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Statistical Analysis And Optimization For Vlsi Timing And Power


Statistical Analysis And Optimization For Vlsi Timing And Power
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Statistical Analysis And Optimization For Vlsi Timing And Power


Statistical Analysis And Optimization For Vlsi Timing And Power
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Author : Ashish Srivastava
language : en
Publisher:
Release Date : 2007-12-01

Statistical Analysis And Optimization For Vlsi Timing And Power written by Ashish Srivastava and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-12-01 with categories.




Statistical Analysis And Optimization For Vlsi Timing And Power


Statistical Analysis And Optimization For Vlsi Timing And Power
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Author : Ashish Srivastava
language : en
Publisher: Springer
Release Date : 2008-11-01

Statistical Analysis And Optimization For Vlsi Timing And Power written by Ashish Srivastava and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-11-01 with Technology & Engineering categories.


Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. Comprises a valuable reference for statistical analysis and optimization techniques in current and future VLSI design for CAD-Tool developers and for researchers interested in starting work in this very active area of research. Written by author who lead much research in this area who provide novel ideas and approaches to handle the addressed issues



Statistical Analysis And Optimization For Timing And Power Of Vlsi Circuits


Statistical Analysis And Optimization For Timing And Power Of Vlsi Circuits
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Author : Lerong Cheng
language : en
Publisher:
Release Date : 2010

Statistical Analysis And Optimization For Timing And Power Of Vlsi Circuits written by Lerong Cheng and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with categories.




Statistical Analysis And Optimization For Vlsi Timing And Power


Statistical Analysis And Optimization For Vlsi Timing And Power
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Author : Ashish Srivastava
language : en
Publisher: Springer Science & Business Media
Release Date : 2006-04-04

Statistical Analysis And Optimization For Vlsi Timing And Power written by Ashish Srivastava and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2006-04-04 with Technology & Engineering categories.


Statistical Analysis and Optimization For VLSI: Timing and Power is a state-of-the-art book on the newly emerging field of statistical computer-aided design (CAD) tools. The very latest research in statistical timing and power analysis techniques is included, along with efforts to incorporate parametric yield as the key objective function during the design process. Included is the necessary mathematical background on techniques which find widespread use in current analysis and optimization. The emphasis is on algorithms, modeling approaches for process variability, and statistical techniques that are the cornerstone of the probabilistic CAD movement. The authors also describe recent optimization approaches to timing yield and contrast them to deterministic optimization. The work will enable new researchers in this area to come up to speed quickly, as well as provide a handy reference for those already working in CAD tool development.



Compact Models And Performance Investigations For Subthreshold Interconnects


Compact Models And Performance Investigations For Subthreshold Interconnects
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Author : Rohit Dhiman
language : en
Publisher: Springer
Release Date : 2014-11-07

Compact Models And Performance Investigations For Subthreshold Interconnects written by Rohit Dhiman and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-11-07 with Technology & Engineering categories.


The book provides a detailed analysis of issues related to sub-threshold interconnect performance from the perspective of analytical approach and design techniques. Particular emphasis is laid on the performance analysis of coupling noise and variability issues in sub-threshold domain to develop efficient compact models. The proposed analytical approach gives physical insight of the parameters affecting the transient behavior of coupled interconnects. Remedial design techniques are also suggested to mitigate the effect of coupling noise. The effects of wire width, spacing between the wires, wire length are thoroughly investigated. In addition, the effect of parameters like driver strength on peak coupling noise has also been analyzed. Process, voltage and temperature variations are prominent factors affecting sub-threshold design and have also been investigated. The process variability analysis has been carried out using parametric analysis, process corner analysis and Monte Carlo technique. The book also provides a qualitative summary of the work reported in the literature by various researchers in the design of digital sub-threshold circuits. This book should be of interest for researchers and graduate students with deeper insights into sub-threshold interconnect models in particular. In this sense, this book will best fit as a text book and/or a reference book for students who are initiated in the area of research and advanced courses in nanotechnology, interconnect design and modeling.



Springer Handbook Of Automation


Springer Handbook Of Automation
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Author : Shimon Y. Nof
language : en
Publisher: Springer Science & Business Media
Release Date : 2009-07-16

Springer Handbook Of Automation written by Shimon Y. Nof and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-07-16 with Technology & Engineering categories.


Automation is undergoing a major transformation in scope and dimension and plays an increasingly important role in the global economy and in our daily lives. Engineers combine automated devices with mathematical and organizational tools to create complex systems for a rapidly expanding range of applications and human activities. This handbook incorporates these new developments and presents a widespread and well-structured conglomeration of new emerging application areas of automation. Besides manufacturing as a primary application of automation, the handbook contains new application areas such as medical systems and health, transportation, security and maintenance, service, construction and retail as well as production or logistics. This Springer Handbook is not only an ideal resource for automation experts but also for people new to this expanding field such as engineers, medical doctors, computer scientists, designers. It is edited by an internationally renowned and experienced expert.



