On Wafer Calibration Techniques Enabling Accurate Characterization Of High Performance Silicon Devices At The Mm Wave Range And Beyond
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On Wafer Calibration Techniques Enabling Accurate Characterization Of High Performance Silicon Devices At The Mm Wave Range And Beyond
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Author : Andrej Rumiantsev
language : en
Publisher: CRC Press
Release Date : 2022-09-01
On Wafer Calibration Techniques Enabling Accurate Characterization Of High Performance Silicon Devices At The Mm Wave Range And Beyond written by Andrej Rumiantsev and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-09-01 with Science categories.
The increasing demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug. Most importantly, however, is the step of device characterization for development and optimization of device model parameters for new technologies. Accurate characterization of the intrinsic device in its entire operation frequency range becomes extremely important and this task is very challenging. This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies. Technical topics discussed in the book include: Specifics of S-parameter measurements of planar structures Complete mathematical solution for lumped-standard based calibration methods, including the transfer Thru-Match-Reflect (TMR) algorithms Design guideline and examples for the on-wafer calibration standards realized in both advanced SiGe BiCMOS and RF CMOS processes Methods for verification of electrical characteristics of calibration standards and accuracy of the in-situ calibration results Comparison of the new technique vs. conventional approaches: the probe-tip calibration and the pad parasitic de-embedding for various device types, geometries and model parameters New aspects of the on-wafer RF measurements at mmWave frequency range and calibration assurance.
Microwave Systems And Applications
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Author : Sotirios K. Goudos
language : en
Publisher:
Release Date : 2017
Microwave Systems And Applications written by Sotirios K. Goudos and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017 with Engineering (General). Civil engineering (General) categories.
Microwave systems are key components of every modern wireless communication system. The main objective of this book was to collect as many different state-of-the-art studies as possible in order to cover in a single volume the main aspects of microwave systems and applications. This book contains 17 chapters written by acknowledged experts, researchers, academics, and microwave engineers, providing comprehensive information and covering a wide range of topics on all aspects of microwave systems and applications. This book is divided into four parts. The first part is devoted to microwave components. The second part deals with microwave ICs and innovative techniques for on-chip antenna design. The third part presents antenna design cases for microwave systems. Finally, the last part covers different applications of microwave systems.
Electrical Characterization Of Silicon On Insulator Materials And Devices
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Author : Sorin Cristoloveanu
language : en
Publisher: Springer
Release Date : 2014-02-23
Electrical Characterization Of Silicon On Insulator Materials And Devices written by Sorin Cristoloveanu and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-02-23 with Technology & Engineering categories.
Silicon on Insulator is more than a technology, more than a job, and more than a venture in microelectronics; it is something different and refreshing in device physics. This book recalls the activity and enthu siasm of our SOl groups. Many contributing students have since then disappeared from the SOl horizon. Some of them believed that SOl was the great love of their scientific lives; others just considered SOl as a fantastic LEGO game for adults. We thank them all for kindly letting us imagine that we were guiding them. This book was very necessary to many people. SOl engineers will certainly be happy: indeed, if the performance of their SOl components is not always outstanding, they can now safely incriminate the relations given in the book rather than their process. Martine, Gunter, and Y. S. Chang can contemplate at last the amount of work they did with the figures. Our SOl accomplices already know how much we borrowed from their expertise and would find it indecent to have their detailed contri butions listed. Jean-Pierre and Dimitris incited the book, while sharing their experience in the reliability of floating bodies. Our families and friends now realize the SOl capability of dielectrically isolating us for about two years in a BOX. Our kids encouraged us to start writing. Our wives definitely gave us the courage to stop writing. They had a hard time fighting the symptoms of a rapidly developing SOl allergy.
Coplanar Waveguide Circuits Components And Systems
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Author : Rainee N. Simons
language : en
Publisher: John Wiley & Sons
Release Date : 2004-04-07
Coplanar Waveguide Circuits Components And Systems written by Rainee N. Simons and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-04-07 with Technology & Engineering categories.
Up-to-date coverage of the analysis and applications of coplanar waveguides to microwave circuits and antennas The unique feature of coplanar waveguides, as opposed to more conventional waveguides, is their uniplanar construction, in which all of the conductors are aligned on the same side of the substrate. This feature simplifies manufacturing and allows faster and less expensive characterization using on-wafer techniques. Coplanar Waveguide Circuits, Components, and Systems is an engineer's complete resource, collecting all of the available data on the subject. Rainee Simons thoroughly discusses propagation parameters for conventional coplanar waveguides and includes valuable details such as the derivation of the fundamental equations, physical explanations, and numerical examples. Coverage also includes: Discontinuities and circuit elements Transitions to other transmission media Directional couplers, hybrids, and magic T Microelectromechanical systems based switches and phase shifters Tunable devices using ferroelectric materials Photonic bandgap structures Printed circuit antennas
Semiconductor Material And Device Characterization
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Author : Dieter K. Schroder
language : en
Publisher: John Wiley & Sons
Release Date : 2015-06-29
Semiconductor Material And Device Characterization written by Dieter K. Schroder and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-06-29 with Technology & Engineering categories.
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Springer Handbook Of Lasers And Optics
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Author : Frank Träger
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-05-05
Springer Handbook Of Lasers And Optics written by Frank Träger and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-05-05 with Science categories.
