Test And Diagnosis For Small Delay Defects
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Test And Diagnosis For Small Delay Defects
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Author : Mohammad Tehranipoor
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-09-08
Test And Diagnosis For Small Delay Defects written by Mohammad Tehranipoor and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-09-08 with Technology & Engineering categories.
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
High Quality Test And Diagnosis For Small Delay Defects
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Author : Ke Peng
language : en
Publisher:
Release Date : 2010
High Quality Test And Diagnosis For Small Delay Defects written by Ke Peng and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010 with categories.
Testing For Small Delay Defects In Nanoscale Cmos Integrated Circuits
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Author : Sandeep K. Goel
language : en
Publisher: CRC Press
Release Date : 2017-12-19
Testing For Small Delay Defects In Nanoscale Cmos Integrated Circuits written by Sandeep K. Goel and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-19 with Technology & Engineering categories.
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause immediate timing failures on both critical and non-critical paths in the circuit. Overviews semiconductor industry test challenges and the need for SDD testing, including basic concepts and introductory material Describes algorithmic solutions incorporated in commercial tools from Mentor Graphics Reviews SDD testing based on "alternative methods" that explores new metrics, top-off ATPG, and circuit topology-based solutions Highlights the advantages and disadvantages of a diverse set of metrics, and identifies scope for improvement Written from the triple viewpoint of university researchers, EDA tool developers, and chip designers and tool users, this book is the first of its kind to address all aspects of SDD testing from such a diverse perspective. The book is designed as a one-stop reference for current industrial practices, research challenges in the domain of SDD testing, and recent developments in SDD solutions.
Electronic Design Automation For Ic System Design Verification And Testing
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Author : Luciano Lavagno
language : en
Publisher: CRC Press
Release Date : 2017-12-19
Electronic Design Automation For Ic System Design Verification And Testing written by Luciano Lavagno and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-19 with Technology & Engineering categories.
The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Machine Learning Support For Fault Diagnosis Of System On Chip
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Author : Patrick Girard
language : en
Publisher: Springer Nature
Release Date : 2023-03-13
Machine Learning Support For Fault Diagnosis Of System On Chip written by Patrick Girard and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2023-03-13 with Technology & Engineering categories.
This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.
Hardware Security
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Author : Mark Tehranipoor
language : en
Publisher: Springer Nature
Release Date : 2024-06-11
Hardware Security written by Mark Tehranipoor and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2024-06-11 with Technology & Engineering categories.
This book provides a look into the future of hardware and microelectronics security, with an emphasis on potential directions in security-aware design, security verification and validation, building trusted execution environments, and physical assurance. The book emphasizes some critical questions that must be answered in the domain of hardware and microelectronics security in the next 5-10 years: (i) The notion of security must be migrated from IP-level to system-level; (ii) What would be the future of IP and IC protection against emerging threats; (iii) How security solutions could be migrated/expanded from SoC-level to SiP-level; (iv) the advances in power side-channel analysis with emphasis on post-quantum cryptography algorithms; (v) how to enable digital twin for secure semiconductor lifecycle management; and (vi) how physical assurance will look like with considerations of emerging technologies. The main aim of this book is to serve as a comprehensive and concise roadmap for new learners and educators navigating the evolving research directions in the domain of hardware and microelectronic securities. Overall, throughout 11 chapters, the book provides numerous frameworks, countermeasures, security evaluations, and roadmaps for the future of hardware security.
Test Generation Of Crosstalk Delay Faults In Vlsi Circuits
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Author : S. Jayanthy
language : en
Publisher: Springer
Release Date : 2018-09-20
Test Generation Of Crosstalk Delay Faults In Vlsi Circuits written by S. Jayanthy and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-09-20 with Technology & Engineering categories.
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
Resilient Computer System Design
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Author : Victor Castano
language : en
Publisher: Springer
Release Date : 2015-04-15
Resilient Computer System Design written by Victor Castano and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2015-04-15 with Technology & Engineering categories.
This book presents a paradigm for designing new generation resilient and evolving computer systems, including their key concepts, elements of supportive theory, methods of analysis and synthesis of ICT with new properties of evolving functioning, as well as implementation schemes and their prototyping. The book explains why new ICT applications require a complete redesign of computer systems to address challenges of extreme reliability, high performance, and power efficiency. The authors present a comprehensive treatment for designing the next generation of computers, especially addressing safety critical, autonomous, real time, military, banking, and wearable health care systems.
System On Chip Test Architectures
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Author : Laung-Terng Wang
language : en
Publisher: Morgan Kaufmann
Release Date : 2010-07-28
System On Chip Test Architectures written by Laung-Terng Wang and has been published by Morgan Kaufmann this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-07-28 with Technology & Engineering categories.
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
Models In Hardware Testing
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Author : Hans-Joachim Wunderlich
language : en
Publisher: Springer Science & Business Media
Release Date : 2009-11-12
Models In Hardware Testing written by Hans-Joachim Wunderlich and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-11-12 with Computers categories.
Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.