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Non Contact Probes For Characterization Of Thz Devices And Components


Non Contact Probes For Characterization Of Thz Devices And Components
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Non Contact Probes For Characterization Of Thz Devices And Components


Non Contact Probes For Characterization Of Thz Devices And Components
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Author : Mads Jacob Hedegaard Larsen
language : en
Publisher:
Release Date : 2013

Non Contact Probes For Characterization Of Thz Devices And Components written by Mads Jacob Hedegaard Larsen and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013 with Probes (Electronic instruments) categories.


One of the challenges in developing semiconductor devices and integrated circuits for the terahertz (THz) region is their electrical characterization. The most common technology for their characterization is presently metal-to-metal, DC-coupled contact probes, which operate up to 750 GHz but are expensive and fragile. In this Master’s Thesis, we investigate through numerical simulation and analysis the electromagnetic properties of a novel, AC-coupled probe. The new probe couples radiation from the device or circuit-under-test (DUT) via polarization current, which is then transformed to conduction current in the probe and down-converted in frequency to baseband by an optically-pumped photomixer. Finite-element simulations using High Frequency Structure Simulator (HFSS) yield an optimum narrowband designs for probing devices and circuits in coplanar waveguide (CPW), with DUT-to-photomixer coupling efficiencies between -10 and -20 dB between 300 and 600 GHz. A broadband designs shows promising performance up to 1300 GHz in an operating band of 1000 GHz.



Non Contact Antenna Free Probes For Characterization Of Thz Integrated Devices And Components


Non Contact Antenna Free Probes For Characterization Of Thz Integrated Devices And Components
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Author : Prasanna Kumar Daram
language : en
Publisher:
Release Date : 2014

Non Contact Antenna Free Probes For Characterization Of Thz Integrated Devices And Components written by Prasanna Kumar Daram and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014 with Electromagnetic devices categories.


The most common technology for electrical characterization of THz devices is DC-coupled contact probes. In this Masters thesis, a non-contact, antenna-free probe is analyzed for characterizing THz devices and integrated circuits. The probe consists of on-chip receiving or transmitting THz photomixers in a co-planar waveguide environment. Our probes are coupled to a CPW-embedded DUT by polarization current rather than conduction current and then down converted in frequency to baseband by an optically pumped photomixer. We investigated probe performance through numerical simulations using High Frequency Structure Simulator (HFSS) carried up to 1 THz and yielded a broadband design with DUT to photomixer promising coupling efficiency above -20 dB with an operational frequency range of 700 GHz between 0.3 and 1 THz, and the average increase in the coupling is ~ 8dB compared to the previous design. Several integrated-circuit techniques are necessary to achieve this performance, such as symmetric side-coupled CPW (SSC CPW), 1⁄4 wave backshort impedance-matching. These will be addressed along with design trade offs.



Non Contact Probes


Non Contact Probes
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Author : Cosan Caglayan
language : en
Publisher:
Release Date : 2016

Non Contact Probes written by Cosan Caglayan and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016 with categories.


A novel, non-contact metrology approach for on-wafer characterization of sub-mmW devices, components, and integrated circuits (ICs) is presented. Conventional contact probes are extremely limited for sub-mmW measurements due to increasing losses and inherently large parasitics. They are also very costly and suffer from physical fragility issues. As such, device testing in the 0.3-3 THz remains a specialty of few research groups that can shoulder the high cost of operating and maintaining such setups. Unlike existing contact probes which rely on fragile tips and physical contact with the device on the chip, the new non-contact probes are based on electromagnetic coupling of vector network analyzer (VNA) test ports into the coplanar waveguide (CPW) environment of the integrated devices and circuits. Efficient signal coupling is achieved via a quasi-optical link between the VNA ports and planar antennas that are monolithically integrated with the device-under-test. The test chip is then interfaced with an extended hemispherical lens on the back side to collimate the VNA port signals onto the non-contact probe antennas. These antennas act as "virtual'' probe-tips on the test chip and connect to the device through optimized, impedance matched CPW lines. Radiation patterns and the impedance performance of the probe antennas are optimized using in-house moment method tools for robust and broadband quasi-optical coupling of the VNA ports. Repeatable errors of the non-contact probe setup are calibrated using on-wafer standards, allowing for accurate S-parameter measurements. Experimental validation of the new non-contact device metrology system is presented via measurement of 1-port and 2-port devices in the 90-750 GHz band. Demonstration of active non-contact probes is carried out by characterization of an on-chip integrated Schottky diode. Moreover, differential-mode on-wafer measurements beyond 110 GHz are presented for the first time. Owing to the non-contact nature, the proposed approach is free from wear and tear and fragility issues. More importantly, they are low-cost and can be easily scaled beyond 1 THz where there is no existing solution for on-chip device and IC testing.



High Frequency Gan Electronic Devices


High Frequency Gan Electronic Devices
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Author : Patrick Fay
language : en
Publisher: Springer
Release Date : 2019-08-01

High Frequency Gan Electronic Devices written by Patrick Fay and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-08-01 with Technology & Engineering categories.


