cut-off frequency (f-[tau]) of GaN-based HEMTs with scaling is performed to highlight performance bottlenecks.
Modeling And Simulation Of Gan Based High Electron Mobility Transistors
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Author : Elias W. Faraclas
language : en
Publisher:
Release Date : 2006
Modeling And Simulation Of Gan Based High Electron Mobility Transistors written by Elias W. Faraclas and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006 with categories.
Advanced Spice Model For Gan Hemts Asm Hemt
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Author : Sourabh Khandelwal
language : en
Publisher: Springer Nature
Release Date : 2022-01-01
Advanced Spice Model For Gan Hemts Asm Hemt written by Sourabh Khandelwal and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-01-01 with Technology & Engineering categories.
This book discusses in detail the Advanced SPICE Model for GaN HEMTs (ASM-HEMT), a new industry standard model for GaN-based power and RF circuit design. The author describes this new, standard model in detail, covering the different components of the ASM GaN model from fundamental derivations to the implementation in circuit simulation tools. The book also includes a detailed description of parameter extraction steps and model quality tests, which are critically important for effective use of this standard model in circuit simulation and product design. Coverage includes both radio-frequency (RF), and power electronics applications of this model. Practical issues related to measurement data and parameter extraction flow are also discussed, enabling readers easily to adopt this new model for design flow and simulation tools. Describes in detail a new industry standard for GaN-based power and RF circuit design; Includes discussion of practical problems and their solutions in GaN device modeling; Covers both radio-frequency (RF) and power electronics application of GaN technology; Describes modeling of both GaN RF and power devices.
Basic Equations For The Modeling Of Gallium Nitride Gan High Electron Mobility Transistors Hemts
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Author : National Aeronautics and Space Administration (NASA)
language : en
Publisher: Createspace Independent Publishing Platform
Release Date : 2018-05-29
Basic Equations For The Modeling Of Gallium Nitride Gan High Electron Mobility Transistors Hemts written by National Aeronautics and Space Administration (NASA) and has been published by Createspace Independent Publishing Platform this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-05-29 with categories.
Gallium nitride (GaN) is a most promising wide band-gap semiconductor for use in high-power microwave devices. It has functioned at 320 C, and higher values are well within theoretical limits. By combining four devices, 20 W has been developed at X-band. GaN High Electron Mobility Transistors (HEMTs) are unique in that the two-dimensional electron gas (2DEG) is supported not by intentional doping, but instead by polarization charge developed at the interface between the bulk GaN region and the AlGaN epitaxial layer. The polarization charge is composed of two parts: spontaneous and piezoelectric. This behavior is unlike other semiconductors, and for that reason, no commercially available modeling software exists. The theme of this document is to develop a self-consistent approach to developing the pertinent equations to be solved. A Space Act Agreement, "Effects in AlGaN/GaN HEMT Semiconductors" with Silvaco Data Systems to implement this approach into their existing software for III-V semiconductors, is in place (summer of 2002).Freeman, Jon C.Glenn Research CenterGALLIUM NITRIDES; FIELD EFFECT TRANSISTORS; HIGH ELECTRON MOBILITY TRANSISTORS; ENERGY GAPS (SOLID STATE); MICROWAVE EQUIPMENT; POLARIZATION (CHARGE SEPARATION); PIEZOELECTRICITY
Hemt Technology And Applications
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Author : Trupti Ranjan Lenka
language : en
Publisher: Springer Nature
Release Date : 2022-06-23
Hemt Technology And Applications written by Trupti Ranjan Lenka and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-06-23 with Technology & Engineering categories.
This book covers two broad domains: state-of-the-art research in GaN HEMT and Ga2O3 HEMT. Each technology covers materials system, band engineering, modeling and simulations, fabrication techniques, and emerging applications. The book presents basic operation principles of HEMT, types of HEMT structures, and semiconductor device physics to understand the device behavior. The book presents numerical modeling of the device and TCAD simulations for high-frequency and high-power applications. The chapters include device characteristics of HEMT including 2DEG density, Id-Vgs, Id-Vds, transconductance, linearity, and C-V. The book emphasizes the state-of-the-art fabrication techniques of HEMT and circuit design for various applications in low noise amplifier, oscillator, power electronics, and biosensor applications. The book focuses on HEMT applications to meet the ever-increasing demands of the industry, innovation in terms of materials, design, modeling, simulation, processes, and circuits. The book will be primarily helpful to undergraduate/postgraduate, researchers, and practitioners in their research.
