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Oxide Reliability A Summary Of Silicon Oxide Wearout Breakdown And Reliability


Oxide Reliability A Summary Of Silicon Oxide Wearout Breakdown And Reliability
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Oxide Reliability


Oxide Reliability
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Author : D. J. Dumin
language : en
Publisher: World Scientific
Release Date : 2002

Oxide Reliability written by D. J. Dumin and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002 with Technology & Engineering categories.


Presents in summary the state of our knowledge of oxide reliability.



Oxide Reliability A Summary Of Silicon Oxide Wearout Breakdown And Reliability


Oxide Reliability A Summary Of Silicon Oxide Wearout Breakdown And Reliability
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Author : David J Dumin
language : en
Publisher: World Scientific
Release Date : 2002-01-18

Oxide Reliability A Summary Of Silicon Oxide Wearout Breakdown And Reliability written by David J Dumin and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2002-01-18 with Technology & Engineering categories.


This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field.



Dielectric Breakdown In Gigascale Electronics


Dielectric Breakdown In Gigascale Electronics
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Author : Juan Pablo Borja
language : en
Publisher: Springer
Release Date : 2016-09-16

Dielectric Breakdown In Gigascale Electronics written by Juan Pablo Borja and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-09-16 with Technology & Engineering categories.


This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the area of dielectric failure, and advanced simulations/models to resolve and predict dielectric breakdown, all of which are of considerable importance for engineers and scientists working on developing and integrating present and future chip architectures. The book is specifically designed to aid scientists in assessing the reliability and robustness of electronic systems employing low-k dielectric materials such as nano-porous films. Similarly, the models presented here will help to improve current methodologies for estimating the failure of gigascale electronics at device operating conditions from accelerated lab test conditions. Numerous graphs, tables, and illustrations are included to facilitate understanding of the topics. Readers will be able to understand dielectric breakdown in thin films along with the main failure modes and characterization techniques. In addition, they will gain expertise on conventional as well as new field acceleration test models for predicting long term dielectric degradation.



Terahertz Sensing Technology Vol 2 Emerging Scientific Applications And Novel Device Concepts


Terahertz Sensing Technology Vol 2 Emerging Scientific Applications And Novel Device Concepts
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Author : Michael S Shur
language : en
Publisher: World Scientific
Release Date : 2004-02-06

Terahertz Sensing Technology Vol 2 Emerging Scientific Applications And Novel Device Concepts written by Michael S Shur and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-02-06 with Technology & Engineering categories.


The last research frontier in high frequency electronics lies in the so-called terahertz (or submillimeter wave) regime, between the traditional microwave and the infrared domains. Significant scientific and technical challenges within the terahertz (THz) frequency regime have recently motivated an array of new research activities. During the last few years, major research programs have emerged that are focused on advancing the state of the art in THz frequency electronic technology and on investigating novel applications of THz frequency sensing. This book provides a detailed review of the new THz frequency technological developments that are emerging across a wide spectrum of sensing and technology areas.Volume II presents cutting edge results in two primary areas: (1) research that is attempting to establish THz-frequency sensing as a new characterization tool for chemical, biological and semiconductor materials, and (2) theoretical and experimental efforts to define new device concepts within the “THz gap”.



Intersubband Infrared Photodetectors


Intersubband Infrared Photodetectors
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Author : V. Ryzhii
language : en
Publisher: World Scientific
Release Date : 2003

Intersubband Infrared Photodetectors written by V. Ryzhii and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003 with Technology & Engineering categories.


Infrared technologies are very important for a wide range of military, scientific and commercial applications. Devices and systems based on semiconductor heterostructure and quantum well and quantum dot structures open up a new era in infrared technologies.This book deals with various topics related to the latest achievements in the development of intersubband infrared photodetectors, reviewed by top experts in the field. It covers physical aspects of the operation of the devices as well as details of their design in different applications. The papers included in the book will be useful for researchers and engineers interested in the physics of optoelectronic devices as well as their practical design and applications.



Terahertz Sensing Technology Electronic Devices And Advanced Systems Technology


Terahertz Sensing Technology Electronic Devices And Advanced Systems Technology
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Author : Dwight L. Woolard
language : en
Publisher: World Scientific
Release Date : 2003

Terahertz Sensing Technology Electronic Devices And Advanced Systems Technology written by Dwight L. Woolard and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003 with Technology & Engineering categories.