This book brings together recent research by scientists and device engineers working on both aggressively-scaled conventional transistors as well as unconventional high-frequency device concepts in the III-N material system. Device concepts for mm-wave to THz operation based on deeply-scaled HEMTs, as well as distributed device designs based on plasma-wave propagation in polarization-induced 2DEG channels, tunneling, and hot-carrier injection are discussed in detail. In addition, advances in the underlying materials science that enable these demonstrations, and advancements in metrology that permit the accurate characterization and evaluation of these emerging device concepts are also included. Targeting readers looking to push the envelope in GaN-based electronics device research, this book provides a current, comprehensive treatment of device concepts and physical phenomenology suitable for applying GaN and related materials to emerging ultra-high-frequency applications. Offers readers an integrated treatment of the state of the art in both conventional (i.e., HEMT) scaling as well as unconventional device architectures suitable for amplification and signal generation in the mm-wave and THz regime using GaN-based devices, written by authors that are active and widely-known experts in the field; Discusses both conventional scaled HEMTs (into the deep mm-wave) as well as unconventional approaches to address the mm-wave and THz regimes; Provides “vertically integrated” coverage, including materials science that enables these recent advances, as well as device physics & design, and metrology techniques; Includes fundamental physics, as well as numerical simulations and experimental realizations.



Electronics And Signal Processing


Electronics And Signal Processing
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Author : Gang Zhang
language : en
Publisher: Frontiers Media SA
Release Date : 2022-09-14

Electronics And Signal Processing written by Gang Zhang and has been published by Frontiers Media SA this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-09-14 with Science categories.




Terahertz Thz Mid Infrared Mir And Near Infrared Nir Technologies For Protection Of Critical Infrastructures Against Explosives And Cbrn


Terahertz Thz Mid Infrared Mir And Near Infrared Nir Technologies For Protection Of Critical Infrastructures Against Explosives And Cbrn
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Author : Mauro Fernandes Pereira
language : en
Publisher: Springer Nature
Release Date : 2021-04-30

Terahertz Thz Mid Infrared Mir And Near Infrared Nir Technologies For Protection Of Critical Infrastructures Against Explosives And Cbrn written by Mauro Fernandes Pereira and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-04-30 with Science categories.


Critical infrastructures are targets for terrorism and deliver a valuable vector through which the proliferation of CBRN and explosive precursors can be detected. Recent technological breakthroughs, notably in the field of near infrared (NIR), mid infrared (MIR), Terahertz (THz) and Gigahertz (GHz) sources and detectors, have led to rugged commercial devices, capable of standoff sensing a range of these dangerous substances. However, at the same time criminal and terrorist organizations have also benefited from the availability of technologies to increase the threat they pose to the security of citizens and a concerted effort is needed to improve early detection measures to identify activities, such as the production of homemade explosives or CBRN that can be potentially dangerous to society. The key global technological bottleneck to be overcome is the current lack of integration and networking of mature detection technology into early warning systems for critical infrastructures. Thus, this book brings together complementary information connecting the research of leading teams working on critical Infrastructure protection with academic developers and industrial producers of state of the art sensors.



Terahertz Biomedical Science And Technology


Terahertz Biomedical Science And Technology
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Author : Joo-Hiuk Son
language : en
Publisher: CRC Press
Release Date : 2014-06-13

Terahertz Biomedical Science And Technology written by Joo-Hiuk Son and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-06-13 with Medical categories.


A number of applications including scientific spectroscopy, security screening, and medical imaging have benefitted from the development and utilization of new and emerging terahertz (THz) generation and detection techniques. Exploring recent discoveries and the advancements of biological behaviors through THz spectroscopy and imaging and the devel



On Wafer Calibration Techniques Enabling Accurate Characterization Of High Performance Silicon Devices At The Mm Wave Range And Beyond


On Wafer Calibration Techniques Enabling Accurate Characterization Of High Performance Silicon Devices At The Mm Wave Range And Beyond
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Author : Andrej Rumiantsev
language : en
Publisher: CRC Press
Release Date : 2022-09-01

On Wafer Calibration Techniques Enabling Accurate Characterization Of High Performance Silicon Devices At The Mm Wave Range And Beyond written by Andrej Rumiantsev and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-09-01 with Technology & Engineering categories.


The increasing demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug. Most importantly, however, is the step of device characterization for development and optimization of device model parameters for new technologies. Accurate characterization of the intrinsic device in its entire operation frequency range becomes extremely important and this task is very challenging. This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies. Technical topics discussed in the book include: Specifics of S-parameter measurements of planar structures Complete mathematical solution for lumped-standard based calibration methods, including the transfer Thru-Match-Reflect (TMR) algorithms Design guideline and examples for the on-wafer calibration standards realized in both advanced SiGe BiCMOS and RF CMOS processes Methods for verification of electrical characteristics of calibration standards and accuracy of the in-situ calibration results Comparison of the new technique vs. conventional approaches: the probe-tip calibration and the pad parasitic de-embedding for various device types, geometries and model parameters New aspects of the on-wafer RF measurements at mmWave frequency range and calibration assurance.



Journal Of Research Of The National Institute Of Standards And Technology


Journal Of Research Of The National Institute Of Standards And Technology
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Author :
language : en
Publisher:
Release Date : 1995

Journal Of Research Of The National Institute Of Standards And Technology written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Measurement categories.




Issues In Electronic Circuits Devices And Materials 2013 Edition


Issues In Electronic Circuits Devices And Materials 2013 Edition
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Author :
language : en
Publisher: ScholarlyEditions
Release Date : 2013-05-01

Issues In Electronic Circuits Devices And Materials 2013 Edition written by and has been published by ScholarlyEditions this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-05-01 with Technology & Engineering categories.


Issues in Electronic Circuits, Devices, and Materials: 2013 Edition is a ScholarlyEditions™ book that delivers timely, authoritative, and comprehensive information about Microwave Research. The editors have built Issues in Electronic Circuits, Devices, and Materials: 2013 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about Microwave Research in this book to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Issues in Electronic Circuits, Devices, and Materials: 2013 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.