This new edition features numerous updates and additions. Especially 4 new chapters on Fiber Optics, Integrated Optics, Frequency Combs and Interferometry reflect the changes since the first edition. In addition, major complete updates for the chapters: Optical Materials and Their Properties, Optical Detectors, Nanooptics, and Optics far Beyond the Diffraction Limit. Features Contains over 1000 two-color illustrations. Includes over 120 comprehensive tables with properties of optical materials and light sources. Emphasizes physical concepts over extensive mathematical derivations. Chapters with summaries, detailed index Delivers a wealth of up-to-date references.
High Speed Serdes Devices And Applications
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Author : David Robert Stauffer
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-12-19
High Speed Serdes Devices And Applications written by David Robert Stauffer and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-12-19 with Technology & Engineering categories.
The simplest method of transferring data through the inputs or outputs of a silicon chip is to directly connect each bit of the datapath from one chip to the next chip. Once upon a time this was an acceptable approach. However, one aspect (and perhaps the only aspect) of chip design which has not changed during the career of the authors is Moore’s Law, which has dictated substantial increases in the number of circuits that can be manufactured on a chip. The pin densities of chip packaging technologies have not increased at the same pace as has silicon density, and this has led to a prevalence of High Speed Serdes (HSS) devices as an inherent part of almost any chip design. HSS devices are the dominant form of input/output for many (if not most) high-integration chips, moving serial data between chips at speeds up to 10 Gbps and beyond. Chip designers with a background in digital logic design tend to view HSS devices as simply complex digital input/output cells. This view ignores the complexity associated with serially moving billions of bits of data per second. At these data rates, the assumptions associated with digital signals break down and analog factors demand consideration. The chip designer who oversimplifies the problem does so at his or her own peril.
Hybrid Organic Inorganic Perovskites
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Author : Aline Ferreira
language : en
Publisher: John Wiley & Sons
Release Date : 2020-10-19
Hybrid Organic Inorganic Perovskites written by Aline Ferreira and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-10-19 with Science categories.
Hybrid organic-inorganic perovskites (HOIPs) have attracted substantial interest due to their chemical variability, structural diversity and favorable physical properties the past decade. This materials class encompasses other important families such as formates, azides, dicyanamides, cyanides and dicyanometallates. The book summarizes the chemical variability and structural diversity of all known hybrid organic-inorganic perovskites subclasses including halides, azides, formates, dicyanamides, cyanides and dicyanometallates. It also presents a comprehensive account of their intriguing physical properties, including photovoltaic, optoelectronic, dielectric, magnetic, ferroelectric, ferroelastic and multiferroic properties. Moreover, the current challenges and future opportunities in this exciting field are also been discussed. This timely book shows the readers a complete landscape of hybrid organic-inorganic pervoskites and associated multifuctionalities.
Principles Of Terahertz Time Domain Spectroscopy
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Author : Jean-Louis Coutaz
language : en
Publisher: CRC Press
Release Date : 2018-12-07
Principles Of Terahertz Time Domain Spectroscopy written by Jean-Louis Coutaz and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-12-07 with Science categories.
Terahertz time-domain spectroscopy (THz-TDS) is a unique technique for characterizing the response of materials and devices in the far-infrared region of the electromagnetic spectrum. Based on the measurement of transmitted or reflected ultra-short electromagnetic pulses and on a Fourier-transform of the recorded waveforms, THz-TDS permits fast and precise determination of the permittivity or permeability of materials over a wide bandwidth. This book is devoted to the determination of this spectral response of samples from the recorded waveforms.
Sub Millimeter Wave On Wafer Calibration And Device Characterization
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Author : Marco Cabbia
language : en
Publisher:
Release Date : 2021
Sub Millimeter Wave On Wafer Calibration And Device Characterization written by Marco Cabbia and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021 with categories.
Precision measurements play a crucial role in electronic engineering, particularly in the characterization of silicon-based heterojunction bipolar transistors (HBTs) embedded into devices for THz applications using the BiCMOS technology. Thanks to ongoing innovations in terms of nanoscale technology manufacturing, devices capable of operating in the sub-millimeter wave region are becoming a reality, and need to support the demand for high frequency circuits and systems. To have accurate models at such frequencies, it is no longer possible to limit the parameter extraction below 110 GHz, and new techniques for obtaining reliable measurements of passive and active devices must be investigated.In this thesis, we examine the on-wafer S-parameters characterization of various passive test structures and SiGe HBTs in STMicroelectronics' B55 technology, up to 500 GHz. We start with an introduction of the measuring equipment usually employed for this type of analysis, then moving on to the various probe stations adopted at the IMS Laboratory, and finally focusing on calibration and deembedding techniques, reviewing the major criticalities of high-frequency characterization and comparing two on-wafer calibration algorithms (SOLT and TRL) up to the WR-2.2 band.Two photomask production runs for on-wafer characterization, both designed at IMS, are considered: we introduce a new floorplan design and evaluate its ability to limit parasitic effects as well as the effect of the environment (substrate, neighbors, and crosstalk). For our analysis, we rely on electromagnetic simulations and joint device model + probe EM simulations, both including probe models for an evaluation of measurement results closer to real-world conditions.Finally, we present some test structures to evaluate unwanted impacts on millimeter wave measurements and novel transmission line design solutions. Two promising designs are carefully studied: the "M3 layout", which aims to characterize the DUT in a single-tier calibration, and the "meander lines", which keeps the inter-probe distance constant by avoiding any sort of probe displacement during on-wafer measurements.