The last research frontier in high frequency electronics now lies in the so-called THz (or submillimeter-wave) regime between the traditional microwave and infrared domains. Significant scientific and technical challenges within the terahertz (THz) frequency regime have recently motivated an array of new research activities. During the last few years, major research programs have emerged that are focused on advancing the state of the art in THz frequency electronic technology and on investigating novel applications of THz frequency sensing. This book serves as a detailed reference for the new THz frequency technological advances that are emerging across a wide spectrum of sensing and technology areas.



Advanced Device Modeling And Simulation


Advanced Device Modeling And Simulation
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Author : Tibor Grasser
language : en
Publisher: World Scientific
Release Date : 2003-10-17

Advanced Device Modeling And Simulation written by Tibor Grasser and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-10-17 with Technology & Engineering categories.


Microelectronics is one of the most rapidly changing scientific fields today. The tendency to shrink devices as far as possible results in extremely small devices which can no longer be described using simple analytical models. This book covers various aspects of advanced device modeling and simulation. As such it presents extensive reviews and original research by outstanding scientists. The bulk of the book is concerned with the theory of classical and quantum-mechanical transport modeling, based on macroscopic, spherical harmonics and Monte Carlo methods.



Gan Based Materials And Devices


Gan Based Materials And Devices
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Author : Michael Shur
language : en
Publisher: World Scientific
Release Date : 2004

Gan Based Materials And Devices written by Michael Shur and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004 with Technology & Engineering categories.


The unique materials properties of GaN-based semiconductors have stimulated a great deal of interest in research and development regarding nitride materials growth and optoelectronic and nitride-based electronic devices. High electron mobility and saturation velocity, high sheet carrier concentration at heterojunction interfaces, high breakdown field, and low thermal impedance of GaN-based films grown over SiC or bulk AlN substrates make nitride-based electronic devices very promising. The chemical inertness of nitrides is another key property.This volume, written by experts on different aspects of nitride technology, addresses the entire spectrum of issues related to nitride materials and devices, and it will be useful for technologists, scientists, engineers, and graduate students who are working on wide bandgap materials and devices. The book can also be used as a supplementary text for graduate courses on wide bandgap semiconductor technology.



Terahertz Sensing Technology Vol 1 Electronic Devices And Advanced Systems Technology


Terahertz Sensing Technology Vol 1 Electronic Devices And Advanced Systems Technology
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Author : Michael S Shur
language : en
Publisher: World Scientific
Release Date : 2003-07-14

Terahertz Sensing Technology Vol 1 Electronic Devices And Advanced Systems Technology written by Michael S Shur and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-07-14 with Technology & Engineering categories.


The last research frontier in high frequency electronics now lies in the so-called THz (or submillimeter-wave) regime between the traditional microwave and infrared domains. Significant scientific and technical challenges within the terahertz (THz) frequency regime have recently motivated an array of new research activities. During the last few years, major research programs have emerged that are focused on advancing the state of the art in THz frequency electronic technology and on investigating novel applications of THz frequency sensing. This book serves as a detailed reference for the new THz frequency technological advances that are emerging across a wide spectrum of sensing and technology areas.



Compound Semiconductor Integrated Circuits


Compound Semiconductor Integrated Circuits
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Author : Tho T Vu
language : en
Publisher: World Scientific
Release Date : 2003-04-02

Compound Semiconductor Integrated Circuits written by Tho T Vu and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-04-02 with Technology & Engineering categories.


This is the book version of a special issue of the International Journal of High Speed Electronics and Systems, reviewing recent work in the field of compound semiconductor integrated circuits. There are fourteen invited papers covering a wide range of applications, frequencies and materials. These papers deal with digital, analog, microwave and millimeter-wave technologies, devices and integrated circuits for wireline fiber-optic lightwave transmissions, and wireless radio-frequency microwave and millimeter-wave communications. In each case, the market is young and experiencing rapid growth for both commercial and millitary applications. Many new semiconductor technologies compete for these new markets, leading to an alphabet soup of semiconductor materials described in these papers. The book also includes three papers focused on radiation effects and reliability in III-V semiconductor electronics, which are useful for reference and future directions. Moreover, reliability is covered in several papers separately for certain process technologies.