Introduction To X Ray Powder Diffractometry
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Introduction To X Ray Powder Diffractometry
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Author : Ron Jenkins
language : en
Publisher: Wiley-Interscience
Release Date : 1996-07-12
Introduction To X Ray Powder Diffractometry written by Ron Jenkins and has been published by Wiley-Interscience this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996-07-12 with Science categories.
When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity. Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. The first three chapters outline diffraction theory in clear language, accessible to both students and professionals in chemistry, physics, geology, and materials science. The book's middle chapters describe the instrumentation and procedures used in X-ray diffraction, including X-ray sources, X-ray detection, and production of monochromatic radiation. The chapter devoted to instrument design and calibration is followed by an examination of specimen preparation methods, data collection, and reduction. The final two chapters provide in-depth discussions of qualitative and quantitative analysis. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material. Self-contained, timely, and user-friendly, Introduction to X-ray Powder Diffractometry is an enormously useful text and professional reference for analytical chemists, physicists, geologists and materials scientists, and upper-level undergraduate and graduate students in materials science and analytical chemistry. X-ray powder diffraction-a technique that has matured significantly in recent years-is used to identify solid samples and determine their composition by analyzing the so-called "fingerprints" they generate when X-rayed. This unique volume fulfills two major roles: it is the first textbook devoted solely to X-ray powder diffractometry, and the first up-to-date treatment of the subject in 20 years. This timely, authoritative volume features: * Clear, concise descriptions of both theory and practice-including fundamentals of diffraction theory and all aspects of the diffractometer * A treatment that reflects current trends toward automation, covering the newest instrumentation and automation techniques * Coverage of all the most common applications, with special emphasis on qualitative and quantitative analysis * An accessible presentation appropriate for both students and professionals * More than 230 tables and illustrations Introduction to X-ray Powder Diffractometry, a collaboration between two internationally known and respected experts in the field, provides invaluable guidance to anyone using X-ray powder diffractometers and diffractometry in materials science, ceramics, the pharmaceutical industry, and elsewhere.
An Introduction To X Ray Powder Diffractometry
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Author : Ron Jenkins
language : en
Publisher:
Release Date : 197?
An Introduction To X Ray Powder Diffractometry written by Ron Jenkins and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 197? with Powders categories.
An Introduction To X Ray Powder Diffractometry
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Author : Ron Jenkins
language : en
Publisher:
Release Date : 198?
An Introduction To X Ray Powder Diffractometry written by Ron Jenkins and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 198? with categories.
Fundamentals Of Powder Diffraction And Structural Characterization Of Materials Second Edition
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Author : Vitalij Pecharsky
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-11-24
Fundamentals Of Powder Diffraction And Structural Characterization Of Materials Second Edition written by Vitalij Pecharsky and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-11-24 with Science categories.
A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .
X Ray Diffraction
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Author : C. Suryanarayana
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-06-29
X Ray Diffraction written by C. Suryanarayana and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-06-29 with Technology & Engineering categories.
In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a "hands on" approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.
X Ray Diffraction Crystallography
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Author : Yoshio Waseda
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-03-18
X Ray Diffraction Crystallography written by Yoshio Waseda and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-03-18 with Technology & Engineering categories.
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Theory Of Xrf Getting Acquainted With The Principles
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Author : Peter Brouwer
language : en
Publisher:
Release Date : 2006
Theory Of Xrf Getting Acquainted With The Principles written by Peter Brouwer and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006 with categories.
Introduction To X Ray Powder Diffractometry
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Author : Ron Jenkins
language : en
Publisher: Wiley-Interscience
Release Date : 1996-07-12
Introduction To X Ray Powder Diffractometry written by Ron Jenkins and has been published by Wiley-Interscience this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996-07-12 with Science categories.
When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity. Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. The first three chapters outline diffraction theory in clear language, accessible to both students and professionals in chemistry, physics, geology, and materials science. The book's middle chapters describe the instrumentation and procedures used in X-ray diffraction, including X-ray sources, X-ray detection, and production of monochromatic radiation. The chapter devoted to instrument design and calibration is followed by an examination of specimen preparation methods, data collection, and reduction. The final two chapters provide in-depth discussions of qualitative and quantitative analysis. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material. Self-contained, timely, and user-friendly, Introduction to X-ray Powder Diffractometry is an enormously useful text and professional reference for analytical chemists, physicists, geologists and materials scientists, and upper-level undergraduate and graduate students in materials science and analytical chemistry. X-ray powder diffraction-a technique that has matured significantly in recent years-is used to identify solid samples and determine their composition by analyzing the so-called "fingerprints" they generate when X-rayed. This unique volume fulfills two major roles: it is the first textbook devoted solely to X-ray powder diffractometry, and the first up-to-date treatment of the subject in 20 years. This timely, authoritative volume features: * Clear, concise descriptions of both theory and practice-including fundamentals of diffraction theory and all aspects of the diffractometer * A treatment that reflects current trends toward automation, covering the newest instrumentation and automation techniques * Coverage of all the most common applications, with special emphasis on qualitative and quantitative analysis * An accessible presentation appropriate for both students and professionals * More than 230 tables and illustrations Introduction to X-ray Powder Diffractometry, a collaboration between two internationally known and respected experts in the field, provides invaluable guidance to anyone using X-ray powder diffractometers and diffractometry in materials science, ceramics, the pharmaceutical industry, and elsewhere.
Standard X Ray Diffraction Powder Patterns
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Author : Howard Eugene Swanson
language : en
Publisher:
Release Date : 1962
Standard X Ray Diffraction Powder Patterns written by Howard Eugene Swanson and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1962 with Powders categories.
X Ray Diffraction Methods
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Author : E. W. Nuffield
language : en
Publisher:
Release Date : 1966
X Ray Diffraction Methods written by E. W. Nuffield and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1966 with Science categories.
1. Introduction 1; 2. The nature and generation of X-rays 29; 3. The diffraction of X-rays 46; 4. Systematically absent X-ray reflections and the determination of space group 87; 5. Polycrystal or powder methods 105; 6. Orientation and projection of morphological crystals 208; 7. The Laue method 226; 8. The reciprocal lattice 239; 9. The Buerger precession method 253; 10. The rotation and oscillation methods 283; 11. The equi-inclination Weissenberg method 302; 12. Single-crystal X-ray diffractometry 343; 13. A general method for orienting a crystal 351; Appendix : 1. The 230 space groups 365; 2. The six permutation of the orthorhombic space groups 370; 3. Space-group determinative tables 372; 4. Table of 1/2 (cos2 phi/sin phi + cos2 phi/phi) 385; 5. Data for constructing stereographic scales 388; 6. Mathematical relations between reciprocal- and direct-lattice constants 391; Index 405.