Principles Of Semiconductor Network Testing

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Principles Of Semiconductor Network Testing

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Author : Amir Afshar
language : en
Publisher: Elsevier
Release Date : 1996-04-22

Principles Of Semiconductor Network Testing written by Amir Afshar and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996-04-22 with Science categories.

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. - Introduces a novel component-testing philosophy for semiconductor test, product and design engineers - Best new source of information for experienced semiconductor engineers as well as entry-level personnel - Eight chapters about semiconductor testing

Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits

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Author : M. Bushnell
language : en
Publisher: Springer Science & Business Media
Release Date : 2004-12-15

Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits written by M. Bushnell and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-12-15 with Technology & Engineering categories.

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Satellite Communication Engineering

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Author : Michael Olorunfunmi Kolawole
language : en
Publisher: CRC Press
Release Date : 2017-07-12

Satellite Communication Engineering written by Michael Olorunfunmi Kolawole and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-07-12 with Technology & Engineering categories.

An undeniably rich and thorough guide to satellite communication engineering, Satellite Communication Engineering, Second Edition presents the fundamentals of information communications systems in a simple and succinct way. This book considers both the engineering aspects of satellite systems as well as the practical issues in the broad field of information transmission. Implementing concepts developed on an intuitive, physical basis and utilizing a combination of applications and performance curves, this book starts off with a progressive foundation in satellite technology, and then moves on to more complex concepts with ease. What’s New in the Second Edition: The second edition covers satellite and Earth station design; global positioning systems; antenna tracking; links and communications systems; error detection and correction; data security; regulations and procedures for system modeling; integration; testing; and reliability and performance evaluation. Provides readers with the systems building blocks of satellite transponders and Earth stations, as well as the systems engineering design procedure Includes the tools needed to calculate basic orbit characteristics such as period, dwell time, coverage area, propagation losses; antenna system features such as size, beamwidth, aperture-frequency product, gain, tracking control; and system requirements such as power, availability, reliability, and performance Presents problem sets and starred sections containing basic mathematical development Details recent developments enabling digital information transmission and delivery via satellite Satellite Communication Engineering, Second Edition serves as a textbook for students and a resource for space agencies and relevant industries.

Vlsi Test Principles And Architectures

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Author : Laung-Terng Wang
language : en
Publisher: Elsevier
Release Date : 2006-08-14

Vlsi Test Principles And Architectures written by Laung-Terng Wang and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-08-14 with Technology & Engineering categories.

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

The Cumulative Book Index

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Author :
language : en
Publisher:
Release Date : 1996

The Cumulative Book Index written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1996 with American literature categories.

A world list of books in the English language.

Principles Of Testing Electronic Systems

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Author : Samiha Mourad
language : en
Publisher: John Wiley & Sons
Release Date : 2000-07-25

Principles Of Testing Electronic Systems written by Samiha Mourad and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2000-07-25 with Technology & Engineering categories.

A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

Bibliographic Index

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Author :
language : en
Publisher:
Release Date : 1995

Bibliographic Index written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995 with Bibliographical literature categories.

Technical Abstract Bulletin

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Author :
language : en
Publisher:
Release Date : 1964

Technical Abstract Bulletin written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1964 with Science categories.

Modeling Analysis And Optimization Of Network On Chip Communication Architectures

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Author : Umit Y. Ogras
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-12

Modeling Analysis And Optimization Of Network On Chip Communication Architectures written by Umit Y. Ogras and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-12 with Technology & Engineering categories.

Traditionally, design space exploration for Systems-on-Chip (SoCs) has focused on the computational aspects of the problem at hand. However, as the number of components on a single chip and their performance continue to increase, the communication architecture plays a major role in the area, performance and energy consumption of the overall system. As a result, a shift from computation-based to communication-based design becomes mandatory. Towards this end, network-on-chip (NoC) communication architectures have emerged recently as a promising alternative to classical bus and point-to-point communication architectures. In this dissertation, we study outstanding research problems related to modeling, analysis and optimization of NoC communication architectures. More precisely, we present novel design methodologies, software tools and FPGA prototypes to aid the design of application-specific NoCs.

System On Chip Test Architectures

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Author : Laung-Terng Wang
language : en
Publisher: Morgan Kaufmann
Release Date : 2010-07-28

System On Chip Test Architectures written by Laung-Terng Wang and has been published by Morgan Kaufmann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-07-28 with Technology & Engineering categories.

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.