Reliability Yield And Stress Burn In
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Reliability Yield And Stress Burn In
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Author : Way Kuo
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-11-27
Reliability Yield And Stress Burn In written by Way Kuo and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-11-27 with Technology & Engineering categories.
The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operation and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: • the economic impact of employing the microelectronics fabricated by in dustry, • a study of the relationship between reliability and yield, • the progression toward miniaturization and higher reliability, and • the correctness and complexity of new system designs, which include a very significant portion of software.
Reliability Yield And Stress Burn In
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Author : Way Kuo
language : en
Publisher:
Release Date : 2014-09-01
Reliability Yield And Stress Burn In written by Way Kuo and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-09-01 with categories.
Springer Handbook Of Engineering Statistics
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Author : Hoang Pham
language : en
Publisher: Springer Science & Business Media
Release Date : 2006
Springer Handbook Of Engineering Statistics written by Hoang Pham and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006 with Business & Economics categories.
In today’s global and highly competitive environment, continuous improvement in the processes and products of any field of engineering is essential for survival. This book gathers together the full range of statistical techniques required by engineers from all fields. It will assist them to gain sensible statistical feedback on how their processes or products are functioning and to give them realistic predictions of how these could be improved. The handbook will be essential reading for all engineers and engineering-connected managers who are serious about keeping their methods and products at the cutting edge of quality and competitiveness.
System On Chip
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Author : Bashir M. Al-Hashimi
language : en
Publisher: IET
Release Date : 2006-01-31
System On Chip written by Bashir M. Al-Hashimi and has been published by IET this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-01-31 with Technology & Engineering categories.
This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.
Interlayer Dielectrics For Semiconductor Technologies
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Author : Shyam P Muraka
language : en
Publisher: Elsevier
Release Date : 2003-10-13
Interlayer Dielectrics For Semiconductor Technologies written by Shyam P Muraka and has been published by Elsevier this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-10-13 with Science categories.
Semiconductor technologies are moving at such a fast pace that new materials are needed in all types of application. Manipulating the materials and their properties at atomic dimensions has become a must. This book presents the case of interlayer dielectrics materials whilst considering these challenges. Interlayer Dielectrics for Semiconductor Technologies cover the science, properties and applications of dielectrics, their preparation, patterning, reliability and characterisation, followed by the discussion of different materials including those with high dielctric constants and those useful for waveguide applications in optical communications on the chip and the package. * Brings together for the FIRST time the science and technology of interlayer deilectrics materials, in one volume * written by renowned experts in the field * Provides an up-to-date starting point in this young research field.
Statistical Quality Technologies
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Author : Yuhlong Lio
language : en
Publisher: Springer
Release Date : 2019-08-09
Statistical Quality Technologies written by Yuhlong Lio and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2019-08-09 with Mathematics categories.
This book explores different statistical quality technologies including recent advances and applications. Statistical process control, acceptance sample plans and reliability assessment are some of the essential statistical techniques in quality technologies to ensure high quality products and to reduce consumer and producer risks. Numerous statistical techniques and methodologies for quality control and improvement have been developed in recent years to help resolve current product quality issues in today’s fast changing environment. Featuring contributions from top experts in the field, this book covers three major topics: statistical process control, acceptance sampling plans, and reliability testing and designs. The topics covered in the book are timely and have a high potential impact and influence to academics, scholars, students and professionals in statistics, engineering, manufacturing and health.
Stochastic Modeling For Reliability
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Author : Maxim Finkelstein
language : en
Publisher: Springer Science & Business Media
Release Date : 2013-04-12
Stochastic Modeling For Reliability written by Maxim Finkelstein and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-04-12 with Technology & Engineering categories.
Focusing on shocks modeling, burn-in and heterogeneous populations, Stochastic Modeling for Reliability naturally combines these three topics in the unified stochastic framework and presents numerous practical examples that illustrate recent theoretical findings of the authors. The populations of manufactured items in industry are usually heterogeneous. However, the conventional reliability analysis is performed under the implicit assumption of homogeneity, which can result in distortion of the corresponding reliability indices and various misconceptions. Stochastic Modeling for Reliability fills this gap and presents the basics and further developments of reliability theory for heterogeneous populations. Specifically, the authors consider burn-in as a method of elimination of ‘weak’ items from heterogeneous populations. The real life objects are operating in a changing environment. One of the ways to model an impact of this environment is via the external shocks occurring in accordance with some stochastic point processes. The basic theory for Poisson shock processes is developed and also shocks as a method of burn-in and of the environmental stress screening for manufactured items are considered. Stochastic Modeling for Reliability introduces and explores the concept of burn-in in heterogeneous populations and its recent development, providing a sound reference for reliability engineers, applied mathematicians, product managers and manufacturers alike.
Thermal And Power Management Of Integrated Circuits
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Author : Arman Vassighi
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-06-01
Thermal And Power Management Of Integrated Circuits written by Arman Vassighi and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-06-01 with Technology & Engineering categories.
In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing. Proper thermal management is the key to achieve high performance, quality and reliability. Performance and reliability of integrated circuits are strong functions of the junction temperature. A small increase in junction temperature may result in significant reduction in the device lifetime. This book reviews the significance of the junction temperature as a reliability measure under nominal and burn-in conditions. The latest research in the area of electro-thermal modeling of integrated circuits will also be presented. Recent models and associated CAD tools are covered and various techniques at the circuit and system levels are reviewed. Subsequently, the authors provide an insight into the concept of thermal runaway and how it may best be avoided. A section on low temperature operation of integrated circuits concludes the book.
Improving Product Reliability
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Author : Mark A. Levin
language : en
Publisher: John Wiley & Sons
Release Date : 2003-05-07
Improving Product Reliability written by Mark A. Levin and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2003-05-07 with Technology & Engineering categories.
The design and manufacture of reliable products is a major challenge for engineers and managers. This book arms technical managers and engineers with the tools to compete effectively through the design and production of reliable technology products.
Naval Research Logistics
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Author :
language : en
Publisher:
Release Date : 2004
Naval Research Logistics written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2004 with Electronic journals categories.