Physics Of Failure In Electronics Proceedings Of The Symposium On The Physics Of Failure In Electronics 4
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Physics Of Failure In Electronics Proceedings Of The Symposium On The Physics Of Failure In Electronics 4
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Author :
language : en
Publisher:
Release Date : 1965
Physics Of Failure In Electronics Proceedings Of The Symposium On The Physics Of Failure In Electronics 4 written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1965 with categories.
Long Term Non Operating Reliability Of Electronic Products
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Author : Judy Pecht
language : en
Publisher: CRC Press
Release Date : 2019-07-23
Long Term Non Operating Reliability Of Electronic Products written by Judy Pecht and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-07-23 with Mathematics categories.
In today's electronic environment, operating reliability for continued daily use of electronic products is essential. This book discusses the reliability of products that lie dormant for long periods of time and are subject to stresses such as humidity, ionic contaminants, temperature, radiation, shock, and vibration. Non-operating reliability is especially critical for life-saving electronic products such as fire alarm systems, standby power sources, and burglar alarms. Air bags in automobiles, earthquake alarm systems, and radiation warning systems in nuclear power plants are also covered. This physics-of-failure approach is also important to maintaining defense hardware such as missiles and munitions systems which often lie dormant for years before being deployed on very short notice
Implosion
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Author : L. Parker Temple
language : en
Publisher: John Wiley & Sons
Release Date : 2012-11-27
Implosion written by L. Parker Temple and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-11-27 with Technology & Engineering categories.
Implosion is a focused study of the history and uses of high-reliability, solid-state electronics, military standards, and space systems that support our national security and defense. This book is unique in combining the interdependent evolution of and interrelationships among military standards, solid-state electronics, and very high-reliability space systems. Starting with a brief description of the physics that enabled the development of the first transistor, Implosion covers the need for standardizing military electronics, which began during World War II and continues today. The book shows how these twin topics affected, and largely enabled, the highest reliability and most technologically capable robotic systems ever conceived. This riveting history helps readers: Realize the complex interdependence of solid-state electronics and practical implementations in the national security and defense space programs Understand the evolution of military standards for piece parts, quality, and reliability as they affected these programs Gain insight into the attempted reforms of federal systems acquisition of security- and defense-related space systems in the latter half of the twentieth century Appreciate the complexity of science and technology public policy decisions in the context of political, organizational, and economic realities Written in clear, jargon-free language, but with plenty of technical detail, Implosion is a must-read for aerospace and aviation engineers, manufacturers, and enthusiasts; technology students and historians; and anyone interested in the history of technology, military technology, and the space program.
Failure Analysis
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Author : Marius Bazu
language : en
Publisher: John Wiley & Sons
Release Date : 2011-03-08
Failure Analysis written by Marius Bazu and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-03-08 with Technology & Engineering categories.
Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers need practical orientation around the complex procedures involved in failure analysis. This guide acts as a tool for all advanced techniques, their benefits and vital aspects of their use in a reliability programme. Using twelve complex case studies, the authors explain why failure analysis should be used with electronic components, when implementation is appropriate and methods for its successful use. Inside you will find detailed coverage on: a synergistic approach to failure modes and mechanisms, along with reliability physics and the failure analysis of materials, emphasizing the vital importance of cooperation between a product development team involved the reasons why failure analysis is an important tool for improving yield and reliability by corrective actions the design stage, highlighting the ‘concurrent engineering' approach and DfR (Design for Reliability) failure analysis during fabrication, covering reliability monitoring, process monitors and package reliability reliability resting after fabrication, including reliability assessment at this stage and corrective actions a large variety of methods, such as electrical methods, thermal methods, optical methods, electron microscopy, mechanical methods, X-Ray methods, spectroscopic, acoustical, and laser methods new challenges in reliability testing, such as its use in microsystems and nanostructures This practical yet comprehensive reference is useful for manufacturers and engineers involved in the design, fabrication and testing of electronic components, devices, ICs and electronic systems, as well as for users of components in complex systems wanting to discover the roots of the reliability flaws for their products.
Electrical Overstress Eos
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Author : Steven H. Voldman
language : en
Publisher: John Wiley & Sons
Release Date : 2013-08-27
Electrical Overstress Eos written by Steven H. Voldman and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-08-27 with Technology & Engineering categories.
Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips. The book is unique in covering the EOS manufacturing issues from on-chip design and electronic design automation to factory-level EOS program management in today’s modern world. Look inside for extensive coverage on: Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA), to physical models for EOS phenomena EOS sources in today’s semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures EOS failures in both semiconductor devices, circuits and system Discussion of how to distinguish between EOS events, and electrostatic discharge (ESD) events (e.g. such as human body model (HBM), charged device model (CDM), cable discharge events (CDM), charged board events (CBE), to system level IEC 61000-4-2 test events) EOS protection on-chip design practices and how they differ from ESD protection networks and solutions Discussion of EOS system level concerns in printed circuit boards (PCB), and manufacturing equipment Examples of EOS issues in state-of-the-art digital, analog and power technologies including CMOS, LDMOS, and BCD EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is distinct from ESD EDA systems EOS testing and qualification techniques, and Practical off-chip ESD protection and system level solutions to provide more robust systems Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era.
Hermeticity Of Electronic Packages
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Author : Hal Greenhouse
language : en
Publisher: Elsevier
Release Date : 2000-03-01
Hermeticity Of Electronic Packages written by Hal Greenhouse and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000-03-01 with Technology & Engineering categories.
