Soft Error Mechanisms Modeling And Mitigation
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Soft Error Mechanisms Modeling And Mitigation
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Author : Selahattin Sayil
language : en
Publisher: Springer
Release Date : 2016-02-25
Soft Error Mechanisms Modeling And Mitigation written by Selahattin Sayil and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-02-25 with Technology & Engineering categories.
This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time.
Mitigating Process Variability And Soft Errors At Circuit Level For Finfets
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Author : Alexandra Zimpeck
language : en
Publisher: Springer Nature
Release Date : 2021-03-10
Mitigating Process Variability And Soft Errors At Circuit Level For Finfets written by Alexandra Zimpeck and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-03-10 with Technology & Engineering categories.
This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical properties of devices. The authors also explore four circuit-level techniques (e.g. transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells. This book also evaluates the mitigation tendency when different levels of process variation, transistor sizing, and radiation particle characteristics are applied in the design. An overall comparison of all methods addressed by this work is provided allowing to trace a trade-off between the reliability gains and the design penalties of each approach regarding the area, performance, power consumption, single event transient (SET) pulse width, and SET cross-section.
Soft Errors In Modern Electronic Systems
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Author : Michael Nicolaidis
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-09-24
Soft Errors In Modern Electronic Systems written by Michael Nicolaidis and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-09-24 with Technology & Engineering categories.
This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.
Efficient Techniques For Modeling And Mitigation Of Soft Errors In Nanometer Scale Static Cmos Logic Circuits
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Author : Srivathsan Krishnamohan
language : en
Publisher:
Release Date : 2005
Efficient Techniques For Modeling And Mitigation Of Soft Errors In Nanometer Scale Static Cmos Logic Circuits written by Srivathsan Krishnamohan and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2005 with Logic circuits categories.
Single Event Effects From Space To Accelerator Environments
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Author : Ygor Quadros de Aguiar
language : en
Publisher: Springer Nature
Release Date : 2024-10-17
Single Event Effects From Space To Accelerator Environments written by Ygor Quadros de Aguiar and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-10-17 with Technology & Engineering categories.
This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described. Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA. Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context This is an open access book.
Machine Learning Support For Fault Diagnosis Of System On Chip
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Author : Patrick Girard
language : en
Publisher: Springer Nature
Release Date : 2023-03-13
Machine Learning Support For Fault Diagnosis Of System On Chip written by Patrick Girard and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-03-13 with Technology & Engineering categories.
This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.
Built In Fault Tolerant Computing Paradigm For Resilient Large Scale Chip Design
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Author : Xiaowei Li
language : en
Publisher: Springer Nature
Release Date : 2023-03-01
Built In Fault Tolerant Computing Paradigm For Resilient Large Scale Chip Design written by Xiaowei Li and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-03-01 with Computers categories.
With the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built-in on-chip fault-tolerant computing paradigm that seeks to combine fault detection, fault diagnosis, and error recovery in large-scale VLSI design in a unified manner so as to minimize resource overhead and performance penalties. Following this computing paradigm, we propose a holistic solution based on three key components: self-test, self-diagnosis and self-repair, or “3S” for short. We then explore the use of 3S for general IC designs, general-purpose processors, network-on-chip (NoC) and deep learning accelerators, and present prototypes to demonstrate how 3S responds to in-field silicon degradation and recovery under various runtime faults caused by aging, process variations, or radical particles. Moreover, we demonstrate that 3S not only offers a powerful backbone for various on-chip fault-tolerant designs and implementations, but also has farther-reaching implications such as maintaining graceful performance degradation, mitigating the impact of verification blind spots, and improving chip yield. This book is the outcome of extensive fault-tolerant computing research pursued at the State Key Lab of Processors, Institute of Computing Technology, Chinese Academy of Sciences over the past decade. The proposed built-in on-chip fault-tolerant computing paradigm has been verified in a broad range of scenarios, from small processors in satellite computers to large processors in HPCs. Hopefully, it will provide an alternative yet effective solution to the growing reliability challenges for large-scale VLSI designs.
Reliable Software For Unreliable Hardware
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Author : Semeen Rehman
language : en
Publisher: Springer
Release Date : 2016-04-20
Reliable Software For Unreliable Hardware written by Semeen Rehman and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2016-04-20 with Technology & Engineering categories.
This book describes novel software concepts to increase reliability under user-defined constraints. The authors’ approach bridges, for the first time, the reliability gap between hardware and software. Readers will learn how to achieve increased soft error resilience on unreliable hardware, while exploiting the inherent error masking characteristics and error (stemming from soft errors, aging, and process variations) mitigations potential at different software layers.
Noise Contamination In Nanoscale Vlsi Circuits
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Author : Selahattin Sayil
language : en
Publisher: Springer Nature
Release Date : 2022-08-31
Noise Contamination In Nanoscale Vlsi Circuits written by Selahattin Sayil and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2022-08-31 with Technology & Engineering categories.
This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.
Software Implemented Hardware Fault Tolerance
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Author : Olga Goloubeva
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-09-19
Software Implemented Hardware Fault Tolerance written by Olga Goloubeva and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-09-19 with Technology & Engineering categories.
Software-Implemented Hardware Fault Tolerance addresses the innovative topic of software-implemented hardware fault tolerance (SIHFT), i.e., how to deal with faults affecting the hardware by only (or mainly) acting on the software. The first SIHFT techniques were proposed and adopted several decades ago, but they have been the object of new interest in the past few years, mainly due to the need for developing low-cost safety-critical computer-based applications in fields such as automotive, biomedics, and telecommunications. Therefore, several new approaches to detect, and when possible correct, transient and permanent faults in the hardware have been recently proposed. These approaches are innovative (with respect to those proposed in the past) since they are of higher applicability (often starting from the source-level code of an application) and generality, being capable of coping with many different fault types. The book presents the theory behind software-implemented hardware fault tolerance, as well as the practical aspects related to put it at work on real examples. By evaluating accurately the advantages and disadvantages of the already available approaches, the book provides a guide to developers willing to adopt software-implemented hardware fault tolerance in their applications. Moreover, the book identifies open issues for researchers willing to improve the already available techniques.