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Reliability Of Cmos Analog Ics


Reliability Of Cmos Analog Ics
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Reliability Of Cmos Analog Ics


Reliability Of Cmos Analog Ics
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Author : Hakan Kuntman
language : en
Publisher: Springer Nature
Release Date : 2025-07-14

Reliability Of Cmos Analog Ics written by Hakan Kuntman and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2025-07-14 with Technology & Engineering categories.


This book presents recent advances in reliability investigation of MOS transistors and their applications. Theory and experimental results are discussed, in order to demonstrate the efficacy of the techniques presented. Readers will be enabled to improve their designs in application areas of analog signal processing, ranging from very low frequencies at several Hz levels of biomedical signals to RF applications operating at GHz level, from EEG signals to cognitive radio and encrypted communications or low-noise amplifiers in wireless communications.



Analog Ic Reliability In Nanometer Cmos


Analog Ic Reliability In Nanometer Cmos
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Author : Elie Maricau
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-01-11

Analog Ic Reliability In Nanometer Cmos written by Elie Maricau and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-01-11 with Technology & Engineering categories.


This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.



Cmos


 Cmos
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Author : Behzad Razavi
language : zh-CN
Publisher: 清华大学出版社有限公司
Release Date : 2005

Cmos written by Behzad Razavi and has been published by 清华大学出版社有限公司 this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005 with Linear integrated circuits categories.


本书介绍了模拟电路设计的基本概念, 说明了CMOS模拟集成电路设计技术的重要作用, 描述了MOS器件的物理模型及工作特性等.



Reliability Engineering


Reliability Engineering
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Author : A. Birolini
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-17

Reliability Engineering written by A. Birolini and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Science categories.


Reliability engineering is a rapidly evolving discipline, whose purpose is to develop methods and tools to predict, evaluate, and demonstrate reliability, maintainability, and availability of components, equipment, and systems, as well as to support development and production engineers in building in reliability and maintainability. To be cost and time effective, reliability engineering has to be coordinated with quality assurance activities, in agreement with Total Quality Management (TQM) and Concurrent Engineering efforts. To build in reliability and maintainability into complex equipment or systems, failure rate and failure mode analyses have to be performed early in the development phase and be supported by design guidelines for reliability, maintainability, and software quality as well as by extensive design reviews. Before production, qualification tests on prototypes are necessary to ensure that quality and reliability targets have been met. In the production phase, processes need to be selected and monitored to assure the required quality level. For many systems, availability requirements have also to be satisfied. In these cases, stochastic processes can be used to investigate and optimize availability. including logistical support as well. Software often plays a dominant role, requiring specific quality assurance activities. This book presents the state-of-the-art of reliability engineering, both in theory and practice. It is based on over 25 years experience of the author in this field, half of which was in industry and half as Professor for reliability engineering at the ETH (Swiss Federal Institute of Technology Zurich).



Reliability Engineering


Reliability Engineering
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Author : Alessandro Birolini
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-17

Reliability Engineering written by Alessandro Birolini and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-17 with Science categories.


The large interest granted to this book made a 4th edition necessary. The structure of the book is unchanged, with its main part in Chapters 1 - 8 and self contained appendices Al - A5 on management aspects and A6 -A8 on basic probability theory, stochastic processes & statistics. Such a structure allows rapid access to practical results and a comprehensive introduction to the mathematical foundation of reliability theory. The content has been extended and reviewed. New models & considerations have been added to Appendix A 7 for stochastic processes (NHPP), Chapter 4 for spare parts provisioning, Chapter 6 for complex repairable systems (imperfect switching, incomplete coverage, items with more than two states, phased-mission systems, fault tolerant reconfigurable systems with reward and frequency / duration aspects, Monte Carlo simulation), and Chapters 7 & 8 for reliability data analysis. Some results come from a stay in 2001 as Visiting Fellow at the Institute of Advanced Study of the University of Bologna. Performance, dependability, cost, and time to market are key factors for today's products and services. However, failure of complex systems can have major safety consequences.



Quality And Reliability Of Technical Systems


Quality And Reliability Of Technical Systems
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Author : Alessandro Birolini
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-12-06

Quality And Reliability Of Technical Systems written by Alessandro Birolini and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-06 with Technology & Engineering categories.


High reliability, maintanability, and safety are expected fro complex equipment and systems. This book presents state-of-the-art methods and procedures used for cost and time effective quality and reliability assurance during the design and production of equipment and systems. It is based on more than 20 years experience gained by the author in research and industry. The book covers theory, practice, and management aspects and addresses the needs of scientists, system-oriented engineers, engineers in development and production and project and quality assurance managers. The second edition has been completely updated revised and includes modern concepts such as Total Quality Management (TQM) and Concurrent Engineering.



Systematic Design Of Analog Cmos Circuits


Systematic Design Of Analog Cmos Circuits
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Author : Paul G. A. Jespers
language : en
Publisher: Cambridge University Press
Release Date : 2017-10-12

Systematic Design Of Analog Cmos Circuits written by Paul G. A. Jespers and has been published by Cambridge University Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-10-12 with Technology & Engineering categories.


This hands-on guide contains a fresh approach to efficient and insight-driven integrated circuit design in nanoscale-CMOS. With downloadable MATLAB code and over forty detailed worked examples, this is essential reading for professional engineers, researchers, and graduate students in analog circuit design.



Microcircuit Reliability Bibliography


Microcircuit Reliability Bibliography
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Author :
language : en
Publisher:
Release Date : 1978

Microcircuit Reliability Bibliography written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1978 with Integrated circuits categories.




Cmos


Cmos
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Author : R. Jacob Baker
language : en
Publisher: John Wiley & Sons
Release Date : 2008

Cmos written by R. Jacob Baker and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008 with Technology & Engineering categories.


This edition provides an important contemporary view of a wide range of analog/digital circuit blocks, the BSIM model, data converter architectures, and more. The authors develop design techniques for both long- and short-channel CMOS technologies and then compare the two.



Cmos Electronics


Cmos Electronics
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Author : Jaume Segura
language : en
Publisher: John Wiley & Sons
Release Date : 2004-03-26

Cmos Electronics written by Jaume Segura and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004-03-26 with Technology & Engineering categories.


CMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the financial as well as the engineering bottom line. This book educates readers, including non-engineers involved in CMOS manufacture, to identify and remedy these causes. This book instills the electronic knowledge that affects not just design but other important areas of manufacturing such as test, reliability, failure analysis, yield-quality issues, and problems. Designed specifically for the many non-electronic engineers employed in the semiconductor industry who need to reliably manufacture chips at a high rate in large quantities, this is a practical guide to how CMOS electronics work, how failures occur, and how to diagnose and avoid them. Key features: Builds a grasp of the basic electronics of CMOS integrated circuits and then leads the reader further to understand the mechanisms of failure. Unique descriptions of circuit failure mechanisms, some found previously only in research papers and others new to this publication. Targeted to the CMOS industry (or students headed there) and not a generic introduction to the broader field of electronics. Examples, exercises, and problems are provided to support the self-instruction of the reader.