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Procedures In Scanning Probe Microscopies


Procedures In Scanning Probe Microscopies
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Scanning Probe Microscopy


Scanning Probe Microscopy
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Author : Ernst Meyer
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-14

Scanning Probe Microscopy written by Ernst Meyer and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-14 with Science categories.


Two decades after its invention, scanning probe microscopy has become a widely used method in laboratories as diverse as industrial magnetic stor age development or structural biology. Consequently, the community of users ranges from biologists and medical researchers to physicists and engineers, all of them exploiting the unrivalled resolution and profiting from the relative simplicity of the experimental implementation. In recent years the authors have taught numerous courses on scanning probe microscopy, normally in combination with hands-on student experi ments. The audiences ranged from physics freshmen to biology post-docs and even high-school teachers. We found it of particular importance to cover not only the physical principles behind scanning probe microscopy but also ques tions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. With this book our intention is to provide a gen eral textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy labora tory.



Procedures In Scanning Probe Microscopies


Procedures In Scanning Probe Microscopies
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Author : Richard J. Colton
language : en
Publisher:
Release Date : 1998-08-21

Procedures In Scanning Probe Microscopies written by Richard J. Colton and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-08-21 with Medical categories.


Procedures in Scanning Probe Microscopies Edited by R J Colton, Naval Research Laboratory, Washington DC, USA A Engel, Biocenter, Basel University, Switzerland J Frommer, IBM Almaden Research Center, San Jose, CA, USA H E Gaub, Technical University, Munich, Germany A A Gewirth, University of Illinois, Urbana, IL, USA R Guckenberger, Max-Planck-Institute for Biochemistry, Martinsried, Germany W Heckl, Ludwig Maximillians University, Munich, Germany B Parkinson, Colorado State University, Fort Collins, CO, USA J Rabe, Humboldt University, Berlin, Germany Scanning Probe Microscopies (SPM) are revolutionising scientific discovery in diverse disciplines including organic, inorganic and physical chemistry, polymer and materials science, biological and medical systems, electrochemistry and nanotechnology. In this collection of protocols, Procedures in Scanning Probe Microscopies will enable you to: * Build confidence in using SPM * Maximise the potential of your SPM instrumentation * Extend your skill levels The only applications-orientated guide, Procedures in Scanning Probe Microscopies covers scanning tunnelling microscopy, atomic force microscopy and electrochemical methods.



Procedures In Scanning Probe Microscopies


Procedures In Scanning Probe Microscopies
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Author : Frommer's Staff
language : en
Publisher:
Release Date : 1995-06-01

Procedures In Scanning Probe Microscopies written by Frommer's Staff and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1995-06-01 with categories.




Scanning Probe Microscopy


Scanning Probe Microscopy
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Author : Nikodem Tomczak
language : en
Publisher: World Scientific
Release Date : 2010-12-13

Scanning Probe Microscopy written by Nikodem Tomczak and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-12-13 with Science categories.


Scanning Probe Microscopy (SPM) is the enabling tool for nano(bio)technology, which has opened new vistas in many interdisciplinary research areas. Concomitant with the developments in SPM instrumentation and techniques are new and previously unthought-of opportunities in materials nanofabrication and characterisation. In particular, the developments in addressing and manipulating matter at the level of single atoms or molecules, and studies of biological materials (e.g. live cells, or cell membranes) result in new and exciting discoveries.The rising importance of SPM demands a concise treatment in the form of a book which is accessible to interdisciplinary practitioners. This book highlights recent advances in the field of SPM with sufficient depth and breadth to provide an intellectually stimulating overview of the current state of the art. The book is based on a set of carefully selected original works from renowned contributors on topics that range from atom technology, scanning tunneling spectroscopy of self-assembled nanostructures, SPM probe fabrication, scanning force microscopy applications in biology and materials science down to the single molecule level, novel scanning probe techniques, and nanolithography.The variety of topics underlines the strong interdisciplinary character of SPM related research and the combined expertise of the contributors gives us a unique opportunity to discuss possible future trends in SPM related research. This makes the book not merely a collection of already published material but an enlightening insight into cutting edge research and global SPM research trends.



Scanning Probe Microscopy


Scanning Probe Microscopy
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Author : Bert Voigtländer
language : en
Publisher: Springer
Release Date : 2015-02-24

Scanning Probe Microscopy written by Bert Voigtländer and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-02-24 with Technology & Engineering categories.


This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.



Quantitative Data Processing In Scanning Probe Microscopy


Quantitative Data Processing In Scanning Probe Microscopy
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Author : Petr Klapetek
language : en
Publisher: William Andrew
Release Date : 2012-12-31

Quantitative Data Processing In Scanning Probe Microscopy written by Petr Klapetek and has been published by William Andrew this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-31 with Science categories.


Accurate measurement at the nano-scale – nanometrology – is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected. In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website. - Unlocks the use of Scanning Probe Microscopy (SPM) for nanometrology applications in engineering, physics, life science and earth science settings - Provides practical guidance regarding areas of difficulty such as tip/sample interaction and calibration – making metrology applications achievable - Gives guidance on data collection and interpretation, including the use of software-based modeling (using applications that are mostly freely available)



Scanning Probe Microscopy


Scanning Probe Microscopy
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Author : Sergei V. Kalinin
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-04-03

Scanning Probe Microscopy written by Sergei V. Kalinin and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-04-03 with Technology & Engineering categories.


This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.



Acoustic Scanning Probe Microscopy


Acoustic Scanning Probe Microscopy
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Author : Francesco Marinello
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-10-04

Acoustic Scanning Probe Microscopy written by Francesco Marinello and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-04 with Science categories.


The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.



Scanning Probe Microscopy Characterization Nanofabrication And Device Application Of Functional Materials


Scanning Probe Microscopy Characterization Nanofabrication And Device Application Of Functional Materials
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Author : Paula M. Vilarinho
language : en
Publisher: Springer Science & Business Media
Release Date : 2005-02-21

Scanning Probe Microscopy Characterization Nanofabrication And Device Application Of Functional Materials written by Paula M. Vilarinho and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005-02-21 with Science categories.


As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.



Scanning Probe Microscopes


Scanning Probe Microscopes
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Author : K. S. Birdi
language : en
Publisher: CRC Press
Release Date : 2003-02-26

Scanning Probe Microscopes written by K. S. Birdi and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-02-26 with Science categories.


Scanning Probe Microscopes: Applications in Science and Technology explains, analyzes, and demonstrates the most widely used microscope in the family of microscopes -- the scanning probe microscope. Beginning with an introduction to the development of SPMs, the author introduces the basics of scanning tunneling and atomic force microscopes (STMs an