This is a book about the integrity of sealed packages to resist foreign gases and liquids penetrating the seal or an opening (crack) in the package—especially critical to the reliability and longevity of electronics. The author explains how to predict the reliability and the longevity of the packages based on leak rate measurements and the assumptions of impurities. Non-specialists in particular will benefit from the author's long involvement in the technology. Hermeticity is a subject that demands practical experience, and solving one problem does not necessarily give one the background to solve another. Thus, the book provides a ready reference to help deal with day to day issues as they arise.The book gathers in a single volume a great many issues previously available only in journals—or only in the experience of working engineers. How to define the ""goodness"" of a seal? How is that seal measured? How does the integrity of the seal affect circuit reliability? What is the significance of the measured integrity of the seal? What is the relationship of Residual Gas Analysis and the seal integrity? The handbook answers these questions and more, providing an analysis of nearly 100 problems representative of the wide variety of challenges that actually occur in industry today.
Prognostics And Health Management Of Electronics
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Author : Michael G. Pecht
language : en
Publisher: John Wiley & Sons
Release Date : 2018-08-21
Prognostics And Health Management Of Electronics written by Michael G. Pecht and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-08-21 with Technology & Engineering categories.
An indispensable guide for engineers and data scientists in design, testing, operation, manufacturing, and maintenance A road map to the current challenges and available opportunities for the research and development of Prognostics and Health Management (PHM), this important work covers all areas of electronics and explains how to: assess methods for damage estimation of components and systems due to field loading conditions assess the cost and benefits of prognostic implementations develop novel methods for in situ monitoring of products and systems in actual life-cycle conditions enable condition-based (predictive) maintenance increase system availability through an extension of maintenance cycles and/or timely repair actions; obtain knowledge of load history for future design, qualification, and root cause analysis reduce the occurrence of no fault found (NFF) subtract life-cycle costs of equipment from reduction in inspection costs, downtime, and inventory Prognostics and Health Management of Electronics also explains how to understand statistical techniques and machine learning methods used for diagnostics and prognostics. Using this valuable resource, electrical engineers, data scientists, and design engineers will be able to fully grasp the synergy between IoT, machine learning, and risk assessment.
Failure Modes And Mechanisms In Electronic Packages
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Author : P. Singh
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06
Failure Modes And Mechanisms In Electronic Packages written by P. Singh and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.
Those of us who grew up in the "through-hole" age of electronic packaging are probably more amazed and appreciative than are our children at the incredible growth of electronic performance capability. My son, an electrical engineering student, seems almost to take for granted the innovations that leave me somewhat awestruck at times. Electronic circuit designers delight in packing more punch into less volume, while reminding us that their job has become increasingly challenging. The lay person also has learned from the media that the industry has been working wonders in shrinking the transistor and expanding the power of "the chip. " Much attention is focussed on the silicon and on the marvelous production and entertainment tools we now see in our offices and homes. Between the silicon and the end product lies the less publicized world of circuit-level packaging. We leave it to a cadre of technologists to take the schematics and parts lists and to develop the processes that tum the designers' concepts into physical reality. And while the silicon transistor is shrinking, the engineering challenges of packaging multiple chips and associated components into increasingly dense subsystems are growing. Further, the transistor may have to function without failure through severe industrial or military environments over the lifetime of the product.
Reliability And Risk Issues In Large Scale Safety Critical Digital Control Systems
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Author : Poong-Hyun Seong
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-10-25
Reliability And Risk Issues In Large Scale Safety Critical Digital Control Systems written by Poong-Hyun Seong and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-10-25 with Technology & Engineering categories.
“Reliability and Risk Issues in Large Scale Safety-critical Digital Control Systems” provides a comprehensive coverage of reliability issues and their corresponding countermeasures in the field of large-scale digital control systems, from the hardware and software in digital systems to the human operators who supervise the overall process of large-scale systems. Unlike other books which examine theories and issues in individual fields, this book reviews important problems and countermeasures across the fields of software reliability, software verification and validation, digital systems, human factors engineering and human reliability analysis. Divided into four sections dealing with software reliability, digital system reliability, human reliability and human operators in large-scale digital systems, the book offers insights from professional researchers in each specialized field in a diverse yet unified approach.
Applied Reliability Engineering And Risk Analysis
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Author : Ilia B. Frenkel
language : en
Publisher: John Wiley & Sons
Release Date : 2013-08-22
Applied Reliability Engineering And Risk Analysis written by Ilia B. Frenkel and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-08-22 with Technology & Engineering categories.
This complete resource on the theory and applications of reliability engineering, probabilistic models and risk analysis consolidates all the latest research, presenting the most up-to-date developments in this field. With comprehensive coverage of the theoretical and practical issues of both classic and modern topics, it also provides a unique commemoration to the centennial of the birth of Boris Gnedenko, one of the most prominent reliability scientists of the twentieth century. Key features include: expert treatment of probabilistic models and statistical inference from leading scientists, researchers and practitioners in their respective reliability fields detailed coverage of multi-state system reliability, maintenance models, statistical inference in reliability, systemability, physics of failures and reliability demonstration many examples and engineering case studies to illustrate the theoretical results and their practical applications in industry Applied Reliability Engineering and Risk Analysis is one of the first works to treat the important areas of degradation analysis, multi-state system reliability, networks and large-scale systems in one comprehensive volume. It is an essential reference for engineers and scientists involved in reliability analysis, applied probability and statistics, reliability engineering and maintenance, logistics, and quality control. It is also a useful resource for graduate students specialising in reliability analysis and applied probability and statistics. Dedicated to the Centennial of the birth of Boris Gnedenko, renowned Russian mathematician and reliability theorist