Nanometer Variation Tolerant Sram


Nanometer Variation Tolerant Sram
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Author : Mohamed Abu Rahma
language : en
Publisher: Springer Science & Business Media
Release Date : 2012-09-26

Nanometer Variation Tolerant Sram written by Mohamed Abu Rahma and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2012-09-26 with Technology & Engineering categories.


Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost, while achieving higher performance and density. With the drastic increase in memory densities, lower supply voltages, and higher variations, statistical simulation methodologies become imperative to estimate memory yield and optimize performance and power. This book is an invaluable reference on robust SRAM circuits and statistical design methodologies for researchers and practicing engineers in the field of memory design. It combines state of the art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. Provides comprehensive review of state-of-the-art, variation-tolerant SRAM circuit techniques; Discusses Impact of device related process variations and how they affect circuit and system performance, from a design point of view; Helps designers optimize memory yield, with practical statistical design methodologies and yield estimation techniques.



Analysis And Design Of Networks On Chip Under High Process Variation


Analysis And Design Of Networks On Chip Under High Process Variation
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Author : Rabab Ezz-Eldin
language : en
Publisher: Springer
Release Date : 2015-12-16

Analysis And Design Of Networks On Chip Under High Process Variation written by Rabab Ezz-Eldin and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-12-16 with Technology & Engineering categories.


This book describes in detail the impact of process variations on Network-on-Chip (NoC) performance. The authors evaluate various NoC topologies under high process variation and explain the design of efficient NoCs, with advanced technologies. The discussion includes variation in logic and interconnect, in order to evaluate the delay and throughput variation with different NoC topologies. The authors describe an asynchronous router, as a robust design to mitigate the impact of process variation in NoCs and the performance of different routing algorithms is determined with/without process variation for various traffic patterns. Additionally, a novel Process variation Delay and Congestion aware Routing algorithm (PDCR) is described for asynchronous NoC design, which outperforms different adaptive routing algorithms in the average delay and saturation throughput for various traffic patterns.



Sat Based Scalable Formal Verification Solutions


Sat Based Scalable Formal Verification Solutions
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Author : Malay Ganai
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-05-26

Sat Based Scalable Formal Verification Solutions written by Malay Ganai and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-05-26 with Computers categories.


Functional verification has become an important aspect of the chip design process. Significant resources, both in industry and academia, are devoted to the design complexity and verification endeavors. SAT-Based Scalable Formal Verification Solutions discusses in detail several of the latest and interesting scalable SAT-based techniques including: Hybrid SAT Solver, Customized Bounded/Unbounded Model Checking, Distributed Model Checking, Proofs and Proof-based Abstraction Methods, Verification of Embedded Memory System & Multi-clock Systems, and Synthesis for Verification Paradigm. These techniques have been designed and implemented in a verification platform Verisol (formally called DiVer) and have been used successfully in industry. This book provides algorithmic details and engineering insights into devising scalable approaches for an effective realization. It also includes the authors’ practical experiences and recommendations in verifying the large industry designs using VeriSol. The book is primarily written for researchers, scientists, and verification engineers who would like to gain an in-depth understanding of scalable SAT-based verification techniques. The book will also be of interest for CAD tool developers who would like to incorporate various SAT-based advanced techniques in their products.



A Practical Introduction To Psl


A Practical Introduction To Psl
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Author : Cindy Eisner
language : en
Publisher: Springer Science & Business Media
Release Date : 2007-06-19

A Practical Introduction To Psl written by Cindy Eisner and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2007-06-19 with Technology & Engineering categories.


Functional veri?cation is hard. Period. No disagreement here. But why is this so? Consider today’s design ?ow: much of it is more or less automated, from RTL to netlist to layout to silicon. But all this automation depends upon having correct RTL input to start with, and there is little or no automation to help with RTL creation. It is hard enough for a designer to decide what RTL model he wants to build, and then to describe that RTL model correctly in a hardware description language. It is even more di?cult for a veri?cation engineer, who can’t read the designer’s mind, to verify that what the designer created not only represents the RTL model he had conceived, but also that the RTL model is an appropriate one for the problem at hand. What makes RTL modeling and veri?cation di?cult is concurrency. It is easy to teach an engineer how to write procedural code that conforms to the synthesizable subset of a hardware description language. What is hard is understanding how the engineer’s procedural code interacts with other c- ponents in the design over time. In fact, until recently we lacked e?ective languages to describe concurrent behaviors. The IEEE 1850 Property Speci?cation Language (PSL) is a language for the formal speci?cation of concurrent systems. The language is particularly applicable for writing assertions about hardware designs. PSL supports m- tiple veri?cation paradigms – including formal analysis, simulation, and acc- eration/emulation.