Quantitative Atomic Resolution Electron Microscopy
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Quantitative Atomic Resolution Electron Microscopy
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Author :
language : en
Publisher: Academic Press
Release Date : 2021-03-31
Quantitative Atomic Resolution Electron Microscopy written by and has been published by Academic Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-03-31 with Technology & Engineering categories.
Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more. - Contains contributions from leading authorities on the subject matter - Informs and updates on the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
Quantitative Atomic Resolution Electron Microscopy Using Advanced Statistical Techniques
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Author : Annick de Backer
language : en
Publisher:
Release Date : 2015
Quantitative Atomic Resolution Electron Microscopy Using Advanced Statistical Techniques written by Annick de Backer and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015 with categories.
Advanced Transmission Electron Microscopy
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Author : Jian Min Zuo
language : en
Publisher: Springer
Release Date : 2016-10-26
Advanced Transmission Electron Microscopy written by Jian Min Zuo and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-10-26 with Technology & Engineering categories.
This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.
Physical Principles Of Electron Microscopy
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Author : Ray Egerton
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-02-11
Physical Principles Of Electron Microscopy written by Ray Egerton and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-02-11 with Technology & Engineering categories.
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Impact Of Electron And Scanning Probe Microscopy On Materials Research
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Author : David G. Rickerby
language : en
Publisher: Springer Science & Business Media
Release Date : 1999-10-31
Impact Of Electron And Scanning Probe Microscopy On Materials Research written by David G. Rickerby and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999-10-31 with Science categories.
This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialised electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Recent developments in SPM are also described. A comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.
Quantitative Atomic Resolution Transmission Electron Microscopy For Heterogeneous Nanomaterials
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Author : Karel Van den Bos
language : en
Publisher:
Release Date : 2017
Quantitative Atomic Resolution Transmission Electron Microscopy For Heterogeneous Nanomaterials written by Karel Van den Bos and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017 with categories.
Aberration Corrected Imaging In Transmission Electron Microscopy
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Author : Rolf Erni
language : en
Publisher: World Scientific
Release Date : 2010
Aberration Corrected Imaging In Transmission Electron Microscopy written by Rolf Erni and has been published by World Scientific this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with Science categories.
This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it addresses recent advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science. It covers two of the most popular atomic resolution imaging techniques' namely high-resolution transmission electron microscopy and scanning transmission electron microscopy. The book bridges the gap between application-oriented textbooks in conventional electron microscopy and books in physics covering dedicated topics in charged-particle optics and aberration correction. The book is structured in three parts which can be read separately. While in the first part the fundamentals of the imaging techniques and their limits in conventional electron microscopes are explained, the second part provides readers with the basic principles of electron optics and the characteristics of electron lenses. The third part, focusing on aberrations, describes the functionality of aberration correctors and provides readers with practical guidelines for the daily work with aberration-corrected electron microscopes. The book represents a detailed and easy readable guide to aberration-corrected electron microscopy.
Aberration Corrected Analytical Transmission Electron Microscopy
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Author : Rik Brydson
language : en
Publisher: John Wiley & Sons
Release Date : 2011-08-02
Aberration Corrected Analytical Transmission Electron Microscopy written by Rik Brydson and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-08-02 with Science categories.
The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
Electron Energy Loss Spectroscopy In The Electron Microscope
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Author : R.F. Egerton
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09
Electron Energy Loss Spectroscopy In The Electron Microscope written by R.F. Egerton and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Science categories.
to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.
High Resolution Electron Microscopy
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Author : John C. H. Spence
language : en
Publisher: OUP Oxford
Release Date : 2013-09-12
High Resolution Electron Microscopy written by John C. H. Spence and has been published by OUP Oxford this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-09-12 with Science categories.
This new fourth edition of the standard text on atomic-resolution transmission electron microscopy (TEM) retains previous material on the fundamentals of electron optics and aberration correction, linear imaging theory (including wave aberrations to fifth order) with partial coherence, and multiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highest quality images of atoms and molecules using a modern TEM or STEM electron microscope. Applications sections have been updated - these include the semiconductor industry, superconductor research, solid state chemistry and nanoscience, and metallurgy, mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography, aberration correction, field-emission guns, imaging filters, super-resolution methods, Ptychography, Ronchigrams, tomography, image quantification and simulation, radiation damage, the measurement of electron-optical parameters, and detectors (CCD cameras, Image plates and direct-injection solid state detectors). The theory of Scanning transmission electron microscopy (STEM) and Z-contrast are treated comprehensively. Chapters are devoted to associated techniques, such as energy-loss spectroscopy, Alchemi, nanodiffraction, environmental TEM, twisty beams for magnetic imaging, and cathodoluminescence. Sources of software for image interpretation and electron-optical design are given.