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Non Contact Probes


Non Contact Probes
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Non Contact Probes


Non Contact Probes
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Author : Cosan Caglayan
language : en
Publisher:
Release Date : 2016

Non Contact Probes written by Cosan Caglayan and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016 with categories.


A novel, non-contact metrology approach for on-wafer characterization of sub-mmW devices, components, and integrated circuits (ICs) is presented. Conventional contact probes are extremely limited for sub-mmW measurements due to increasing losses and inherently large parasitics. They are also very costly and suffer from physical fragility issues. As such, device testing in the 0.3-3 THz remains a specialty of few research groups that can shoulder the high cost of operating and maintaining such setups. Unlike existing contact probes which rely on fragile tips and physical contact with the device on the chip, the new non-contact probes are based on electromagnetic coupling of vector network analyzer (VNA) test ports into the coplanar waveguide (CPW) environment of the integrated devices and circuits. Efficient signal coupling is achieved via a quasi-optical link between the VNA ports and planar antennas that are monolithically integrated with the device-under-test. The test chip is then interfaced with an extended hemispherical lens on the back side to collimate the VNA port signals onto the non-contact probe antennas. These antennas act as "virtual'' probe-tips on the test chip and connect to the device through optimized, impedance matched CPW lines. Radiation patterns and the impedance performance of the probe antennas are optimized using in-house moment method tools for robust and broadband quasi-optical coupling of the VNA ports. Repeatable errors of the non-contact probe setup are calibrated using on-wafer standards, allowing for accurate S-parameter measurements. Experimental validation of the new non-contact device metrology system is presented via measurement of 1-port and 2-port devices in the 90-750 GHz band. Demonstration of active non-contact probes is carried out by characterization of an on-chip integrated Schottky diode. Moreover, differential-mode on-wafer measurements beyond 110 GHz are presented for the first time. Owing to the non-contact nature, the proposed approach is free from wear and tear and fragility issues. More importantly, they are low-cost and can be easily scaled beyond 1 THz where there is no existing solution for on-chip device and IC testing.



Development Of Non Contact Probe For Continuous Measurement Of Surface Inclination And Position Using Dynamic Irradiation Of Light Beam


Development Of Non Contact Probe For Continuous Measurement Of Surface Inclination And Position Using Dynamic Irradiation Of Light Beam
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Author : Kee Sein Lee
language : en
Publisher:
Release Date : 1992

Development Of Non Contact Probe For Continuous Measurement Of Surface Inclination And Position Using Dynamic Irradiation Of Light Beam written by Kee Sein Lee and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1992 with categories.




Non Contact Probes For Characterization Of Thz Devices And Components


Non Contact Probes For Characterization Of Thz Devices And Components
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Author : Mads Jacob Hedegaard Larsen
language : en
Publisher:
Release Date : 2013

Non Contact Probes For Characterization Of Thz Devices And Components written by Mads Jacob Hedegaard Larsen and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with Probes (Electronic instruments) categories.


One of the challenges in developing semiconductor devices and integrated circuits for the terahertz (THz) region is their electrical characterization. The most common technology for their characterization is presently metal-to-metal, DC-coupled contact probes, which operate up to 750 GHz but are expensive and fragile. In this Master’s Thesis, we investigate through numerical simulation and analysis the electromagnetic properties of a novel, AC-coupled probe. The new probe couples radiation from the device or circuit-under-test (DUT) via polarization current, which is then transformed to conduction current in the probe and down-converted in frequency to baseband by an optically-pumped photomixer. Finite-element simulations using High Frequency Structure Simulator (HFSS) yield an optimum narrowband designs for probing devices and circuits in coplanar waveguide (CPW), with DUT-to-photomixer coupling efficiencies between -10 and -20 dB between 300 and 600 GHz. A broadband designs shows promising performance up to 1300 GHz in an operating band of 1000 GHz.



A Non Contacting Probe For Measurments On High Frequency Planar Circuits


A Non Contacting Probe For Measurments On High Frequency Planar Circuits
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Author : Samuel Seth Osofsky
language : en
Publisher:
Release Date : 1991

A Non Contacting Probe For Measurments On High Frequency Planar Circuits written by Samuel Seth Osofsky and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1991 with Dissertations, Academic categories.




High Frequency Gan Electronic Devices


High Frequency Gan Electronic Devices
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Author : Patrick Fay
language : en
Publisher: Springer
Release Date : 2019-08-01

High Frequency Gan Electronic Devices written by Patrick Fay and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-08-01 with Technology & Engineering categories.


This book brings together recent research by scientists and device engineers working on both aggressively-scaled conventional transistors as well as unconventional high-frequency device concepts in the III-N material system. Device concepts for mm-wave to THz operation based on deeply-scaled HEMTs, as well as distributed device designs based on plasma-wave propagation in polarization-induced 2DEG channels, tunneling, and hot-carrier injection are discussed in detail. In addition, advances in the underlying materials science that enable these demonstrations, and advancements in metrology that permit the accurate characterization and evaluation of these emerging device concepts are also included. Targeting readers looking to push the envelope in GaN-based electronics device research, this book provides a current, comprehensive treatment of device concepts and physical phenomenology suitable for applying GaN and related materials to emerging ultra-high-frequency applications. Offers readers an integrated treatment of the state of the art in both conventional (i.e., HEMT) scaling as well as unconventional device architectures suitable for amplification and signal generation in the mm-wave and THz regime using GaN-based devices, written by authors that are active and widely-known experts in the field; Discusses both conventional scaled HEMTs (into the deep mm-wave) as well as unconventional approaches to address the mm-wave and THz regimes; Provides “vertically integrated” coverage, including materials science that enables these recent advances, as well as device physics & design, and metrology techniques; Includes fundamental physics, as well as numerical simulations and experimental realizations.



