Recent Developments In Thin Film Research Epitaxial Growth And Nanostructures Electron Microscopy And X Ray Diffraction
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Recent Developments In Thin Film Research Epitaxial Growth And Nanostructures Electron Microscopy And X Ray Diffraction
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Author : G. Ritter
language : en
Publisher: Elsevier Science
Release Date : 1998-08-26
Recent Developments In Thin Film Research Epitaxial Growth And Nanostructures Electron Microscopy And X Ray Diffraction written by G. Ritter and has been published by Elsevier Science this book supported file pdf, txt, epub, kindle and other format this book has been release on 1998-08-26 with Technology & Engineering categories.
The ICAM'97 symposium on "Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures" was presented at the combined 1997 International Conference on Applied Materials/European Materials Research Society Spring meeting (ICAM'97/E-MRS'97) held in Strasbourg (France) from 16-20 June 1997. . More than 60 participants representing 10 countries met to discuss the recent developments related to the study of crystalline structure of thin films: first stages of growth, morphology, strains and their relaxation. The aim of this symposium was to discuss the applications of both electron microscopy and X-ray diffraction in thin film studies. X-ray diffraction is a non-destructive method giving very accurate information in reciprocal space for the determination of crystalline data. Many of the contributions were concerned with following such growth processes such as epitaxy of metals and semiconducting materials, measuring the average strain and the structure and the morphology of the films. The electron microscopy investigations allow the study of microstructures and crystalline defects. The main handicap is the necessity for the destruction of the specimens. Electron microscopy is useful for studying the randomly distributed failures in periodicity of crystalline structures.
Surface Microscopy With Low Energy Electrons
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Author : Ernst Bauer
language : en
Publisher: Springer
Release Date : 2014-07-10
Surface Microscopy With Low Energy Electrons written by Ernst Bauer and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-07-10 with Technology & Engineering categories.
This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.
Impact Of Electron And Scanning Probe Microscopy On Materials Research
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Author : David G. Rickerby
language : en
Publisher: Springer Science & Business Media
Release Date : 1999-10-31
Impact Of Electron And Scanning Probe Microscopy On Materials Research written by David G. Rickerby and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 1999-10-31 with Science categories.
This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialised electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Recent developments in SPM are also described. A comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.
Progress In Transmission Electron Microscopy 2
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Author : Xiao-Feng Zhang
language : en
Publisher: Springer Science & Business Media
Release Date : 2001-10-18
Progress In Transmission Electron Microscopy 2 written by Xiao-Feng Zhang and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001-10-18 with Medical categories.
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume 2 illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
Microscopy Of Semiconducting Materials 2007
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Author : A.G. Cullis
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-12-02
Microscopy Of Semiconducting Materials 2007 written by A.G. Cullis and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-12-02 with Technology & Engineering categories.
This volume contains invited and contributed papers presented at the conference on ‘Microscopy of Semiconducting Materials’ held at the University of Cambridge on 2-5 April 2007. The event was organised under the auspices of the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society and the Materials Research Society. This international conference was the fifteenth in the series that focuses on the most recent world-wide advances in semiconductor studies carried out by all forms of microscopy and it attracted delegates from more than 20 countries. With the relentless evolution of advanced electronic devices into ever smaller nanoscale structures, the problem relating to the means by which device features can be visualised on this scale becomes more acute. This applies not only to the imaging of the general form of layers that may be present but also to the determination of composition and doping variations that are employed. In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes. All associated imaging and analytical techniques were demonstrated in studies including those of self-organised and quantum domain structures. Many analytical techniques based upon scanning probe microscopies were also much in evidence, together with more general applications of X-ray diffraction methods.
Epitaxial Growth Part A
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Author : J Matthews
language : en
Publisher: Elsevier
Release Date : 2012-12-02
Epitaxial Growth Part A written by J Matthews and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-02 with Science categories.
Epitaxial Growth, Part A is a compilation of review articles that describe various aspects of the growth of single-crystal films on single-crystal substrates. The collection contains topics on the historical development of epitaxy, the nucleation of thin films, the structure of the interface between film and substrate, and the generation of defects during film growth. The text also provides descriptions of the methods used to prepare and examine thin films and a list of the overgrowth-substrate combinations studied. Mineralogists, materials engineers and scientists, and physicists will find this book a great source of insight.
Recent Advances In Thin Films
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Author : Sushil Kumar
language : en
Publisher: Springer Nature
Release Date : 2020-08-27
Recent Advances In Thin Films written by Sushil Kumar and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2020-08-27 with Technology & Engineering categories.