Basic Equations For The Modeling Of Gallium Nitride Gan High Electron Mobility Transistors Hemts
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Author :
language : en
Publisher:
Release Date : 2003
Basic Equations For The Modeling Of Gallium Nitride Gan High Electron Mobility Transistors Hemts written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003 with categories.
Physics Based Virtual Source Compact Model Of Gallium Nitride High Electron Mobility Transistors
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Author : Hao Zhang
language : en
Publisher:
Release Date : 2017
Physics Based Virtual Source Compact Model Of Gallium Nitride High Electron Mobility Transistors written by Hao Zhang and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017 with Gallium nitride categories.
Gallium Nitride (GaN) based high electron mobility transistors (HEMTs) outperform Gallium Arsenide (GaAs) and silicon based transistors for radio frequency (RF) applications in terms of output power and efficiency due to its large bandgap (~3.4 eV@300 K) and high carrier mobility property (1500 - 2300 cm^2/(V-s)). These advantages have made GaN technology a promising candidate for future high-power microwave and potential millimeter-wave applications. Current GaN HEMT models used by the industry, such as Angelov Model, EEHEMT Model and DynaFET (Dynamic FET) model, are empirical or semi-empirical. Lacking the physical description of the device operations, these empirical models are not directly scalable. Circuit design that uses the models requires multiple iterations between the device and circuit levels, becoming a lengthy and expensive process. Conversely existing physics based models, such as surface potential model, are computationally intensive and thus impractical for full scale circuit simulation and optimization. To enable efficient GaN-based RF circuit design, computationally efficient physics based compact models are required. In this thesis, a physics based Virtual Source (VS) compact model is developed for GaN HEMTs targeting RF applications. While the intrinsic current and charge model are developed based on the Virtual Source model originally proposed by MIT researchers, the gate current model and parasitic element network are proposed based on our applications with a new efficient parameter extraction flow. Both direct current (DC) of drain and gate currents and RF measurements are conducted for model parameter extractions. The new flow first extracts device parasitic resistive values based on the DC measurement of gate current. Then parameters related with the intrinsic region are determined based on the transport characteristics in the subthreshold and above threshold regimes. Finally, the parasitic resistance, capacitance and inductance values are optimized based on the S-parameter measurement. This new extraction flow provides reliable and accurate extraction for parasitic element values while achieving reasonable resolutions holistically with both DC and RF characteristics. The model is validated against measurement data in terms of drain current, gate current and scattering parameter (S-parameter). This model provides simple yet clear physical description for GaN HEMTs with only a short list of model parameters compared with other empirical or physics based models. It can be easily integrated in circuit simulators for RF circuit design.
Two Dimensional Modeling Of Aluminum Gallium Nitride Gallium Nitride High Electron Mobility Transistor
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Author : Kenneth L. Holmes
language : en
Publisher:
Release Date : 2002-06-01
Two Dimensional Modeling Of Aluminum Gallium Nitride Gallium Nitride High Electron Mobility Transistor written by Kenneth L. Holmes and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-06-01 with categories.
Gallium Nitride (GaN) High Electron Mobility Transistors (HEMT's) are microwave power devices that have the performance characteristics to improve the capabilities of current and future Navy radar and communication systems. The Office of Naval Research (ONR) is funding research for the development of GaN- based microwave power amplifiers for use in future radar and communication systems. This thesis studies the effects of AIGaN/GaN HEMTs' polarization, piezoelectric (PZ) and spontaneous, properties utilizing the TM commercially available Silvaco Atlas software for modeling and simulation. The polarization properties are suspected to enhance the two-dimensional electron gas (2DEG) at the AIGaN/GaN interface.
Industrialization Of The Developing Countries Basic Problems And Issues For Action
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Author :
language : en
Publisher:
Release Date : 1974
Industrialization Of The Developing Countries Basic Problems And Issues For Action written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1974 with categories.