Sample Preparation Handbook For Transmission Electron Microscopy
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Sample Preparation Handbook For Transmission Electron Microscopy
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Author : Jeanne Ayache
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-06-08
Sample Preparation Handbook For Transmission Electron Microscopy written by Jeanne Ayache and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-06-08 with Technology & Engineering categories.
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti c literature detailing speci c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin specimen preparation have appeared until this present work, rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Sample Preparation Handbook For Transmission Electron Microscopy
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Author : Jeanne Ayache
language : en
Publisher: Springer
Release Date : 2010-07-08
Sample Preparation Handbook For Transmission Electron Microscopy written by Jeanne Ayache and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-07-08 with Technology & Engineering categories.
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Sample Preparation Handbook For Transmission Electron Microscopy
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Author : Jeanne Ayache
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-07-03
Sample Preparation Handbook For Transmission Electron Microscopy written by Jeanne Ayache and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-07-03 with Technology & Engineering categories.
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Sample Preparation Handbook For Transmission Electron Microscopy
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Author : Jeanne Ayache
language : en
Publisher: Springer
Release Date : 2010-07-09
Sample Preparation Handbook For Transmission Electron Microscopy written by Jeanne Ayache and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-07-09 with Technology & Engineering categories.
This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. The first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology. The second volume, Sample Preparation Handbook for Transmission Electron Microscopy: Techniques, describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis. Compatibility and pre-treatments are also discussed. Experimental conditions and guidelines, options and variations, advantages and constraints, technical hints from the authors’ years of experience, common artifacts, and theoretical issues are all considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. This practical and authoritative reference companion deserves a place on the bench in every TEM lab. Key Features of the Handbook: Combines all of the latest techniques for the preparation of mineral to biological samples Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level) Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis Links to a complementary interactive database website which is available to scientists worldwide* Written by authors with 100 years of combined experience in electron microscopy *http://temsamprep.in2p3.fr/
Handbook Of Sample Preparation For Scanning Electron Microscopy And X Ray Microanalysis
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Author : Patrick Echlin
language : en
Publisher: Springer
Release Date : 2010-11-23
Handbook Of Sample Preparation For Scanning Electron Microscopy And X Ray Microanalysis written by Patrick Echlin and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-11-23 with Technology & Engineering categories.
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Handbook Of Nanoscopy
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Author : Gustaaf van Tendeloo
language : en
Publisher: John Wiley & Sons
Release Date : 2012-12-21
Handbook Of Nanoscopy written by Gustaaf van Tendeloo and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-12-21 with Technology & Engineering categories.
This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the optical to the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals, alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are divided between methods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and engineers, as well as graduate students and their lecturers.
Handbook Of Nanoscopy 2 Volume Set
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Author : Gustaaf van Tendeloo
language : en
Publisher: John Wiley & Sons
Release Date : 2012-05-21
Handbook Of Nanoscopy 2 Volume Set written by Gustaaf van Tendeloo and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-05-21 with Technology & Engineering categories.
This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the optical to the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals, alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are divided between methods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and engineers, as well as graduate students and their lecturers.
Transmission Electron Microscopy
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Author : C. Barry Carter
language : en
Publisher: Springer
Release Date : 2016-08-24
Transmission Electron Microscopy written by C. Barry Carter and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-08-24 with Technology & Engineering categories.
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Transmission Electron Microscopy
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Author : Andrzej Marek Żak
language : en
Publisher: Walter de Gruyter GmbH & Co KG
Release Date : 2024-11-04
Transmission Electron Microscopy written by Andrzej Marek Żak and has been published by Walter de Gruyter GmbH & Co KG this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-11-04 with Technology & Engineering categories.
Transmission electron microscopy is a powerful tool for looking at small physical specimens from nanomaterials, metal alloys and other structural materials, to microorganisms, tissues and biomacromolecules. The book covers microscope design and explains how the miscoscope functions and operates. It provides the essential theoretical and practical information in a compact manner together with case studies and a summary of good operator practices.