This volume comprises the expert contributions from the invited speakers at the 17th International Conference on Thin Films (ICTF 2017), held at CSIR-NPL, New Delhi, India. Thin film research has become increasingly important over the last few decades owing to the applications in latest technologies and devices. The book focuses on current advances in thin film deposition processes and characterization including thin film measurements. The chapters cover different types of thin films like metal, dielectric, organic and inorganic, and their diverse applications across transistors, resistors, capacitors, memory elements for computers, optical filters and mirrors, sensors, solar cells, LED's, transparent conducting coatings for liquid crystal display, printed circuit board, and automobile headlamp covers. This book can be a useful reference for students, researchers as well as industry professionals by providing an up-to-date knowledge on thin films and coatings.
Thin Film Growth Techniques For Low Dimensional Structures
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Author : R.F.C. Farrow
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-03-09
Thin Film Growth Techniques For Low Dimensional Structures written by R.F.C. Farrow and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-03-09 with Technology & Engineering categories.
This work represents the account of a NATO Advanced Research Workshop on "Thin Film Growth Techniques for Low Dimensional Structures", held at the University of Sussex, Brighton, England from 15-19 Sept. 1986. The objective of the workshop was to review the problems of the growth and characterisation of thin semiconductor and metal layers. Recent advances in deposition techniques have made it possible to design new material which is based on ultra-thin layers and this is now posing challenges for scientists, technologists and engineers in the assessment and utilisation of such new material. Molecular beam epitaxy (MBE) has become well established as a method for growing thin single crystal layers of semiconductors. Until recently, MBE was confined to the growth of III-V compounds and alloys, but now it is being used for group IV semiconductors and II-VI compounds. Examples of such work are given in this volume. MBE has one major advantage over other crystal growth techniques in that the structure of the growing layer can be continuously monitored using reflection high energy electron diffraction (RHEED). This technique has offered a rare bonus in that the time dependent intensity variations of RHEED can be used to determine growth rates and alloy composition rather precisely. Indeed, a great deal of new information about the kinetics of crystal growth from the vapour phase is beginning to emerge.
Thin Film Growth
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Author : Zexian Cao
language : en
Publisher: Elsevier
Release Date : 2011-07-18
Thin Film Growth written by Zexian Cao and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-07-18 with Technology & Engineering categories.
Thin film technology is used in many applications such as microelectronics, optics, hard and corrosion resistant coatings and micromechanics, and thin films form a uniquely versatile material base for the development of novel technologies within these industries. Thin film growth provides an important and up-to-date review of the theory and deposition techniques used in the formation of thin films. Part one focuses on the theory of thin film growth, with chapters covering nucleation and growth processes in thin films, phase-field modelling of thin film growth and surface roughness evolution. Part two covers some of the techniques used for thin film growth, including oblique angle deposition, reactive magnetron sputtering and epitaxial growth of graphene films on single crystal metal surfaces. This section also includes chapters on the properties of thin films, covering topics such as substrate plasticity and buckling of thin films, polarity control, nanostructure growth dynamics and network behaviour in thin films. With its distinguished editor and international team of contributors, Thin film growth is an essential reference for engineers in electronics, energy materials and mechanical engineering, as well as those with an academic research interest in the topic. Provides an important and up-to-date review of the theory and deposition techniques used in the formation of thin films Focusses on the theory and modelling of thin film growth, techniques and mechanisms used for thin film growth and properties of thin films An essential reference for engineers in electronics, energy materials and mechanical engineering
In Situ Characterization Of Thin Film Growth
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Author : Gertjan Koster
language : en
Publisher: Elsevier
Release Date : 2011-10-05
In Situ Characterization Of Thin Film Growth written by Gertjan Koster and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-10-05 with Technology & Engineering categories.
Advanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ characterization of thin film growth reviews current and developing techniques for characterizing the growth of thin films, covering an important gap in research. Part one covers electron diffraction techniques for in situ study of thin film growth, including chapters on topics such as reflection high-energy electron diffraction (RHEED) and inelastic scattering techniques. Part two focuses on photoemission techniques, with chapters covering ultraviolet photoemission spectroscopy (UPS), X-ray photoelectron spectroscopy (XPS) and in situ spectroscopic ellipsometry for characterization of thin film growth. Finally, part three discusses alternative in situ characterization techniques. Chapters focus on topics such as ion beam surface characterization, real time in situ surface monitoring of thin film growth, deposition vapour monitoring and the use of surface x-ray diffraction for studying epitaxial film growth. With its distinguished editors and international team of contributors, In situ characterization of thin film growth is a standard reference for materials scientists and engineers in the electronics and photonics industries, as well as all those with an academic research interest in this area. Chapters review electron diffraction techniques, including the methodology for observations and measurements Discusses the principles and applications of photoemission techniques Examines alternative in situ characterisation techniques