Test Generation Of Crosstalk Delay Faults In Vlsi Circuits
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Test Generation Of Crosstalk Delay Faults In Vlsi Circuits
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Author : S. Jayanthy
language : en
Publisher: Springer
Release Date : 2018-09-20
Test Generation Of Crosstalk Delay Faults In Vlsi Circuits written by S. Jayanthy and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-09-20 with Technology & Engineering categories.
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
Test And Diagnosis For Small Delay Defects
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Author : Mohammad Tehranipoor
language : en
Publisher: Springer Science & Business Media
Release Date : 2011-09-08
Test And Diagnosis For Small Delay Defects written by Mohammad Tehranipoor and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2011-09-08 with Technology & Engineering categories.
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Application Of Evolutionary Algorithms For Multi Objective Optimization In Vlsi And Embedded Systems
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Author : M.C. Bhuvaneswari
language : en
Publisher: Springer
Release Date : 2014-08-20
Application Of Evolutionary Algorithms For Multi Objective Optimization In Vlsi And Embedded Systems written by M.C. Bhuvaneswari and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2014-08-20 with Technology & Engineering categories.
This book describes how evolutionary algorithms (EA), including genetic algorithms (GA) and particle swarm optimization (PSO) can be utilized for solving multi-objective optimization problems in the area of embedded and VLSI system design. Many complex engineering optimization problems can be modelled as multi-objective formulations. This book provides an introduction to multi-objective optimization using meta-heuristic algorithms, GA and PSO and how they can be applied to problems like hardware/software partitioning in embedded systems, circuit partitioning in VLSI, design of operational amplifiers in analog VLSI, design space exploration in high-level synthesis, delay fault testing in VLSI testing and scheduling in heterogeneous distributed systems. It is shown how, in each case, the various aspects of the EA, namely its representation and operators like crossover, mutation, etc, can be separately formulated to solve these problems. This book is intended for design engineers and researchers in the field of VLSI and embedded system design. The book introduces the multi-objective GA and PSO in a simple and easily understandable way that will appeal to introductory readers.
Electronic Design Automation For Ic System Design Verification And Testing
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Author : Luciano Lavagno
language : en
Publisher: CRC Press
Release Date : 2017-12-19
Electronic Design Automation For Ic System Design Verification And Testing written by Luciano Lavagno and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2017-12-19 with Technology & Engineering categories.
The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Computer Engineering Apps
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Author :
language : en
Publisher:
Release Date : 2009-07
Computer Engineering Apps written by and has been published by this book supported file pdf, txt, epub, kindle and other format this book has been release on 2009-07 with categories.
Design Of Hardware Software Embedded Systems
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Author : Eugenio Villar Bonet
language : en
Publisher: Ed. Universidad de Cantabria
Release Date : 2001
Design Of Hardware Software Embedded Systems written by Eugenio Villar Bonet and has been published by Ed. Universidad de Cantabria this book supported file pdf, txt, epub, kindle and other format this book has been release on 2001 with Computers categories.
Este libro presenta los desafíos planteados por las nuevas y sumamente poderosas tecnologías de integración de sistemas electrónicos, que están en la base de los cambios sociales hacia lo que llaman la Sociedad de la Información; en la que los dispositivos electrónicos se harán una parte incorporada de la vida diaria, encajados en casi cada producto. Es necesario un conocimiento cuidadoso de los desafíos para aprovechar la amplia gama de ocasiones ofrecidas por tales capacidades de integración y las correspondientes posibilidades de diseño de sistemas electrónicos.
Nanometer Technology Designs
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Author : Nisar Ahmed
language : en
Publisher: Springer Science & Business Media
Release Date : 2010-02-26
Nanometer Technology Designs written by Nisar Ahmed and has been published by Springer Science & Business Media this book supported file pdf, txt, epub, kindle and other format this book has been release on 2010-02-26 with Technology & Engineering categories.
Adopting new fabrication technologies not only provides higher integration and enhances performance, but also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz timing-related defects havv become a high proportion of the total chip defects. For nanometer technology designs, the stuck-at fault test alone cannot ensure a high quality level of chips. At-speed tests using the transition fault model has become a requirement in technologies below 180nm. Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise (including IR-drop, ground bounce, and Ldi/dt) effects on chip performance, high test pattern volume, low fault/defect coverage, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.
Success In Evolutionary Computation
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Author : Ang Yang
language : en
Publisher: Springer
Release Date : 2008-03-22
Success In Evolutionary Computation written by Ang Yang and has been published by Springer this book supported file pdf, txt, epub, kindle and other format this book has been release on 2008-03-22 with Technology & Engineering categories.
Darwinian evolutionary theory is one of the most important theories in human history for it has equipped us with a valuable tool to understand the amazing world around us. There can be little surprise, therefore, that Evolutionary Computation (EC), inspired by natural evolution, has been so successful in providing high quality solutions in a large number of domains. EC includes a number of techniques, such as Genetic Algorithms, Genetic Programming, Evolution Strategy and Evolutionary Programming, which have been used in a diverse range of highly successful applications. This book brings together some of these EC applications in fields including electronics, telecommunications, health, bioinformatics, supply chain and other engineering domains, to give the audience, including both EC researchers and practitioners, a glimpse of this exciting rapidly evolving field.
Design For Testability Debug And Reliability
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Author : Sebastian Huhn
language : en
Publisher: Springer Nature
Release Date : 2021-04-19
Design For Testability Debug And Reliability written by Sebastian Huhn and has been published by Springer Nature this book supported file pdf, txt, epub, kindle and other format this book has been release on 2021-04-19 with Technology & Engineering categories.
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.
Eda For Ic System Design Verification And Testing
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Author : Louis Scheffer
language : en
Publisher: CRC Press
Release Date : 2018-10-03
Eda For Ic System Design Verification And Testing written by Louis Scheffer and has been published by CRC Press this book supported file pdf, txt, epub, kindle and other format this book has been release on 2018-10-03 with Technology & Engineering categories.
Presenting a comprehensive overview of the design automation algorithms, tools, and methodologies used to design integrated circuits, the Electronic Design Automation for Integrated Circuits Handbook is available in two volumes. The first volume, EDA for IC System Design, Verification, and Testing, thoroughly examines system-level design, microarchitectural design, logical verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for IC designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. Save on the complete set.