Scanning Probe Microscopy In Industrial Applications
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Scanning Probe Microscopy In Industrial Applications
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Author : Dalia G. Yablon
language : en
Publisher: John Wiley & Sons
Release Date : 2013-10-24
Scanning Probe Microscopy In Industrial Applications written by Dalia G. Yablon and has been published by John Wiley & Sons this book supported file pdf, txt, epub, kindle and other format this book has been release on 2013-10-24 with Technology & Engineering categories.
Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.
Industrial Applications Of Scanned Probe Microscopy
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Author : Workshop on Industrial Applications of Scanned Probe Microscopy
language : en
Publisher:
Release Date : 1994
Industrial Applications Of Scanned Probe Microscopy written by Workshop on Industrial Applications of Scanned Probe Microscopy and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 1994 with Scanning probe microscopy categories.
Applied Scanning Probe Methods Xiii
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-10-29
Applied Scanning Probe Methods Xiii written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-10-29 with Technology & Engineering categories.
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Applied Scanning Probe Methods X
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-12-20
Applied Scanning Probe Methods X written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-12-20 with Technology & Engineering categories.
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
Applied Scanning Probe Methods Iv
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-04-28
Applied Scanning Probe Methods Iv written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-04-28 with Technology & Engineering categories.
Applied Scanning Probe Methods I
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2014-02-26
Applied Scanning Probe Methods I written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-02-26 with Technology & Engineering categories.
Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM.
Applied Scanning Probe Methods Xi
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2008-10-22
Applied Scanning Probe Methods Xi written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-10-22 with Technology & Engineering categories.
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.
Scanning Probe Microscopy In Nanoscience And Nanotechnology 2
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-12-17
Scanning Probe Microscopy In Nanoscience And Nanotechnology 2 written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-12-17 with Technology & Engineering categories.
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Applied Scanning Probe Methods Vii
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Author : Bharat Bhushan
language : en
Publisher: Springer
Release Date : 2010-11-23
Applied Scanning Probe Methods Vii written by Bharat Bhushan and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-11-23 with Technology & Engineering categories.
The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments. Volume VII presents 9 chapters on a variety of new and emerging techniques and refinements of SPM applications.
Scanning Probe Microscopy In Nanoscience And Nanotechnology 3
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Author : Bharat Bhushan
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-10-24
Scanning Probe Microscopy In Nanoscience And Nanotechnology 3 written by Bharat Bhushan and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-10-24 with Science categories.
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.