Principles And Applications Of Powder Diffraction
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Principles And Applications Of Powder Diffraction
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Author : Abraham Clearfield
language : en
Publisher: Wiley-Blackwell
Release Date : 2008-09-22
Principles And Applications Of Powder Diffraction written by Abraham Clearfield and has been published by Wiley-Blackwell this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-09-22 with Science categories.
Powder diffraction is one of the primary techniques used to characterize materials, providing structural information even when the crystallite size is too small for single crystal x-ray diffraction methods. There has been a significant increase in the application of powder diffraction in recent years, both in research and manufacturing, fuelled by improved instrumentation, data processing and awareness of the information that can be obtained. Powder diffraction allows for rapid, non-destructive analysis of multi-component mixtures without the need for extensive sample preparation. This gives laboratories the ability to quickly analyse unknown materials and perform materials characterization in such fields as chemistry, materials science, geology, mineralogy, forensics, archaeology, and the biological and pharmaceutical sciences. This book provides a concise introduction to modern powder diffraction methods with particular emphasis on practical aspects. It covers the background theory of diffraction in a form approachable by those with an undergraduate degree. Whilst individual chapters are written as stand alone sections, the text is sufficiently focused so that it can be read in its entirety by the non-specialist who wants to gain a rapid overview of what they can do with modern powder diffraction methods.
X Ray Diffraction For Materials Research
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Author : Myeongkyu Lee
language : en
Publisher: CRC Press
Release Date : 2017-03-16
X Ray Diffraction For Materials Research written by Myeongkyu Lee and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-03-16 with Science categories.
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
X Ray Diffraction Crystallography
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Author : Yoshio Waseda
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-03-18
X Ray Diffraction Crystallography written by Yoshio Waseda and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-03-18 with Technology & Engineering categories.
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Powder Diffraction
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Author : Robert E. Dinnebier
language : en
Publisher: Royal Society of Chemistry
Release Date : 2008
Powder Diffraction written by Robert E. Dinnebier and has been published by Royal Society of Chemistry this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008 with Education categories.
Powder diffraction is a widely used scientific technique in the characterization of materials with broad application in materials science, chemistry, physics, geology, pharmacology and archaeology. Powder Diffraction Theory and Practice provides an advanced introductory text about modern methods and applications of powder diffraction in research and industry. The authors begin with a brief overview of the basic theory of diffraction from crystals and powders. Data collection strategies are described including x-ray, neutron and electron diffraction setups using modern day apparatus including synchrotron sources. Data corrections, essential for quantitative analysis are covered before the authors conclude with a discussion of the analysis methods themselves. The information is presented in a way that facilitates understanding the information content of the data, as well as best practices for collecting and analyzing data for quantitative analysis. This long awaited book condenses the knowledge of renowned experts in the field into a single, authoritative, overview of the application of powder diffraction in modern materials research. The book contains essential theory and introductory material for students and researchers wishing to learn how to apply the frontier methods of powder diffraction.
Thin Film Analysis By X Ray Scattering
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Author : Mario Birkholz
language : en
Publisher: John Wiley & Sons
Release Date : 2006-05-12
Thin Film Analysis By X Ray Scattering written by Mario Birkholz and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-05-12 with Technology & Engineering categories.
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
Fundamentals Of Powder Diffraction And Structural Characterization Of Materials
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Author : Vitalij Pecharsky
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-12-05
Fundamentals Of Powder Diffraction And Structural Characterization Of Materials written by Vitalij Pecharsky and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-12-05 with Technology & Engineering categories.
Fundamentals of Powder Diffraction and Structural Characterization of Materials provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination. The emphasis is placed on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental work. The book is divided into two parts: chapters one though three give essential theoretical background, while chapters four through seven guide the reader through practical aspects of extracting structural information from powder data. In addition color electronic versions of some 300 illustrations found throughout the book will be included.
Introduction To X Ray Powder Diffractometry
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Author : Ron Jenkins
language : en
Publisher: Wiley-Interscience
Release Date : 1996-07-12
Introduction To X Ray Powder Diffractometry written by Ron Jenkins and has been published by Wiley-Interscience this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996-07-12 with Science categories.
Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material.
Nanoscale Materials
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Author : Luis M. Liz-Marzán
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-05-08
Nanoscale Materials written by Luis M. Liz-Marzán and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-05-08 with Science categories.
Organized nanoassemblies of inorganic nanoparticles and organic molecules are building blocks of nanodevices, whether they are designed to perform molecular level computing, sense the environment or improve the catalytic properties of a material. The key to creation of these hybrid nanostructures lies in understanding the chemistry at a fundamental level. This book serves as a reference book for researchers by providing fundamental understanding of many nanoscopic materials.
Textbook Of Modern Pharmaceutical Analytical Techniques
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Author : Dr. Ankur Vashi , Mr. Gaurav Patel, Dr. Mehulkumar M Patel
language : en
Publisher: Shashwat Publication
Release Date : 2025-01-07
Textbook Of Modern Pharmaceutical Analytical Techniques written by Dr. Ankur Vashi , Mr. Gaurav Patel, Dr. Mehulkumar M Patel and has been published by Shashwat Publication this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-01-07 with Medical categories.
Modern Pharmaceutical Analytical Techniques, is designed to provide a comprehensive overview of the most advanced methods and tools currently used in the pharmaceutical industry. It aims to bridge the gap between traditional analytical techniques and the cutting-edge technologies that are revolutionizing the way we understand, analyze, and optimize pharmaceutical compounds. Our goal with this book is to equip professionals, researchers, and students with the knowledge and skills necessary to navigate the complexities of pharmaceutical analysis. Whether you are new to the field or an experienced practitioner, this book provides valuable information that will enhance your understanding of modern analytical methodologies and their application in the pharmaceutical industry. We would like to express our gratitude to the numerous experts and contributors who have shared their knowledge and experiences, making this book a valuable resource for the pharmaceutical community.
X Ray Diffraction
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Author : B. E. Warren
language : en
Publisher: Courier Corporation
Release Date : 2012-05-23
X Ray Diffraction written by B. E. Warren and has been published by Courier Corporation this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-05-23 with Science categories.
Rigorous graduate-level text stresses modern applications to nonstructural problems such as temperature vibration effects, order-disorder phenomena, crystal imperfections, more. Problems. Six Appendixes include tables of values. Bibliographies.