Non Contact Gaging With Laser Probe


Non Contact Gaging With Laser Probe
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Author :
language : en
Publisher:
Release Date : 2009

Non Contact Gaging With Laser Probe written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009 with categories.


A gage has been constructed using conventional (high end) components for the application of measuring fragile syntactic foam parts in a non-contact mode. Success with this approach has been achieved through a novel method of transferring (mapping) high accuracy local measurements of a coated aluminum master, taken on a Leitz Coordinate Measurement Machine (CMM), to the gage software system. The mapped data is then associated with local voltage readings from two (inner and outer) laser triangulating probes. This couples discreet laser probe offset and linearity characteristics to the measured master geometry. The gage software compares real part measured data against the master data to provide non-contact part inspection that results in a high accuracy and low uncertainty performance. Uncertainty from the part surface becomes the prevailing contributor to the gaging process. The gaging process provides a high speed, hands off measurement with nearly zero impedance.



Process Analytical Technology


Process Analytical Technology
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Author : Katherine A. Bakeev
language : en
Publisher: John Wiley & Sons
Release Date : 2010-04-01

Process Analytical Technology written by Katherine A. Bakeev and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-04-01 with Science categories.


Process Analytical Technology explores the concepts of PAT and its application in the chemical and pharmaceutical industry from the point of view of the analytical chemist. In this new edition all of the original chapters have been updated and revised, and new chapters covering the important topics of sampling, NMR, fluorescence, and acoustic chemometrics have been added. Coverage includes: Implementation of Process Analytical Technologies UV-Visible Spectroscopy for On-line Analysis Infrared Spectroscopy for Process Analytical Applications Process Raman Spectroscopy Process NMR Spectrscopy: Technology and On-line Applications Fluorescent Sensing and Process Analytical Applications Chemometrics in Process Analytical Technology (PAT) On-Line PAT Applications of Spectroscopy in the Pharmaceutical Industry Future Trends for PAT for Increased Process Understanding and Growing Applications in Biomanufacturing NIR Chemical Imaging This volume is an important starting point for anyone wanting to implement PAT and is intended not only to assist a newcomer to the field but also to provide up-to-date information for those who practice process analytical chemistry and PAT. It is relevant for chemists, chemical and process engineers, and analytical chemists working on process development, scale-up and production in the pharmaceutical, fine and specialty chemicals industries, as well as for academic chemistry, chemical engineering, chemometrics and pharmaceutical science research groups focussing on PAT. Review from the First Edition “The book provides an excellent first port of call for anyone seeking material and discussions to understand the area better. It deserves to be found in every library that serves those who are active in the field of Process Analytical Technology.”—Current Engineering Practice



A Fixtureless Approach To High Precision Non Contact Dimensional Inspection Of Freeform Parts


A Fixtureless Approach To High Precision Non Contact Dimensional Inspection Of Freeform Parts
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Author : Vijay Srivatsan
language : en
Publisher:
Release Date : 2006

A Fixtureless Approach To High Precision Non Contact Dimensional Inspection Of Freeform Parts written by Vijay Srivatsan and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006 with categories.




Geometric Tolerances


Geometric Tolerances
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Author : Bianca M. Colosimo
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-11-01

Geometric Tolerances written by Bianca M. Colosimo and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-11-01 with Technology & Engineering categories.


Geometric tolerances are changing the way we design and manufacture industrial products. Geometric Tolerances covers their impact on the world of design and production, highlighting new perspectives, possibilities, current issues and future challenges. The topics covered are designed to be relevant to readers from a variety of backgrounds, ranging from product designers and manufacturers to quality inspection engineers and quality engineers involved in statistical process monitoring. Areas included are: • selection of appropriate geometric tolerances and how they stack up in assembled products; • inspection of parts subjected to geometric tolerancing from the macro to the micro and sub-micro scales; and • enhancement of efficiency and efficacy of quality monitoring. Geometric Tolerances provides the reader with the most recent scientific research in the field, as well as with a significant amount of real-life industrial case studies, delivering a multidisciplinary, synoptic view of one of the hottest and most strategic topics in industrial production.



Laser Ultrasonics Techniques And Applications


Laser Ultrasonics Techniques And Applications
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Author : L.E Drain
language : en
Publisher: Routledge
Release Date : 2019-01-22

Laser Ultrasonics Techniques And Applications written by L.E Drain and has been published by Routledge this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-01-22 with Science categories.


The first book devoted to laser techniques in the generation and reception of ultrasonic waves in materials, Laser Ultrasonics: Techniques and Applications provides a full description of the state of the art in all fields involving both lasers and ultrasonics. This practical book focuses mainly on the possible applications of the techniques, yet th